Atoms constructing an interconnecting metal line in a semiconductor device are transported by electron flow in high density. This phenomenon is called electromigration, which may cause the line failure. In order to ch...Atoms constructing an interconnecting metal line in a semiconductor device are transported by electron flow in high density. This phenomenon is called electromigration, which may cause the line failure. In order to characterize the electromigration failure, a comparison study is carded out with some typical phenomena treated by fracture mechanics for thin and large structures. An example of thin structures, which have been treated by fracture mechanics, is silica opti- cal fibers for communication systems. The damage growth in a metal line by electromigration is characterized in compar- ison with the crack growth in a silica optical fiber subjected to static fatigue. Also a brief comparison is made between the electromigration failure and some fracture phenomena in large structures.展开更多
With the uncertainties related to operating conditions,in-service non-destructive testing（NDT） measurements and material properties considered in the structural integrity assessment,probabilistic analysis based on t...With the uncertainties related to operating conditions,in-service non-destructive testing（NDT） measurements and material properties considered in the structural integrity assessment,probabilistic analysis based on the failure assessment diagram（FAD） approach has recently become an important concern.However,the point density revealing the probabilistic distribution characteristics of the assessment points is usually ignored.To obtain more detailed and direct knowledge from the reliability analysis,an improved probabilistic fracture mechanics（PFM） assessment method is proposed.By integrating 2D kernel density estimation（KDE） technology into the traditional probabilistic assessment,the probabilistic density of the randomly distributed assessment points is visualized in the assessment diagram.Moreover,a modified interval sensitivity analysis is implemented and compared with probabilistic sensitivity analysis.The improved reliability analysis method is applied to the assessment of a high pressure pipe containing an axial internal semi-elliptical surface crack.The results indicate that these two methods can give consistent sensitivities of input parameters,but the interval sensitivity analysis is computationally more efficient.Meanwhile,the point density distribution and its contour are plotted in the FAD,thereby better revealing the characteristics of PFM assessment.This study provides a powerful tool for the reliability analysis of critical structures.展开更多
文摘Atoms constructing an interconnecting metal line in a semiconductor device are transported by electron flow in high density. This phenomenon is called electromigration, which may cause the line failure. In order to characterize the electromigration failure, a comparison study is carded out with some typical phenomena treated by fracture mechanics for thin and large structures. An example of thin structures, which have been treated by fracture mechanics, is silica opti- cal fibers for communication systems. The damage growth in a metal line by electromigration is characterized in compar- ison with the crack growth in a silica optical fiber subjected to static fatigue. Also a brief comparison is made between the electromigration failure and some fracture phenomena in large structures.
基金supported by National Department Public Benefit Research Foundation of China (Grant No. 200810411)
文摘With the uncertainties related to operating conditions,in-service non-destructive testing（NDT） measurements and material properties considered in the structural integrity assessment,probabilistic analysis based on the failure assessment diagram（FAD） approach has recently become an important concern.However,the point density revealing the probabilistic distribution characteristics of the assessment points is usually ignored.To obtain more detailed and direct knowledge from the reliability analysis,an improved probabilistic fracture mechanics（PFM） assessment method is proposed.By integrating 2D kernel density estimation（KDE） technology into the traditional probabilistic assessment,the probabilistic density of the randomly distributed assessment points is visualized in the assessment diagram.Moreover,a modified interval sensitivity analysis is implemented and compared with probabilistic sensitivity analysis.The improved reliability analysis method is applied to the assessment of a high pressure pipe containing an axial internal semi-elliptical surface crack.The results indicate that these two methods can give consistent sensitivities of input parameters,but the interval sensitivity analysis is computationally more efficient.Meanwhile,the point density distribution and its contour are plotted in the FAD,thereby better revealing the characteristics of PFM assessment.This study provides a powerful tool for the reliability analysis of critical structures.
