Detection of path delay faults requires two-pattern tests. BIST technique provides a low-cost test solution. This paper proposes an approach to designing a cost-effective deterministic test pattern generator (TPG) for...Detection of path delay faults requires two-pattern tests. BIST technique provides a low-cost test solution. This paper proposes an approach to designing a cost-effective deterministic test pattern generator (TPG) for path delay testing. Given a set of pre-generated test-pairs with pre-determined fault coverage, a deterministic TPG is synthesized to apply the given test-pair set in a limited test time. To achieve this objective, configurable linear feedback shift register (LFSR) structures are used. Techniques are developed to synthesize such a TPG, which is used to generate an unordered deterministic test-pair set. The resulting TPG is very efficient in terms of hardware size and speed performance. Simulation of academic benchmark circuits has given good results when compared to alternative solutions.展开更多
An efficient design-for-testability （DFT） technique is proposed to achieve low overhead for scan-based delay fault testing. Existing techniques for delay test such as skewed-load or broadside make the test generatio...An efficient design-for-testability （DFT） technique is proposed to achieve low overhead for scan-based delay fault testing. Existing techniques for delay test such as skewed-load or broadside make the test generation process complex and produce lower coverage for scan-based designs as compared with non-scan designs, whereas techniques such as enhanced-scan test can make the test easy but need an extra holding latch to add substantial hardware overhead. A new tri-state holding logic is presented to replace the common holding latch in enhanced-scan test to get a substantial low hardware overhead. This scheme can achieve low delay overhead by avoiding the holding latch on the critical timing scan path. What＇s more, this method can also keep the state and signal activity in the combinational circuit from the scan during data scan-in operation to reduce the power dissipation. Experiment results on a set of ISCAS89 benchmarks show the efficiency of the proposed scheme.展开更多
Delay considerttion has been a major issue in design and test of high performance digital circuits . The assumption of input signal change occurring only when all internal nodes are stable restricts the increase of cl...Delay considerttion has been a major issue in design and test of high performance digital circuits . The assumption of input signal change occurring only when all internal nodes are stable restricts the increase of clock frequency. It is no longer true for wave pipelining circuits. However, previous logical delay models are based on the assumption. In addition, the stable time of a robust delay test generally depends on the longest sensitizable path delay. Thus , a new delay model is desirable. This paper explores the necessity first. Then, Boolean process to analytically describe the logical and timing behavior of a digital circuit is reviewed . The concept of sensitization is redefined precisely in this paper. Based on the new concept of sensitization, an analytical delay model is introduced . As a result , many untestable delay faults under the logical delay model can be tested if the output waveforms can be sampled at more time points. The longest sensitiaable path length is computed for circuit design and delay test .展开更多
基金This work was supported in part by the National Natural Science FOundation of China under grant No.69976002 and in part by the
文摘Detection of path delay faults requires two-pattern tests. BIST technique provides a low-cost test solution. This paper proposes an approach to designing a cost-effective deterministic test pattern generator (TPG) for path delay testing. Given a set of pre-generated test-pairs with pre-determined fault coverage, a deterministic TPG is synthesized to apply the given test-pair set in a limited test time. To achieve this objective, configurable linear feedback shift register (LFSR) structures are used. Techniques are developed to synthesize such a TPG, which is used to generate an unordered deterministic test-pair set. The resulting TPG is very efficient in terms of hardware size and speed performance. Simulation of academic benchmark circuits has given good results when compared to alternative solutions.
基金This project was supported by the National Natural Science Foundation of China (90407007).
文摘An efficient design-for-testability （DFT） technique is proposed to achieve low overhead for scan-based delay fault testing. Existing techniques for delay test such as skewed-load or broadside make the test generation process complex and produce lower coverage for scan-based designs as compared with non-scan designs, whereas techniques such as enhanced-scan test can make the test easy but need an extra holding latch to add substantial hardware overhead. A new tri-state holding logic is presented to replace the common holding latch in enhanced-scan test to get a substantial low hardware overhead. This scheme can achieve low delay overhead by avoiding the holding latch on the critical timing scan path. What＇s more, this method can also keep the state and signal activity in the combinational circuit from the scan during data scan-in operation to reduce the power dissipation. Experiment results on a set of ISCAS89 benchmarks show the efficiency of the proposed scheme.
文摘Delay considerttion has been a major issue in design and test of high performance digital circuits . The assumption of input signal change occurring only when all internal nodes are stable restricts the increase of clock frequency. It is no longer true for wave pipelining circuits. However, previous logical delay models are based on the assumption. In addition, the stable time of a robust delay test generally depends on the longest sensitizable path delay. Thus , a new delay model is desirable. This paper explores the necessity first. Then, Boolean process to analytically describe the logical and timing behavior of a digital circuit is reviewed . The concept of sensitization is redefined precisely in this paper. Based on the new concept of sensitization, an analytical delay model is introduced . As a result , many untestable delay faults under the logical delay model can be tested if the output waveforms can be sampled at more time points. The longest sensitiaable path length is computed for circuit design and delay test .
