50-110 GHz,high isolation,and high-power linearity single-pole double-throw switch utilizing 100-nm GaN HEMT technology

This article presents the design and performance of a single-pole double-throw(SPDT)switch operating in 50-110 GHz.The switch is fabricated in a 100-nm GaN high-electron-mobility transistors(HEMT)technology.To realize high-power capability,the dimensions of GaN HEMTs are selected by simulation verification.To enhance the isolation,an improved structure of shunt HEMT with two ground holes is employed.To extend the operation bandwidth,the SPDT switch with multi-section resonant units is proposed and analyzed.To verify the SPDT switch design,a prototype operating in 50-110 GHz is fabricated.The measured results show that the fabricated SPDT switch monolithic microwave integrated circuit(MMIC)achieves an input 1 dB compression point(P_(1dB))of 38 dBm at 94 GHz,and isolation within the range of 33 dB to 54 dB in 50-110 GHz.The insertion loss of the switch is less than 2.1 dB,while the voltage standing wave ratios(VSWR)of the input port and output port are both less than 1.8 in the operation bandwidth.Based on the measured results,the presented SPDT switch MMIC demonstrates high power capability and high isolation compared with other reported millimeter-wave SPDT MMIC designs.

A novel multifunctional electronic calibration kit integrated by MEMS SPDT switches

Design and simulation results of a novel multifunctional electronic calibration kit based on microelectromechanical system(MEMS)single-pole double-throw(SPDT)switches are presented in this paper.The short-open-load-through(SOLT)calibration states can be completed simultaneously by using the MEMS electronic calibration,and the electronic calibrator can be reused 10^(6) times.The simulation results show that this novel electronic calibration can be used in a frequency range of 0.1 GHz–20 GHz,the return loss is less than 0.18 dB and 0.035 dB in short-circuit and open-circuit states,respectively,and the insertion loss in through(thru)state is less than 0.27 dB.On the other hand,the size of this novel calibration kit is only 6 mm×2.8 mm×0.8 mm.Our results demonstrate that the calibrator with integrated radiofrequency microelectromechanical system(RF MEMS)switches can not only provide reduced size,loss,and calibration cost compared with traditional calibration kit but also improves the calibration accuracy and efficiency.It has great potential applications in millimeter-wave measurement and testing technologies,such as device testing,vector network analyzers,and RF probe stations.

A novel loss compensation technique analysis and design for 60 GHz CMOS SPDT switch

A novel loss compensation technique for a series-shunt single-pole double-throw （SPDT） switch is pre- sented operating in the 60 GHz. The feed-forward compensation network which is composed of an NMOS, a couple capacitance and a shunt inductance can reduce the impact of the feed forward capacitance to reduce the insertion loss and improve the isolation of the SPDT switch. The measured insertion loss and isolation characteristics of the switch somewhat deviating from the 60 GHz are analyzed revealing that the inaccuracy of the MOS model can greatly degrade the performance of the switch. The switch is implemented in TSMC 90-nm CMOS process and exhibits an isolation of above 27 dB at transmitter mode, and the insertion loss of 1.8-3 dB at 30--65 GHz by layout simulation. The measured insertion loss is 2.45 dB at 52 GHz and keeps 〈 4 dB at 30-64 GHz. The measured isolation is better than 25 dB at 30--64 GHz and the measured return loss is better than 10 dB at 30-65 GHz. A measured input 1 dB gain compression point of the switch is 13 dBm at 52 GHz and 15 dBm at 60 GHz. The simulated switching speed with rise time and fall time are 720 and 520 ps, respectively. The active chip size of the proposed switch is 0.5 × 0.95 mm2.