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Analytical Method for Designing Grating Compensated Dispersion-Managed Soliton Systems
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作者 Y. H. C. Kwan K. Nakkeeran P. K. A. Wai 《光学学报》 EI CAS CSCD 北大核心 2003年第S1期655-656,共2页
We show a useful analytical method to design grating compensated dispersion-managed systems. Our method is in good agreement with the numerical results even in the presence of group delay ripples in the chirped fiber ... We show a useful analytical method to design grating compensated dispersion-managed systems. Our method is in good agreement with the numerical results even in the presence of group delay ripples in the chirped fiber gratings. 展开更多
关键词 for in FWHM In of GDR Analytical Method for designing grating Compensated Dispersion-Managed Soliton Systems
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Design of a grating by a joint optimization method for a phase-shifting point diffraction interferometer
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作者 郑猛 刘克 +1 位作者 刘丽辉 李艳秋 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第10期66-70,共5页
A grating is an important element of a phase-shifting point diffraction interferometer, and the grating constant and duty cycle have a great impact on the interferometer, so the design of a grating becomes significant... A grating is an important element of a phase-shifting point diffraction interferometer, and the grating constant and duty cycle have a great impact on the interferometer, so the design of a grating becomes significant. In order to measure the projection objective with a numerical aperture of 0.2, we present a joint optimization method of a pinhole and grating based on scalar diffraction and the finite difference time domain method. The grating constant and the film thickness are selected, and the duty cycle of the grating is optimized. The results show that in the grating processing the material chromium is adopted, the thickness is 200 nm, and the grating constant is 15 μm. When the duty cycle is 55%, the interference fringe contrast is the greatest. The feasibility of the design result is further verified by experiment. 展开更多
关键词 exp design of a grating by a joint optimization method for a phase-shifting point diffraction interferometer
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