Preparation and Characterization of CeO_2-TiO_2/SnO_2:Sb Films Deposited on Glass Substrates by R.F.Sputtering

CeO2-TiO2 films and CeO2-TiO/SnO2：Sb （6 mol%） double films were deposited on glass substrates by radio-frequency magnetron sputtering （R.F. Sputtering）, using SnO2：Sb（6 mol%） target, and CeO2- TiO2 targets with different molar ratio of CeO2 to TiO2 （CeO2：TiO2-0：1.0; 0.1：0.9; 0.2：0.8; 0.3：0.7; 0.4：0.6; 0.5：0.5; 0.6：0.4; 0.7：0.3; 0.8：0.2; 0.9：0.1; 1.0：0）. The films are characterized by UV-visible transmission and infrared reflection spectra, scanning electron microscopy （SEM）, Raman spectroscopy, X-ray photoelectron spectroscopy （XPS） and X-ray diffraction （XRD）, respectively. The obtained results show that the amorphous phases composed of CeO2-TiO2 play an important role in absorbing UV, there are Ce^3-, Ce^4- and Ti^4- on the surface of the films; the glass substrates coated with CeO2-TiO2 （Ce/Ti=0.5：0.5; 0.6：0.4）/SnO2：Sb（6 mol%） double films show high absorbing UV（〉99）, high visible light transmission （75%） and good infrared reflection （〉70%）. The sheet resistance of the films is 30-50 Ω/□. The glass substrates coated with the double functional films can be used as window glass of buildings, automobile and so on.

Sol-gel preparation and phosphorescence property of Mn^(2+)-doped zinc boro-silicate glass thin films

Mn2＋-doped zinc borosilicate （ZBSM） glass thin films were first synthesized by sol-gel method. In the experiment, a thin gel film was depos-ited onto quartz glass substrates by dip-coating method and then heat-treated to form a Mn2＋-doped zinc borosilicate glass thin film. Long lasting phosphorescence （LLP） and photo-stimulated long lasting phosphorescence （PSLLP） were found in the film sample. According to fluorescence spectra, LLP emission spectra, and PSLLP emission spectra, both LLP and PSLLP emissions are attributed to the energy level transition of 4Eg→4A1g from Mn2＋. Both the phosphorescence intensity decay curves contain a fast decay component and another slow decay one. The thermoluminescence （TL） spectra show that the sample has two kinds of traps at least and their energy level values are about 0.8 eV and 1.02 eV, which could be estimated by the Randall and Willcins formula. The infrared absorption spectra （IR） consist of characteristic vi-bration bands of Si-O-Si, Si-O-Zn, B-O in [BO3], B-O group, and Zn-O in [ZnO4]. Moreover, image storage and logical operation of the ZBSM film were carried out successfully through an experiment analogues of optical storage.

Thin Film of Mesoporous MCM-41 Grown on Indium-Tin-Oxide Glass Substrate

From a basic solution containing celyltrimethylammonium cations as the template, thin film of mesoporous MCM-41 has been grown on the surface of a pre-treated indium-tin-oxide conducting glass substrate. The channel axis of the film is oriented parallel with the surface plane of the substrate, and the film is stable after careful removal of template in vacuum.

Low Temperature Coating of Anatase Thin Films on Silica Glass Fibers by Liquid Phase Deposition

Uniform crystalline TiO2 thin films were coated on silica glass fibers by liquid phase deposition from aqueous solution of ammonium hexafluorotitanate at low temperature. TiO2 thin films and nanopowders were prepared by adding H3BO3 into （NH4）2TiF6 solution supersaturated with anatase nano-crystalline TiO2 at 40 ℃. The effects of the deposition conditions on the surface morphology, section morphology, thickness of the deposited TiO2 thin films were investigated. The results indicate that the growth rate and particle size of the thin films were controlled by both the deposition conditions and the amount of anatase nano-crystalline TiO2.

