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ICTSSE: An Object-Oriented IC Test Software Supporting Environment
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作者 孙育宁 王晓明 时万春 《Journal of Computer Science & Technology》 SCIE EI CSCD 1995年第5期447-454,共8页
An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS... An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC's stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration. 展开更多
关键词 CAT object-oriented paradigm data interchanging format
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