For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert s...For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert switch is presented to verify the reliability of the invert switch. The test system uses complex programmable logic device （CPLD） to control data acquisition of A/D converter and data storage of external flash memory, and then transmits the acquired data to a computer for data analysis and processing. The test system can provide the required sampling frequency of the signal in high temperature, normal temperature and low temperature environments, and the reliability of the invert switch can be verified according to the signal parameters. The results show that the test system has high precision and the tested invert switch has low power consumption and high reliability.展开更多
Aiming at harsh environment of cluster bombs center tube explosion dispersion and difficulties in installation of traditional test systems,a storage test system based on 16-bit ultra-low power microcontroller MSP430 i...Aiming at harsh environment of cluster bombs center tube explosion dispersion and difficulties in installation of traditional test systems,a storage test system based on 16-bit ultra-low power microcontroller MSP430 is designed in order to acquire gas pressure during cluster bombs dispersion.To meet the requirement of low power consumption,the working states of system＇s modules during data acquisition are elaborated and the equation to calculate the gas pressure change during cylindrical center tube opening the hatch is deduced.The field test is conducted and good test results are obtained.展开更多
针对储存测试系统微型化的瓶颈问题,设计了具有多采样策略的ASIC(application specific inte-grated circuit)。该芯片可以根据被测信号的变化规律在一次测试过程中设置多种采样频率,可以有效利用系统有限的储存空间,减少储存芯片的数...针对储存测试系统微型化的瓶颈问题,设计了具有多采样策略的ASIC(application specific inte-grated circuit)。该芯片可以根据被测信号的变化规律在一次测试过程中设置多种采样频率,可以有效利用系统有限的储存空间,减少储存芯片的数量。多种采样频率的转换通过触发信号自动完成。采用此ASIC的测试系统不仅在体积微型化方面提供了有效的途径,还提高了ASIC的灵活性,使其具有更加广泛的应用空间。芯片进行了测试和验证,能够达到设计要求,可以进行实际应用。基于此ASIC的存储测试系统比现有存储测试系统体积减小40%～60%。展开更多
文摘For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert switch is presented to verify the reliability of the invert switch. The test system uses complex programmable logic device （CPLD） to control data acquisition of A/D converter and data storage of external flash memory, and then transmits the acquired data to a computer for data analysis and processing. The test system can provide the required sampling frequency of the signal in high temperature, normal temperature and low temperature environments, and the reliability of the invert switch can be verified according to the signal parameters. The results show that the test system has high precision and the tested invert switch has low power consumption and high reliability.
文摘Aiming at harsh environment of cluster bombs center tube explosion dispersion and difficulties in installation of traditional test systems,a storage test system based on 16-bit ultra-low power microcontroller MSP430 is designed in order to acquire gas pressure during cluster bombs dispersion.To meet the requirement of low power consumption,the working states of system＇s modules during data acquisition are elaborated and the equation to calculate the gas pressure change during cylindrical center tube opening the hatch is deduced.The field test is conducted and good test results are obtained.
文摘针对储存测试系统微型化的瓶颈问题,设计了具有多采样策略的ASIC(application specific inte-grated circuit)。该芯片可以根据被测信号的变化规律在一次测试过程中设置多种采样频率,可以有效利用系统有限的储存空间,减少储存芯片的数量。多种采样频率的转换通过触发信号自动完成。采用此ASIC的测试系统不仅在体积微型化方面提供了有效的途径,还提高了ASIC的灵活性,使其具有更加广泛的应用空间。芯片进行了测试和验证,能够达到设计要求,可以进行实际应用。基于此ASIC的存储测试系统比现有存储测试系统体积减小40%～60%。