Interaction of RuO₂and Lead-Silicate Glass in Thick-Film Resistors

Results of investigation of X-ray diffraction, infrared and optical spectra of powders of the ruthenium dioxide, lead-silicate glass as well as their mixture before and after sintering are reported. Sintering conditions typical for thick film resistors were used. Intensity of main lines of RuO2 in X-ray diffraction patterns of sintered mixtures decreases and they slightly shift towards small angles. No new reflexes appear in these patterns. Absorbance of RuO2 in the range of 2.5-100 μm is proportional to and featureless. Infrared spectrum of lead-silicate glass has absorption bands of [SiO4]4- tetrahedra and Pb-O bonds only. Optical spectrum of RuO2 has wide absorption bands at 950 and 370 nm. Spectra of the mixture of RuO2 and glass powders before and after sintering are different indicating that there is interaction between them during the sintering process. Concentration of free charge carriers estimated from the optical spectra is about 1021 cm-3.

Development of a High-PerformanceFlexible Substrate for Flexible Electronics:Joining TAC Films and an Ultra-Thin Glassby Using TEOS-DAC Synthesized by the Sol-Gel Method

A new flexible substrate for flexible electronics has been developed. The developed substrate consists of an ultra thin glass and TAC (triacethyl cellulose) film. An ultra thin glass and TAC film were joined with TEOS-DAC (TEOS: tetraethyl orthosilicate, DAC: diacethy cellulose) adhesive resin synthesized by sol-gel method by means of thermo-compression bonding. This substrate has high transparency in visible-light region (90%), high flexibility (torsion strength and bending strength) and high gas barrier characteristics due to an ultra thin glass. The newly-developed substrate is superior to the substrates fabricated with commercially available adhesive resin in the same way in characteristics of heat resistance, transparency and flexibility.

Fabrication of nanoporous TiO_2 films with novel surface morphology on conducting glass(FTO) substrate

The crystalline structure and surface morphology of TiO2 semiconductor coating play an important role in the conversion efficiency of dye-sensitized solar cells.In order to obtain TiO2 coating with controllable morphology and high porosity,nanoporous TiO2 films were fabricated on conducting glass(FTO) substrates,Ti thin films(1.5-2 μm) were deposited on conducting glass(FTO) substrates via the DC sputtering method,and then electrochemically anodized in NH4F/ethylene glycol solution.The crystalline structure and surface morphology of the samples were characterized by X-ray diffraction(XRD) and field emission scanning electron microscopy(FESEM),respectively.The influences of anodizing potential,electrolyte composition,and pH value on the surface morphology of nanoporous TiO2 films were extensively studied.The growth mechanism of nanoporous TiO2 films was discussed by current density variations with anodizing time.The results demonstrate that nanoporous TiO2 films with high porosity and three-dimensional(3D) networks are observed at 30 V,when the NH4F concentration in ethylene glycol solution is 0.3%(mass fraction) and the electrolyte pH value is 5.0.

The glass roller cutter made of CVD diamond film

As a cutting tool,diamond films made by chemical vapor deposition(CVD) outperformed polycrystalline diamond(PCD) sintered under ultrahigh pressure.For example,the longevity of the CVD tools may be 2～5 times that of PCD inserts.In addition,the former cutting paths are strainghter with less chipping on the edge.However,there have been no report on CVD diamond films that were used as a roller scriber for splitting large glass panels.Our research demonstrated that the CVD diamond film could concentrate the energy in a smaller area(about 1/4),so the glass compressed by the tip of the diamond film was under a larger tensile stress in perpendicular to the direction of compression.The tensile stress then initiated the microcracks that were more in line with the direction of the compression. The reason that CVD diamond film could concentrate the compressive stress was due to its 100%diamond content.The high diamond content could allow the tip to be polished sharper.In contrast,the PCD cutting tip contained micro grains of cobalt that were softer than glass.As a result,the compressional stress was spreading out due to the larger area of contact.Consequently,the microcracks initiated at the PCD tip were random and they might not propagate along the direction of cutting.

Influence of Zr(50)Cu(50) thin film metallic glass as buffer layer on the structural and optoelectrical properties of AZO films

Aluminum-doped ZnO(AZO) thin films with thin film metallic glass of Zr(50)Cu(50) as buffer are prepared on glass substrates by the pulsed laser deposition. The influence of buffer thickness and substrate temperature on structural, optical, and electrical properties of AZO thin film are investigated. Increasing the thickness of buffer layer and substrate temperature can both promote the transformation of AZO from amorphous to crystalline structure, while they show(100)and(002) unique preferential orientations, respectively. After inserting Zr(50)Cu(50) layer between the glass substrate and AZO film, the sheet resistance and visible transmittance decrease, but the infrared transmittance increases. With substrate temperature increasing from 25℃ to 520℃, the sheet resistance of AZO(100 nm)/Zr(50)Cu(50)(4 nm) film first increases and then decreases, and the infrared transmittance is improved. The AZO(100 nm)/Zr(50)Cu(50)(4 nm) film deposited at a substrate temperature of 360℃ exhibits a low sheet resistance of 26.7 ?/, high transmittance of 82.1% in the visible light region, 81.6% in near-infrared region, and low surface roughness of 0.85 nm, which are useful properties for their potential applications in tandem solar cell and infrared technology.

