Aiming to solve the problem that it is difficult to accurately measure UV cut-off transmittance of xenon quartz glass by using present spectrophotometer in China SG III project. Through the analysis, we believe that i...Aiming to solve the problem that it is difficult to accurately measure UV cut-off transmittance of xenon quartz glass by using present spectrophotometer in China SG III project. Through the analysis, we believe that its reason was that the xenon quartz glass was nonplanar so the outgoing beam geometry from under-test was different from that from standard sample. A method of transmittance measurement based on focal-plane-array camera was proposed in this article. The effects of camera uniformity and spot sampling on transmittance measurement were analyzed theoretically. This method, which can reduce the effect of beam geometry on transmittance measurement and eliminate the cutting error occurring during light transmission by monitoring the completeness of incident beam in real-time, is verified from experiments. The random standard uncertainty of this method here is 0.035% or less. It is particularly useful in the transmittance measurement of nonplanar optical.展开更多
本文报道了1280×1024元InAs/GaSb II类超晶格中/中波双色红外焦平面阵列探测器的研究结果。探测器采用PN-NP叠层双色外延结构,信号提取采用叠层双色结构和顺序读出方式。运用分子束外延技术在GaSb衬底上生长超晶格材料,双波段红外...本文报道了1280×1024元InAs/GaSb II类超晶格中/中波双色红外焦平面阵列探测器的研究结果。探测器采用PN-NP叠层双色外延结构,信号提取采用叠层双色结构和顺序读出方式。运用分子束外延技术在GaSb衬底上生长超晶格材料,双波段红外吸收区的超晶格周期结构分别为中波1:6 ML InAs/7 ML GaSb和中波2:9 ML InAs/7 ML GaSb。焦平面阵列像元中心距为12μm。在80 K时测试,器件双波段的工作谱段为中波1:3~4μm,中波2:3.8~5.2μm。中波1器件平均峰值探测率达到6.32×10^(11) cm·Hz^(1/2)W^(-1),中波2器件平均峰值探测率达到2.84×10^(11) cm·Hz^(1/2)W^(-1)。红外焦平面偏压调节成像测试得到清晰的双波段成像。本文是国内首次报道1280×1024规模InAs/GaSb II类超晶格中/中波双色红外焦平面探测器。展开更多
文摘Aiming to solve the problem that it is difficult to accurately measure UV cut-off transmittance of xenon quartz glass by using present spectrophotometer in China SG III project. Through the analysis, we believe that its reason was that the xenon quartz glass was nonplanar so the outgoing beam geometry from under-test was different from that from standard sample. A method of transmittance measurement based on focal-plane-array camera was proposed in this article. The effects of camera uniformity and spot sampling on transmittance measurement were analyzed theoretically. This method, which can reduce the effect of beam geometry on transmittance measurement and eliminate the cutting error occurring during light transmission by monitoring the completeness of incident beam in real-time, is verified from experiments. The random standard uncertainty of this method here is 0.035% or less. It is particularly useful in the transmittance measurement of nonplanar optical.
文摘本文报道了1280×1024元InAs/GaSb II类超晶格中/中波双色红外焦平面阵列探测器的研究结果。探测器采用PN-NP叠层双色外延结构,信号提取采用叠层双色结构和顺序读出方式。运用分子束外延技术在GaSb衬底上生长超晶格材料,双波段红外吸收区的超晶格周期结构分别为中波1:6 ML InAs/7 ML GaSb和中波2:9 ML InAs/7 ML GaSb。焦平面阵列像元中心距为12μm。在80 K时测试,器件双波段的工作谱段为中波1:3~4μm,中波2:3.8~5.2μm。中波1器件平均峰值探测率达到6.32×10^(11) cm·Hz^(1/2)W^(-1),中波2器件平均峰值探测率达到2.84×10^(11) cm·Hz^(1/2)W^(-1)。红外焦平面偏压调节成像测试得到清晰的双波段成像。本文是国内首次报道1280×1024规模InAs/GaSb II类超晶格中/中波双色红外焦平面探测器。