The magnetization reversal process of nano-size rectangle-shaped NiFe film elements with different aspect ratios have been investigated under the orthogonally applied magnetic fields by micromagnetic simulation. Diffe...The magnetization reversal process of nano-size rectangle-shaped NiFe film elements with different aspect ratios have been investigated under the orthogonally applied magnetic fields by micromagnetic simulation. Different magnetization reversal modes can appear depending on whether the bias field is applied or not. When there is no bias field, double “C” state is the initial reversal state. However, when there is a bias field, “S” state is the starting mode. The larger the aspect ratio is, the larger the switching field is. But, when the aspect ratio is larger than 3, the increase of the switching field ceases. These results can provide useful information to the application of the patterned NiFe film with rectangular elements.展开更多
In conventional pulsed laser deposition （PLD） technique, plume deflection and composition distribution change with the laser incident direction and pulse energy, then causing uneven film thickness and composition di...In conventional pulsed laser deposition （PLD） technique, plume deflection and composition distribution change with the laser incident direction and pulse energy, then causing uneven film thickness and composition distribution for a multicomponent film and eventually leading to low device quality and low rate of final products. We present a novel method based on PLD for depositing large CIGS films with uni- form thickness and stoichiometry. By oscillating a mirror placed coaxially with the incident laser beam, the laser＇s focus is scanned across the rotating target surface. This arrangement maintains a constant re- flectance and optical distance, ensuring that a consistent energy density is delivered to the target surface by each laser pulse. Scanning the laser spot across the target suppresses the formation of micro-columns, and thus the plume deflection effect that reduces film uniformity in conventional PLD technique is eliminated. This coaxial scanning PLD method is used to deposit a CIGS film, 500 nm thick, with thickness uniformity exceeding ±3% within a 5 cm diameter, and exhibiting a highly homogeneous elemental distribution.展开更多
文摘The magnetization reversal process of nano-size rectangle-shaped NiFe film elements with different aspect ratios have been investigated under the orthogonally applied magnetic fields by micromagnetic simulation. Different magnetization reversal modes can appear depending on whether the bias field is applied or not. When there is no bias field, double “C” state is the initial reversal state. However, when there is a bias field, “S” state is the starting mode. The larger the aspect ratio is, the larger the switching field is. But, when the aspect ratio is larger than 3, the increase of the switching field ceases. These results can provide useful information to the application of the patterned NiFe film with rectangular elements.
基金supported by the Shenzhen Basic Research Project of Science and Technology under Grant No.JCYJ20120613112423982
文摘In conventional pulsed laser deposition （PLD） technique, plume deflection and composition distribution change with the laser incident direction and pulse energy, then causing uneven film thickness and composition distribution for a multicomponent film and eventually leading to low device quality and low rate of final products. We present a novel method based on PLD for depositing large CIGS films with uni- form thickness and stoichiometry. By oscillating a mirror placed coaxially with the incident laser beam, the laser＇s focus is scanned across the rotating target surface. This arrangement maintains a constant re- flectance and optical distance, ensuring that a consistent energy density is delivered to the target surface by each laser pulse. Scanning the laser spot across the target suppresses the formation of micro-columns, and thus the plume deflection effect that reduces film uniformity in conventional PLD technique is eliminated. This coaxial scanning PLD method is used to deposit a CIGS film, 500 nm thick, with thickness uniformity exceeding ±3% within a 5 cm diameter, and exhibiting a highly homogeneous elemental distribution.
