Simultaneous Impedance Analysis of Three Parallel Piezoelectric Quartz Crystals for Electrochemical Depletion Layer Effect Study

Simultaneous impedance analysis of three one-face sealed resonating piezoelectric quartz crystals (PQCs) in parallel is proposed through admittance measurements of the three PQCs on one impedance analyzer and then non-linear fitting according to the parallel combination of three Butterworth-Van Dyke circuits. Responses of each PQC obtained from the three-PQC mode agreed well with those measured separately in series sucrose aqueous solutions. This novel method has been used for the study of depletion-layer effect during ferri-/ferrocyanide electrochemical reactions.

Microfluidic fuel cells integrating slanted groove micro-mixers to terminate growth of depletion boundary layer thickness

Because of potential high energy densities,microfluidic fuel cells can serve as micro-scale power sources.Because microfluidic fuel cells typically operate in the co-laminar flow regime to enable a membrane-less design,they generally suffer from severe mass transfer limitations with respect to diffusion transport.To address this issue,a novel channel design that integrates slanted groove micro-mixers on the side walls of the channel is proposed.Numerical modeling on the design of groove micro-mixers and grooveless design demonstrates a mass transfer enhancement that has a 115%higher limiting current density and well-controlled convective mixing between the oxidant and the fuel streams with the use of slanted groove micro-mixers.Moreover,the growth of the thickness of the depletion boundary layer is found to be terminated within approximately 2 mm from the channel entrance,which is distinct from the constantly growing pattern in the grooveless design.In addition,a simplified mass transfer model capable of modeling the mass transfer prFocess with the presence of the transverse secondary flow is developed.Further,a dimensionless correlation is derived to analyze the effects of the design parameters on the limiting current density.The present theoretical study paves the way towards an optimal design of a microfluidic fuel cell integrating groove micro-mixers.

Prediction of Breakdown Voltage of Asymmetric Linearly-Graded Junction by Equivalent Doping Profile Transformation Method

This report describes an equivalent doping profile transformation method with which the avalanche breakdown voltage of the asymmetric linearly graded junction was analytically predicted.The maximum breakdown voltage and the different depletion layer extension on the diffused side and substrate side are demonstrated in the report.The report shows the equivalent doping profile method is valid to predict the breakdown voltage of the complex P N junction.The analytical results agree with the experimental breakdown voltage in comparison with the abrupt junction and symmetric linearly graded junction approximations.

A full-coupling model of PN junctions based on the global-domain carrier motions with inclusion of the two metal/semiconductor contacts at endpoints

A full-coupling model on the current-voltage(J-V)characteristics of PN junctions is put forward in the paper by taking into account both the whole junction and the two electrode regions consisting of metal/semiconductor(M/S)contacts.The depletion layer assumption proposed by the Shockley model is discarded.Gauss’law on the electric potential and the electric field is applied in the whole junction region such that the majority-carrier currents inside and outside the P/N barrier region are able to be exactly defined and clearly calculated.Then,the stable continuity equations of the electron and hole currents are established to show the current conversion between minority-and majority-carriers inside the whole PN junction region.By analyzing all the conversion procedure,the J-V characteristics of a PN junction are obtained with good agreement to the experimental results,which are closely dependent on the minority-carrier lifetime and doping concentrations.Obviously,the study on this topic possesses referential significance to mechanically tuning the performance of piezoelectric PN junctions and piezotronic devices.

Comparison in interfacial phenomena in electric-field assisted anodic bonding of Kovar-glass and Kovar/Al film-glass

Anodic bonding of Kovar-glass and Kovar/Al film-glass were performed at temperatures of 513 K to 663 K under the static electric voltage of 500 V, in order to compare the interfacial phenomena in electric-field assisted anodic bonding of Kovar-glass and Al-glass . SEM and EPMA were used to observe and analyzed the interfacial region. The growth rate of the alkali ions depletion layers in Kovar/Al-glass joint was slower than that in Kovar-glass joint. But the activation energies for the growth of depletion layers are about the same for both kinds of joint.

Interfacial phenomena in electric field-assisted anodic bonding of Kovar/Al film-glass

Anodic bonding of glass to Kovar alloy coated with Al film (Glass Al film/Kovar) was performed in the temperature range of 513 ～ 713?K under the static electric voltage of 500?V in order to investigate the interfacial phenomena of Al glass joint. The results reveal that Na and K ions within the glass are displaced by the applied field from the anode side surface of the glass to form depletion layers of them. The K ion depletion layer is narrow and followed by a K pile up layer, and both the two layers are formed within the Na depletion layer. The width of the Na and K depletion layers is increased with increasing bonding temperature and time. The activation energies for the growth of both depletion layers were close to that for Na diffusion in the glass. TEM observations reveal that Al film coated at the surface of Kovar alloy is oxidized to amorphous Al 2O 3 containing a few of Fe, Ni and Co by oxygen ions from the glass drifted by high electric field during bonding. The amount of Fe ions diffusing into the glass adjacent to the anode is significantly low due to the presence of Al film between Kovar alloy and the glass. As a result, the amorphous reaction layer of Fe Si O in the glass near the interface is avoided which is formed in Kovar glass joints.