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Suppression of grain boundary migration at cryogenic temperature in an extremely fine nanograined Ni-Mo alloy 被引量:1
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作者 J.Hu J.X.Li Y.-N.Shi 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2020年第22期65-69,共5页
Microindentation creep tests on an electrodeposited extremely fine(4.9 nm) nanograined(ng) Ni-14.2 at.% Mo(Ni-14.2 Mo) at both room temperature(RT) and liquid nitrogen temperature(LNT) demonstrated that lowering tempe... Microindentation creep tests on an electrodeposited extremely fine(4.9 nm) nanograined(ng) Ni-14.2 at.% Mo(Ni-14.2 Mo) at both room temperature(RT) and liquid nitrogen temperature(LNT) demonstrated that lowering temperature retarded softening in the ng Ni-Mo alloy. The obtained strain rate sensitivity at LNT was one order of magnitude lower than that at RT. Microstructural characterization revealed that mechanically-driven grain boundary(GB) migration was greatly suppressed by lowering temperature,which might be ascribed to the presence of solute Mo atoms that significantly retarded coupled GB motion at LNT. Deformation was instead carried by shear bands. 展开更多
关键词 extremely fine nanograined metals Mechanically-driven grain boundary migration Cryogenic temperature Shear bands Solute atoms
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