Geometry parameters of optical fiber are crucial in evaluating the quality of the optical fiber.Near⁃field light distribution method is recommended in GB15972.20-2008 for the measurement of geometry parameters.To dist...Geometry parameters of optical fiber are crucial in evaluating the quality of the optical fiber.Near⁃field light distribution method is recommended in GB15972.20-2008 for the measurement of geometry parameters.To distinguish the boundary between fiber core and cladding,it is necessary to illuminate the fiber.The end face of the core is a bright spot with unclear edge,so the true edge of the core and the cladding cannot be accurately judged.A method is proposed in this paper to measure the geometry parameters of optical fiber by Bessel function fitting.Theoretically,the solution to the electromagnetic vector of mode field satisfies Bessel function,and the boundary between the core and the cladding can be precisely extracted by Bessel function fitting.Edges of the fiber were fitted by elliptical curves,and the geometry parameters of the fibers could be calculated.Results show that the maximum deviations of the diameters and the average differences of the fibers were decreased under normal and abnormal conditions respectively.The proposed method is an efficient way to obtain edge data and can improve the accuracy and stability of geometry parameters of optical fibers.展开更多
Changes in refractive index and the corresponding changes in the characteristics of an optical waveguide in enabling propagation of light are the basis for many modern silicon photonic devices. Optical properties of t...Changes in refractive index and the corresponding changes in the characteristics of an optical waveguide in enabling propagation of light are the basis for many modern silicon photonic devices. Optical properties of these active nanoscale waveguides are sensitive to the little changes in geometry, external injection/biasing, and doping profiles, and can be crucial in design and manufacturing processes. This paper brings the active silicon waveguide for complete characterization of various distinctive guiding parameters, including perturbation in real and imaginary refractive index, mode loss, group velocity dispersion, and bending loss, which can be instrumental in developing optimal design specifications for various application-centric active silicon waveguides.展开更多
基金Sponsored by the National Science Foundation for Young Scholars of China(Grant No.61605114).
文摘Geometry parameters of optical fiber are crucial in evaluating the quality of the optical fiber.Near⁃field light distribution method is recommended in GB15972.20-2008 for the measurement of geometry parameters.To distinguish the boundary between fiber core and cladding,it is necessary to illuminate the fiber.The end face of the core is a bright spot with unclear edge,so the true edge of the core and the cladding cannot be accurately judged.A method is proposed in this paper to measure the geometry parameters of optical fiber by Bessel function fitting.Theoretically,the solution to the electromagnetic vector of mode field satisfies Bessel function,and the boundary between the core and the cladding can be precisely extracted by Bessel function fitting.Edges of the fiber were fitted by elliptical curves,and the geometry parameters of the fibers could be calculated.Results show that the maximum deviations of the diameters and the average differences of the fibers were decreased under normal and abnormal conditions respectively.The proposed method is an efficient way to obtain edge data and can improve the accuracy and stability of geometry parameters of optical fibers.
文摘Changes in refractive index and the corresponding changes in the characteristics of an optical waveguide in enabling propagation of light are the basis for many modern silicon photonic devices. Optical properties of these active nanoscale waveguides are sensitive to the little changes in geometry, external injection/biasing, and doping profiles, and can be crucial in design and manufacturing processes. This paper brings the active silicon waveguide for complete characterization of various distinctive guiding parameters, including perturbation in real and imaginary refractive index, mode loss, group velocity dispersion, and bending loss, which can be instrumental in developing optimal design specifications for various application-centric active silicon waveguides.
