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An integrated front-end vertical hall magnetic sensor fabricated in 0.18μm low-voltage CMOS technology
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作者 Zhengwu Shu Lei Jiang +1 位作者 Xingxing Hu Yue Xu 《Journal of Semiconductors》 EI CAS CSCD 2022年第3期60-67,共8页
An integrated front-end vertical CMOS Hall magnetic sensor is proposed for the in-plane magnetic field measure-ment.To improve the magnetic sensitivity and to obtain low offset,a fully symmetric vertical Hall device(F... An integrated front-end vertical CMOS Hall magnetic sensor is proposed for the in-plane magnetic field measure-ment.To improve the magnetic sensitivity and to obtain low offset,a fully symmetric vertical Hall device(FSVHD)has been op-timized with a minimum size design.A new four-phase spinning current modulation associated with a correlated double sampling(CDS)demodulation technique has been further applied to compensate for the offset and also to provide a linear Hall output voltage.The vertical Hall sensor chip has been manufactured in a 0.18μm low-voltage CMOS technology and it occu-pies an area of 1.54 mm2.The experimental results show in the magnetic field range from-200 to 200 mT,the entire vertical Hall sensor performs with the linearity of 99.9%and the system magnetic sensitivity of 1.22 V/T and the residual offset of 60μT.Meanwhile,it consumes 4.5 mW at a 3.3 V supply voltage.The proposed vertical Hall sensor is very suitable for the low-cost sys-tem-on-chip(SOC)implementation of 2D or 3D magnetic microsystems. 展开更多
关键词 vertical Hall sensor dynamic offset cancellation 1/f noise residual offset
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