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Memory characteristics of Au/PZT/BIT/p-Si ferroelectric diode
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作者 王华 于军 +4 位作者 董晓敏 周文利 王耘波 郑远开 赵建宏 《Science China(Technological Sciences)》 SCIE EI CAS 2001年第3期274-279,共6页
A ferroelectric memory diode consisting of Au/PZT/BIT/p-Si multilayer configuration has been fabricated by pulsed laser deposition (PLD) technique. The ferroelectric properties and the memory characteristics are inves... A ferroelectric memory diode consisting of Au/PZT/BIT/p-Si multilayer configuration has been fabricated by pulsed laser deposition (PLD) technique. The ferroelectric properties and the memory characteristics are investigated. The P-E curve of the PZT/BIT/p-Si films system had an asymmetry saturated hysteresis loop withP t=15 μC/cm2 andE c=48 kV/cm, and the decay in remanent polarization was only 10% after 109 switching cycles, meanwhile the increase in coercive field was 12%. The C-V hysteresis loop and the I-V curve showed a memory effect derived from the ferroelectric polarization of PZT/BIT films, and the current density was 6.7×10?8 A/cm2 at a voltage of +4V. Our diode had nonvolatile and nondestructive memory readout operation. There was a read current disparity of 0.05 μA for logic “1” and logic “0” at a read voltage of +2V, and the stored logical value (“1” or “0”) could be read out in 30 min. 展开更多
关键词 ferroeletric films memory diode pb(zr0.52ti0.48)o3 bi4ti3o12
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