The cholesteric liquid crystalline structure in chitosan/polyacrylic acid composite films was studied by surface techniques. A periodical lamellar-like structure was observed in the permanganic acid etched film surfac...The cholesteric liquid crystalline structure in chitosan/polyacrylic acid composite films was studied by surface techniques. A periodical lamellar-like structure was observed in the permanganic acid etched film surface by both scanning electron microscopy (SEM) and atomic force microscopy (AFM), instead of the thumb-print texture which can be detected with polarized optical microscopy. It is suggested that the periodical lamellar-like structure is induced by the etching selectivity between cholesteric layers due to different molecular arrangement on the film surface. Four kinds of perpendicular disclinations, i.e. chi --> tau (-) + lambda (+), chi --> lambda (-) + tau (+), chi --> tau (-) + tau (+) and chi --> lambda (-) + lambda (+) were found in the composite films from SEM observations. The smallest periodicity of lamellar-like structure (equals to half pitch) is 20 similar to 40 nm measured with AFM.展开更多
基金This work was supported by the National Natural Science Foundation of China (No. 29974023) and Natural Science Foundation of Fujian (No.29910006).
文摘The cholesteric liquid crystalline structure in chitosan/polyacrylic acid composite films was studied by surface techniques. A periodical lamellar-like structure was observed in the permanganic acid etched film surface by both scanning electron microscopy (SEM) and atomic force microscopy (AFM), instead of the thumb-print texture which can be detected with polarized optical microscopy. It is suggested that the periodical lamellar-like structure is induced by the etching selectivity between cholesteric layers due to different molecular arrangement on the film surface. Four kinds of perpendicular disclinations, i.e. chi --> tau (-) + lambda (+), chi --> lambda (-) + tau (+), chi --> tau (-) + tau (+) and chi --> lambda (-) + lambda (+) were found in the composite films from SEM observations. The smallest periodicity of lamellar-like structure (equals to half pitch) is 20 similar to 40 nm measured with AFM.
