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METHOD FOR OBSERVATION OF DEEMBEDDED SECTIONS OF FISH GONAD BY SCANNING ELECTRON MICROSCOPY
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作者 毛连菊 《Chinese Journal of Oceanology and Limnology》 SCIE CAS CSCD 2000年第3期283-288,共6页
This article reports a method for examining the intracellular structure of fish gonads using a scanning electron microscope(SEM). The specimen preparation procedure is similar to that for transmission electron microsc... This article reports a method for examining the intracellular structure of fish gonads using a scanning electron microscope(SEM). The specimen preparation procedure is similar to that for transmission electron microscopy wherein samples cut into semi thin sections are fixed and embedded in plastic. The embedment matrix was removed by solvents. Risen free specimens could be observed by SEM. The morphology of matured sperms in the gonad was very clear, and the oocyte internal structures appeared in three dimensional images. Spheroidal nucleoli and yolk vesicles and several bundles of filaments adhered on the nucleoli could be viewed by SEM for the first time. 展开更多
关键词 FISH GONAD INTERNAL structure SEM deembedded SECTION
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Design, Modelling and Characterization of Transmission Lines for mm-Wave Silicon ICs
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作者 Jan Dirk Leuiker David Fritsche +3 位作者 Gregor Tretter Mahdi Khafaji Corrado Carta Frank Ellinger 《Journal of Electrical Engineering》 2016年第1期1-10,共10页
This article describes the design, modelling and characterization of transmission lines for millimetre wave silicon integrated circuits up to 65 GHz. The simulation results of three different EM (electro-magnetic) s... This article describes the design, modelling and characterization of transmission lines for millimetre wave silicon integrated circuits up to 65 GHz. The simulation results of three different EM (electro-magnetic) simulators for a selected hybrid coplanar layout structure are presented. Two different deembedding methods are investigated and compared with respect to sensitivity to typical measurement errors. Finally both methods are applied to the measurement results of the fabricated test structures in a 250 nm BiCMOS technology showing good agreement to EM simulations and predicted sensitivity to measurement errors. 展开更多
关键词 Transmission line MICROSTRIP coplanar waveguide millimetre wave integrated circuits EM simulation deembedding.
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