Influence of Patch Side of Heat-Ray Absorbing Film on One-Dimensional Unsteady Thermal Stresses in Window Glass

Heat-ray absorbing film is used to be bonded on the existing sheet glasses of the windows.It is effective for air-conditioning energy saving against the global warming,because it absorbs heat-ray in the thin film and decreases the incoming heat-ray into the room.On the other hand,the sheet glasses increase the temperature at the surface which the sheet is bonded and sometimes yield heat cracks by thermal stresses.It is important to know the state of thermal stresses accurately in order to develop the heat-ray absorbing film with higher performance and without heat cracks.In this paper,the analysis model is treated as the two-layer plate of the conventional soda sheet glass and the heat-ray absorbing film with different absorptivities.The unsteady temperature and thermal stresses are analyzed and calculated numerically.The influence of the patch side,which the heat-ray absorbing film is bonded at the exterior side or the interior side,on the heat-ray absorbing performance and the thermal stresses is discussed.It is found that the alternative patch side has no effect on the heat-ray absorbing performance and that the patch side is recommended to be interior side from a view point of decreasing thermal stresses against the heat crack of glasses.

Synthesis of RE-Ag,Al-RE-doped sol-gel glass and films for solar cells

The paper dealt with the study of fluorescence properties of sol-gel systems doped with rate-earth ions and co-doped with silver. The general problem for these types of inorganic phosphors was a very low absorbance in the visible range. Therefore, a sensitizer of luminescence of the rare-earth ions should be selected and used. The sensitizer should possess a good absorbance in the visible range and strong interaction with the rare-earth ions. In this study silver ions were selected as the sensitizer.

Effects of Substrate Temperatures on the Structure and UV-shielding Properties of TiO_2-CeO_2 Films Deposited on Glass by Radio-frequency Magnetron Sputtering

TiO2-CeO2 films were deposited on soda-lime glass substrates at varied substrate temperatures by rf magnetron sputtering using 40% molar TiO2-60% molar CeO2 ceramic target in Ar：O2=95：5 atmosphere.The structure,surface composition,UV-visible spectra of the films were measured by scanning electron microscopy and X-ray diffraction,and X-ray photoelectron spectroscopy,respectively.The experimental results show that the films are amorphous,there are only Ti^4＋ and Ce^4＋ on the surface of the films,the obtained TiO2-CeO2 films shou a good uniformity and high densification,and the films deposited on the glass can shield ultraviolet light without significant absorpition of visible light,the films deposited on substrates at room temperature and 220℃ absorb UV effectively.

The Effective Surface Metallization of Hollow Glass Microspheres for Flexible Electromagnetic Shielding Film

The surface of hollow glass microspheres (HGMs) was roughened by a HCl+NH_(4)F strategy,which achieved a broken ratio as 16.10%,and then metallized by electroless plating by Co nanoparticles up to 90 wt% (abbreviated as Co-HGMs).The average grain size of Co was measured to range from 0.4 to 0.5 μm.Then Co-HGMs were mixed with liquid silicone rubber and xylene,and cured on a perspex plate applicable for flexible electromagnetic shielding.By attentive parameter optimization,a film about 0.836 mm in thickness was obtained with a density of 0.729 g/cm^(3),showing a shielding effectiveness of 15.2 dB in the X-band (8.2-12.4 GHz) at room temperature,which was ascribed to the formation of a conductive network of Co-HGMs inside the film.Simultaneously,the tensile strength of 0.89 MPa at an elongation ratio of 194.5% was also obtained,showing good mechanical properties and tensile strength.

