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Parasitic bipolar amplification in a single event transient and its temperature dependence 被引量:2
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作者 刘征 陈书明 +2 位作者 陈建军 秦军瑞 刘蓉容 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第9期607-612,共6页
Using three-dimensional technology computer-aided design (TCAD) simulation, parasitic bipolar amplification in a single event transient (SET) current of a single transistor and its temperature dependence are studi... Using three-dimensional technology computer-aided design (TCAD) simulation, parasitic bipolar amplification in a single event transient (SET) current of a single transistor and its temperature dependence are studied. We quantify the contributions of different current components in a SET current pulse, and it is found that the proportion of parasitic bipolar amplification in total collected charge is about 30% in both ]30-nm and 90-nm technologies. The temperature dependence of parasitic bipolar amplification and the mechanism of the SET pulse are also investigated and quantified. The results show that the proportion of charge induced by parasitic bipolar increases with rising temperature, which illustrates that the parasitic bipolar amplification plays an important role in the charge collection of a single transistor. 展开更多
关键词 single event transient parasitic bipolar amplification funnel-aided drift temperature dependence
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