期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Study of leakage current degradation based on stacking faults expansion in irradiated SiC junction barrier Schottky diodes
1
作者 Maojiu Luo Yourun Zhang +5 位作者 Yucheng Wang Hang Chen Rong Zhou Zhi Wang Chao Lu Bo Zhang 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第10期458-464,共7页
A comprehensive investigation was conducted to explore the degradation mechanism of leakage current in SiC junction barrier Schottky(JBS)diodes under heavy ion irradiation.We propose and verify that the generation of ... A comprehensive investigation was conducted to explore the degradation mechanism of leakage current in SiC junction barrier Schottky(JBS)diodes under heavy ion irradiation.We propose and verify that the generation of stacking faults(SFs)induced by the recombination of massive electron-hole pairs during irradiation is the cause of reverse leakage current degradation based on experiments results.The irradiation experiment was carried out based on Ta ions with high linear energy transfer(LET)of 90.5 MeV/(mg/cm^(2)).It is observed that the leakage current of the diode undergoes the permanent increase during irradiation when biased at 20%of the rated reverse voltage.Micro-PL spectroscopy and PL micro-imaging were utilized to detect the presence of SFs in the irradiated SiC JBS diodes.We combined the degraded performance of irradiated samples with SFs introduced by heavy ion irradiation.Finally,three-dimensional(3D)TCAD simulation was employed to evaluate the excessive electron-hole pairs(EHPs)concentration excited by heavy ion irradiation.It was observed that the excessive hole concentration under irradiation exceeded significantly the threshold hole concentration necessary for the expansion of SFs in the substrate.The proposed mechanism suggests that the process and material characteristics of the silicon carbide should be considered in order to reinforcing against the single event effect of SiC power devices. 展开更多
关键词 4H-SiC JBS diode heavy ion irradiation single event effect single event leakage current degradation
下载PDF
The Grad-Shafranov reconstruction in twenty years: 1996–2016 被引量:3
2
作者 HU Qiang 《Science China Earth Sciences》 SCIE EI CAS CSCD 2017年第8期1466-1494,共29页
We review and summarize the applications of the Grad-Shafranov(GS) reconstruction technique to space plasma structures in the Earth's magnetosphere and in the interplanetary space. We organize our presentations fo... We review and summarize the applications of the Grad-Shafranov(GS) reconstruction technique to space plasma structures in the Earth's magnetosphere and in the interplanetary space. We organize our presentations following the branches of the "academic family tree" rooted on Prof. Bengt U. ? Sonnerup, the inventor of the GS method. Special attentions are paid to validations of the GS reconstruction results via(1) the direct validation by co-spatial in-situ measurements among multiple spacecraft, and(2) indirect validation by implications and interpretations of the physical connection between the structures reconstructed and other related processes. For the latter, the inter-comparison and interconnection between the large-scale magnetic flux ropes(i.e., Magnetic Clouds) in the solar wind and their solar source properties are presented. In addition, we also summarize various GS-type(or-like) reconstruction and an extension of the GS technique to toroidal geometry. In particular,we point to a possible advancement with added complexity of "helical symmetry" and mixed helicity, in the hope of stimulating interest in future development. We close by offering some thoughts on appreciating the scientific merit of GS reconstruction in general. 展开更多
关键词 Grad-Shafranov equation Magnetohydrodynamics Magnetic clouds Magnetic flux ropes Magnetopause current sheets Flux transfer events Plasmoids Solar flare Coronal mass ejections
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部