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Digital Twin-Based Automated Fault Diagnosis in Industrial IoT Applications
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作者 Samah Alshathri Ezz El-Din Hemdan +1 位作者 Walid El-Shafai Amged Sayed 《Computers, Materials & Continua》 SCIE EI 2023年第4期183-196,共14页
In recent years, Digital Twin (DT) has gained significant interestfrom academia and industry due to the advanced in information technology,communication systems, Artificial Intelligence (AI), Cloud Computing (CC),and ... In recent years, Digital Twin (DT) has gained significant interestfrom academia and industry due to the advanced in information technology,communication systems, Artificial Intelligence (AI), Cloud Computing (CC),and Industrial Internet of Things (IIoT). The main concept of the DT isto provide a comprehensive tangible, and operational explanation of anyelement, asset, or system. However, it is an extremely dynamic taxonomydeveloping in complexity during the life cycle that produces a massive amountof engendered data and information. Likewise, with the development of AI,digital twins can be redefined and could be a crucial approach to aid theInternet of Things (IoT)-based DT applications for transferring the data andvalue onto the Internet with better decision-making. Therefore, this paperintroduces an efficient DT-based fault diagnosis model based on machinelearning (ML) tools. In this framework, the DT model of the machine isconstructed by creating the simulation model. In the proposed framework,the Genetic algorithm (GA) is used for the optimization task to improvethe classification accuracy. Furthermore, we evaluate the proposed faultdiagnosis framework using performance metrics such as precision, accuracy,F-measure, and recall. The proposed framework is comprehensively examinedusing the triplex pump fault diagnosis. The experimental results demonstratedthat the hybrid GA-ML method gives outstanding results compared to MLmethods like LogisticRegression (LR), Na飗e Bayes (NB), and SupportVectorMachine (SVM). The suggested framework achieves the highest accuracyof 95% for the employed hybrid GA-SVM. The proposed framework willeffectively help industrial operators make an appropriate decision concerningthe fault analysis for IIoT applications in the context of Industry 4.0. 展开更多
关键词 Automated fault diagnosis control system ML AI CC IIoT digital twins genetic algorithm GA-ML technique
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