On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors)

The results of the investigation of conduction mechanism of silicate glass doped by oxide compounds of ruthenium (thick film resistor) are reported. The formation of diffusion zones in the softened glass during firing process of the mixture of the glass and the dopant powders is considered. As the result the doping glass becomes conductive. These diffusion zones have higher conductivity and act as percolation levels for the free charge carriers. The effect of tem-perature and duration of firing process on the conductivity of doped glass is considered. Experimental results are in a good agreement with the model.

On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors). 3. The Minimum of Temperature Dependence of Resistivity

This article is the final part of the investigation of conduction mechanism of silicate glass doped by oxide compounds of ruthenium (thick film resistors). In the first part [1], the formation of percolation levels due to diffusion of dopant atoms into the glass has been considered. The diffusion mechanism allowed us to explain shifting of the percolation threshold towards to lower value and the effect of firing conditions as well as the components composition on the electrical conduction of the doped glass. The coexistence of thermal activation and localization of free charge carriers as the result of nanocrystalline structure of the glass was the subject of the second part [2]. Because of it, the resistivity of the doped silicate glass is proportional to exp (–aT–ζ) at low temperatures (T 50 K), 0.4 ζ < 0.8. Structural transitions of nanocrystals take place at high temperatures (T > 800 K) and the conductivity of the doped silicate glass decreases sharply. We consider the origin of the minimum in the temperature dependence of resistivity of the doped silicate glass here. It is shown that the minimum arises from merge of impurity band into the valence band of glass at temperature high enough, so thermal activation of charge carriers as well as its hopping are failed, and scattering of free charge carriers become predominant factor in the temperature dependence of the resistivity.

Abnormal IR Spectra of CO Adsorbed on the Surface of Glass Carbon Electrode Modified with Polypyrrole Film with Platinum Microparticles

Abnormal IR spectra of CO adsorbed at the surface of glass carbon electrode modified with polypyrrole film with Pt microparticles are reported.

MgO and ZnO Composite Thin Films Using the Spin Coating Method on Microscope Glasses

In this study, a new route to produce pure and composite ZnO-MgO thin films has been presented. In the process the pure ZnO thin films were the starting point, ending up with MgO by doping various percentages (from 0% to 100%) of Mg with the help of sol-gel spin coating technique. The crystal phases in all doping levels have been obtained when the samples annealed at 600℃ for a duration of 6 hours. The X-ray diffraction (XRD) spectra, the scanning electron microscopy (SEM) micrographs and UV-Vis absorption spectra have been performed to elucidate the composed film structures.

Polycrystalline ZnSx Se1—x thin films deposited on ITO glass by MBE

MBE growth of ZnSx Se1-x thin films on ITO coated glass substrates were carried out using ZnS and Se Sources with the substrate temperature ranging from 270℃ to 330℃.The XRD θ/2θ spectra resulted from these films indicated that the as-grown polycrystalline ZnSx Se1-x thin films had a preferred orientation along the (111) planes.The evaluated crystal sizes as deduced from the FWHM of the XRD layer peaks showed strong growth temperature dependence,with the optimized temperature being about 290℃.Both AFM and TEM measurements of these thin films also indicated a similar growth temperature dependence.Hing qual-ity ZnSx Se1-x thin film growm at the optimized temperature had the smoothest surface with lowest RMS valus of 1.2 nm and TEM cross-sectional micrograph showing a well defined columnar structure.

Integration of measurement and simulation of film pressure for estimating deformation of a glass sheet on a noncontact air conveyor

Recently,large and thin glass substrates are transported by air film conveyors to reduce surface damage.On the production line,the glass substrates are desired to be transported flatly on the conveyor to ensure the quality inspection.A method by feedbacking film pressure to the theoretical model is proposed for estimation of the deformation of the glass sheet,and the validity of the method is theoretically and experimentally verified.First,a theoretical model including the flow behavior through a porous-walled gap is established,and the film pressure distribution can be predicted by solving the model.Then,an experimental setup that can simultaneously measure the film pressure and the flatness of the glass sheet is established,and,the validity of the model is verified experimentally.Next,with the pressure points at the grooves as the boundary and the pressure points at the flange area as the feedback,an algorithm is applied to shape the one-dimensional deformation at the centerlines in accordance with a quadratic curve.Furthermore,two-dimensional deformation of the glass sheet can then be estimated by an interpolation operation.Comparisons of the calculated results with the experimental data verify the effectiveness of the estimating method.