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Reduction of Electron Leakage in a Deep Ultraviolet Nitride Laser Diode with a Double-Tapered Electron Blocking Layer 被引量:3
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作者 Yi-Fu Wang Mussaab I.Niass +1 位作者 Fang Wang Yu-Huai Liu 《Chinese Physics Letters》 SCIE CAS CSCD 2019年第5期67-70,共4页
A double-tapered AlGaN electron blocking layer (EBL) is proposed to apply in a deep ultraviolet semiconductor laser diode. Compared with the inverse double-tapered EBL, the laser with the double-tapered EBL shows a hi... A double-tapered AlGaN electron blocking layer (EBL) is proposed to apply in a deep ultraviolet semiconductor laser diode. Compared with the inverse double-tapered EBL, the laser with the double-tapered EBL shows a higher slope efficiency, which indicates that effective enhancement in the transportation of electrons and holes is achieved. Particularly, comparisons among the double-tapered EBL, the inverse double-tapered EBL, the singletapered EBL and the inverse single-tapered EBL show that the double-tapered EBL has the best performance in terms of current leakage. 展开更多
关键词 EBL AlGaN REDUCTION of ELECTRON Leakage in a Deep Ultraviolet NITRIDE Laser Diode with a double-tapered ELECTRON Blocking Layer
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