By means of induction melting technology,Ti-6Al-4V alloy staging casting was made with the same rotation velocity and centrifugal radius.The effects of casting modulus on the grain size,the thickness of lamellarα+βp...By means of induction melting technology,Ti-6Al-4V alloy staging casting was made with the same rotation velocity and centrifugal radius.The effects of casting modulus on the grain size,the thickness of lamellarα+βphase,and the Vickers hardness,as well as the relationships between Vickers hardness,grain size and thickness of lamellarα+βphase were investigated.The results show that the greater the modulus,the larger the grain size and the thickness of lamellarα+βphase,and the less the Vickers hardness. The relationship between Vickers hardness and grain size meets the Hall-Petch equation:Hv=353.45+74.17 d G-1/2 .The relationship between the Vickers hardness and the thickness of lamellarα+βphase is expressed as Hv=2.45d2α+β-35.96d α+β+476.84.展开更多
Aiming at the research on mechanical mechanism of hard-inclusion earthquake preparation model, in this paper,experimental and contrast research on stress field and rupture feature of hard-inclusion model has been made...Aiming at the research on mechanical mechanism of hard-inclusion earthquake preparation model, in this paper,experimental and contrast research on stress field and rupture feature of hard-inclusion model has been made respectively, which contained en echelon and composite cracks systems in models, and was loaded under uniaxial compressive stress. The result shows that reverse en echelon and T-shape cracks systems in hard-inclusion are the favorable geological structures to trigger earthquakes.展开更多
The interracial structure of hard and soft oxides grown by dry oxidation on<100> n-type silicon substrates is examined using high resolution mild X-ray photoelectron spectroscopy (XPS) before and after irradiati...The interracial structure of hard and soft oxides grown by dry oxidation on<100> n-type silicon substrates is examined using high resolution mild X-ray photoelectron spectroscopy (XPS) before and after irradiation. Substantial differences in silicon of silica state (B.E. 103.4 eV), silicon of transitional state (B.E. 101.5 eV), surplus oxygen (B.E. 529.6 eV) and negative two-valence oxygen (B.E. 531.4 eV) are observed between the two kinds of samples. The XPS spectra strongly depend on the conditions of irradiation for soft samples, but do not as remarkablely as soft samples for hard samples. The effects of irradiation doses on XPS are greater than that of irradiation bias fields. Some viewpoints of irradiation induced hole electron pair are proposed to explain the results.展开更多
基金Project(50434030)supported by the National Natural Science Foundation of China
文摘By means of induction melting technology,Ti-6Al-4V alloy staging casting was made with the same rotation velocity and centrifugal radius.The effects of casting modulus on the grain size,the thickness of lamellarα+βphase,and the Vickers hardness,as well as the relationships between Vickers hardness,grain size and thickness of lamellarα+βphase were investigated.The results show that the greater the modulus,the larger the grain size and the thickness of lamellarα+βphase,and the less the Vickers hardness. The relationship between Vickers hardness and grain size meets the Hall-Petch equation:Hv=353.45+74.17 d G-1/2 .The relationship between the Vickers hardness and the thickness of lamellarα+βphase is expressed as Hv=2.45d2α+β-35.96d α+β+476.84.
文摘Aiming at the research on mechanical mechanism of hard-inclusion earthquake preparation model, in this paper,experimental and contrast research on stress field and rupture feature of hard-inclusion model has been made respectively, which contained en echelon and composite cracks systems in models, and was loaded under uniaxial compressive stress. The result shows that reverse en echelon and T-shape cracks systems in hard-inclusion are the favorable geological structures to trigger earthquakes.
基金This work was supported by Beijing Zhongguancun Associated Center of Analysis and Measurement
文摘The interracial structure of hard and soft oxides grown by dry oxidation on<100> n-type silicon substrates is examined using high resolution mild X-ray photoelectron spectroscopy (XPS) before and after irradiation. Substantial differences in silicon of silica state (B.E. 103.4 eV), silicon of transitional state (B.E. 101.5 eV), surplus oxygen (B.E. 529.6 eV) and negative two-valence oxygen (B.E. 531.4 eV) are observed between the two kinds of samples. The XPS spectra strongly depend on the conditions of irradiation for soft samples, but do not as remarkablely as soft samples for hard samples. The effects of irradiation doses on XPS are greater than that of irradiation bias fields. Some viewpoints of irradiation induced hole electron pair are proposed to explain the results.
