Low-leakage diode-triggered silicon controlled rectifier for electrostatic discharge protection in 0.18-μm CMOS process

A diode-triggered silicon controlled rectifier (DTSCR) is being developed as an electrostatic discharge (ESD) pro- tection device for low voltage applications. However, DTSCR leaks high current during normal operation due to the Darlington effect of the triggering-assist diode string. In this study, two types of diode string triggered SCRs are designed for low leakage consideration; the modified diode string and composite polysilicon diode string triggered SCRs (MDTSCR & PDTSCR). Com- pared with the conventional DTSCR (CDTSCR), the MDTSCR has a much lower substrate leakage current with a relatively large silicon cost, and the PDTSCR has a much lower substrate leakage current with similar area and shows good leakage performance at a high temperature. Other DTSCR ESD properties are also investigated, especially regarding their layout, triggering voltage and failure current.

High performance differential CMOS LNA design for low-IF GPS receiver

A 1.575 GHz CMOS （complementary metal-oxidesemiconductor transistor） low noise amplifier（LNA） suitable for a low intermediate frequency（IF） global positioning system（GPS） receiver is presented. Considering parasitic effects resulting from bond pad and input electrostatic discharge （ESD） protection diodes, the optimization of the input matching and noise performance is analyzed, and a narrowband inductor model is applied to the circuit design and optimization. Based on the Volterra series, the nonlinearity of the LNA is analyzed and an equation describing input-referred third-order intercept points （IIP3） which indicate the nonlinearity effects is derived; accordingly, the trade-off between the power consumption and linearity is made. The LNA is designed and simulated with TSMC （Taiwan Semiconductor Manufacturing Company） 0. 18 μm radio frequency （RF）technology. Simulation results show that the LNA has a noise figure of only 1.1 dB, - 8. 3 dBm IIP3 with 3 mA current consumption from a 1.8 V voltage supply, and the input impedances match well.

ESD-Induced Noise to Low Noise Amplifier Circuits in BiCMOS

Electrostatic discharge （ESD） induced parasitic effects have serious impacts on performance of radio frequency （RF） integrated circuits （IC）. This paper discusses a comprehensive noise analysis procedure for ESD protection structures and their negative influences on RF ICs. Noise figures （NFs） of commonly used ESD protection structures and their impacts on a single-chip 5.5 GHz low-noise amplifier （LNA） circuit were depicted. A design example in 0.18 μm SiGe BiCMOS was presented. Measurement results confirm that significant noise degradation occurs in the LNA circuit due to ESD-induced noise effects. A practical design procedure for ESD-protected RF ICs is provided for real-world RF IC optimization.