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A Novel Built-in CMOS Temperature Sensor for VLSI Circuits 被引量:3
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作者 王乃龙 张盛 周润德 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第3期252-256,共5页
A novel temperature sensor is developed and presented especially for the purpose of on-line thermal monitoring of VLSI chips.This sensor requires very small silicon area and low power consumption,and the simulation re... A novel temperature sensor is developed and presented especially for the purpose of on-line thermal monitoring of VLSI chips.This sensor requires very small silicon area and low power consumption,and the simulation results show that its accuracy is in the order of 0.8℃.The proposed sensor can be easily implemented using regular CMOS process technologies,and can be easily integrated to any VLSI circuits to increase their reliability. 展开更多
关键词 temperature sensor thermal testability frequency-output
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