ELLIPSOMETRY MEASUREMENT ON ANISOTROPIC FILM AND CRYSTAL

In this paper, a method of light intensity mode ellipsometry for optical constant measurement on anisotropic films and crystals is studied. Softwares for this method have also been developed Based on the theories and correspond softwares, experiments are carried out carefully for anisotropic film and bulk samples with optical axis parallel to their surface as well as optical axis perpendicular to the surface. Moreover, the discrepancy between measured data and calculated results are also analyzed. The measurement system developed in this paper is powerful to measure optical parameter of anisotropic film and bulk samples.

Growth of High-Quality Superconducting FeSe0.5Te0.5 Thin Films Suitable for Angle-Resolved Photoemission Spectroscopy Measurements via Pulsed Laser Deposition

High-quality superconducting FeSe0.5 Te0.5 films are epitaxiMly grown on different substrates by using the pulsed laser deposition method. By measuring the transport properties and surface morphology of films grown on single- crystal substrates of Al2O3 （0001）, SrTiO3 （001）, and MgO （001）, as well as monitoring the real-time growth process on MgO substrates with reflection high energy electron diffraction, we find the appropriate parameters for epitaxial growth of high-quality FeSe0.5 Te0.5 thin films suitable for angle-resolved photoemission spectroscopy measurements. We further report the angle-resolved photoemission spectroscopy characterization of the super- conducting films. The clearly resolved Fermi surfaces and the band structure suggest a sample quality that is as good as that of high-quality single-crystals, demonstrating that the pulsed laser deposition method can serve as a promising technique for in situ preparation and manipulation of iron-based superconducting thin films, which may bring new prosperity to angle-resolved photoemission spectroscopy research on iron-based superconductors.

Relative Irradiance Measurement and Bonding Configurations of Amorphous Fluorinated Carbon Films Deposited by Electron Cyclotron Resonance Plasma

a-C:F films are deposited by microwave electron cyclotron resonance (ECR)plasma chemical vapor deposition (CVD) using trifluoromethane (CHF3) and benzene (C6H6) as source gases at different microwave powers. The radicals in plasma originating from source gases dissociation are analyzed by relative irradiance measurement. The bonding configurations and binding state of a-C:F films are measured with Fourier-transformed infrared spectrometer (FTIR) and x-ray photoelectron spectroscopy (XPS). The results show that a-C:F films are mainly composed of CF radical at lower powers but of CF2 radical at higher powers. The deposition of films is related to the radicals generated in plasma and the main bonding configurations are dependent on the ratio of CF to CF2 radicals in films.

Electrodeposition and characterization of Cu2O thin films using sodium thiosulfate as an additive for photovoltaic solar cells

Cuprous oxide （Cu2O） thin films have been grown by electrodeposition technique onto ITO-coated glass substrates from aqueous copper acetate solutions with addition of sodium thiosulfate at 60 ℃ The effects of sodium thiosulfate on the electrochemical deposition of Cu2O films were investigated by cyclic voltammetry and chronoamperometry techniques. Deposited films were obtained at - 0.58 V vs. SCE and characterized by X-ray diffraction （XRD）, Fourier transform infrared spectroscopy （FrIR）, scanning electron microscopy （SEM）, and optical, photoelectrochemical and electrical measurements. X-ray diffraction results indicated that the synthesized Cu2O films had a pure cubic phase with a marked preferential orientation peak along （200） plane and with lattice constants a = b = c = 0.425 rim. FFIR results confirmed the presence of Cu2O films at peak 634 cm 1. SEM images of Cu2O films showed a better compactness and spherical-shaped composition. Optical properties of Cu2O films reveal a high optical transmission （〉80%） and high absorption coefficient （α 〉 104 cm- 1 ） in visiblelight region. The optical energy band gap was found to be 2.103 eV. Photoelectrochemical measurements indicated that Cu2O films had n-type semiconductor conduction, which confirmed by Hall Effect measurements. Electrical properties of Cu2O films showed a low electrical resistivity of 61.30 Ω. cm-1, carrier concentration of-4.94×1015cm -3andmobility of20.61cm2.V 1,s-l.Theobtained Cu2O thin films with suitable properties are promising semiconductor material for fabrication of photovoltaic solar cells,

Physical and Chemical Properties of GdN: A Critical Comparison between Single Crystals and Thin Films, Theory and Experiment

Since about 10 years, there is a controversy about physics and chemistry of GdN between stoichiometric (tested) large single crystals and off-stoichiometric thin films. GdN single crystals are anti-ferromagnetic for applied magnetic fields of only 10 Oe, become ferromagnetic for excess electrons and larger magnetic fields. They are semimetallic. Thin films are ferromagnetic and semiconductors. Over the time, many experiments have been performed on both systems and the physics in each system is consistent. Band structure computations either yield ferromagnetic semimetals or ferromagnetic semiconducting thin films. There seems to be two incompatible worlds, those of single crystals and those of thin films. In the present work, the author compares directly the various measurements and calculations and gives reasons for their different results.

Visualization of Film Wavelike Characteristics and Measurement of Film Thickness in Spray Cooling

An experimental investigation was performed to study the heat transfer in an eight-nozzle spray cooling system with de-ionized water as the working fluid. Visualization of the liquid-solid contact area and the flow near the heated surface was made using a microscopic lens system in conjunction with an advanced high-speed camera. The film thickness and film wavelike characteristics under liquid volume flow rates ranged from 2.78×10 -6 m 3 /s to 1.39×10 -5 m 3 /s and surface temperatures between 22℃ and 78.2℃ were examined respectively. The development process of the liquid film on the heated surface was observed. The local mean film thickness, the film wavelike characteristics and the behavior of the bubbles appeared in the liquid film were captured using an image processing technique. It is discovered that there exists a climax of local mean film thickness during the starting process of spray cooling. When the liquid film reaches the dynamic stable state, the dimensionless mean film thickness decreases with the increase of the liquid volume flow rate, and increases with the increase of surface temperature generally. Besides, the volume flow rate has a more significant impact on the wavelength and amplitude of the liquid film compared to the surface temperature.

Optical analysis of ball-on-ring mode test rig for oil film thickness measurement

There are few experimental results available on film thickness at speeds above 5 m/s and they are almost all based on the optical ball-on-disc test rig.In contrast to the contacts in a rolling bearing,in which the lubricant in the oil reservoir distributes symmetrically,ball-on-disc contact shows asymmetry of lubricant distribution due to centrifugal effects.In order to closely imitate the contact occurring between the ball and the outer ring of a ball bearing,this study proposes an experimental model based on ball-on-glass ring contact.An optical matrix method is used to analyze the optical system,which is composed of a steel ball-lubricant-chromium-coated glass ring.Based on the optical analysis,the measurement system is improved in order to obtain a high quality interference image,which makes it possible to measure the film thickness at high-speeds conditions.

Nonlinear phase error analysis of equivalent thickness in a white-light spectral interferometer

A white light spectral interferometry based on a Linnik type system was established to accurately measure the thin film thickness through transparent medium.In practical work,the equivalent thickness of a beam splitter and the mismatch of the objective lens introduce nonlinear phase errors.Adding a transparent medium also increases the equivalent thickness.The simulation results showthat the equivalent thickness has a significant effect on thin film thickness measurements.Therefore,it is necessary to perform wavelength correction to provide a constant equivalent thickness for beamsplitters.In the experiments,some pieces of cover glasses as the transparent medium were added to the measured beam and then a standard thin film thickness of 1052.2±0.9 nm was tested through the transparent medium.The results demonstrate that our system has a nanometer-level accuracy for thin film thickness measurement through transparent medium with optical path compensation.