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TFT-LCD用偏光片的研究与进展 被引量:7
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作者 李红芳 王玉合 杨钟 《合成技术及应用》 2013年第3期18-23,共6页
偏光片作为液晶显示器的主要零部件之一,在平板显示领域有着广泛的应用前景。该文阐述了TFT-LCD用偏光片的工作原理、性能指标及影响因素,介绍了偏光片的结构、分类及制造工艺,简要分析了目前偏光片的产业及市场的发展状况和趋势,以及... 偏光片作为液晶显示器的主要零部件之一,在平板显示领域有着广泛的应用前景。该文阐述了TFT-LCD用偏光片的工作原理、性能指标及影响因素,介绍了偏光片的结构、分类及制造工艺,简要分析了目前偏光片的产业及市场的发展状况和趋势,以及国内相关产业政策对国内偏光片行业的发展所起的作用。 展开更多
关键词 液晶显示器 偏光片 光学膜
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金刚石薄膜场致发射的研究
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作者 孙永伟 王万录 +1 位作者 廖克俊 冯斌 《重庆邮电学院学报(自然科学版)》 2000年第1期38-40,共3页
简要分析了 FED场发射显示器的工作原理 ,陈述了非晶金刚石薄膜特殊的优点后 ,对用金刚石薄膜制作场发射器的可行性进行了讨论 ;还介绍了利用金刚石薄膜和阳极选择的方法对Spindt FED作了改进 ,从而使平面 FED更容易实现。
关键词 场致发射 阳极选择 金刚石薄膜
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Field emission digital display tube with nano-graphite film cathode
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作者 邓记才 鲁占灵 张兵临 《Chinese Optics Letters》 SCIE EI CAS CSCD 2008年第9期697-699,共3页
The field emission digital display tube with a nano-crystalline graphite cold cathode is designed and fabricated. Under the control of the driving circuits, a dynamic digital display with uniform luminance distributio... The field emission digital display tube with a nano-crystalline graphite cold cathode is designed and fabricated. Under the control of the driving circuits, a dynamic digital display with uniform luminance distribution is realized. The luminance of the character segments is 190 cd/m2 at the operating voltage of 900 V. And the stable emission is attained with a fluctuation of about 3% at an average segment current of 75 μA. The results demonstrate that nano-crystalline graphite film is a promising material for cold cathode. 展开更多
关键词 Th Field emission digital display tube with nano-graphite film cathode FED CVD TEM very
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Development of a virtual metrology for high-mix TFT-LCD manufacturing processes
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作者 陈山 潘天红 郑西显 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第11期150-154,共5页
Nowadays,TFT-LCD manufacturing has become a very complex process,in which many different products being manufactured with many different tools.The ability to predict the quality of product in such a high-mix system is... Nowadays,TFT-LCD manufacturing has become a very complex process,in which many different products being manufactured with many different tools.The ability to predict the quality of product in such a high-mix system is critical to developing and maintaining a high yield.In this paper,a statistical method is proposed for building a virtual metrology model from a number of products using a high-mix manufacturing process.Stepwise regression is used to select "key variables" that really affect the quality of the products.Multivariate analysis of covariance is also proposed for simultaneously applying the selected variables and product effect.This framework provides a systematic method of building a processing quality prediction system for a high-mix manufacturing process.The experimental results show that the proposed quality prognostic system can not only estimate the critical dimension accurately but also detect potentially faulty glasses. 展开更多
关键词 stepwise regression virtual metrology MANCOVA thin film transistor liquid crystal display
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