With the support by the National Natural Science Foundation of China,the research team led by Prof.Luo LinBao(罗林保)at the College of Electronic Sciences and Applied Physics,Hefei University of Technology,developed a...With the support by the National Natural Science Foundation of China,the research team led by Prof.Luo LinBao(罗林保)at the College of Electronic Sciences and Applied Physics,Hefei University of Technology,developed a simple and highly efficient near infrared light photodetector,which was published in Laser&Photonics Reviews(2016,10:595—602).展开更多
In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be...In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be inspected efficiently and simultaneously.Moreover,the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them.Besides,the detection and location can be implemented with a single snapshot of the plenoptic camera.Consequently,this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics,which may lead to performance degradation of optical systems.展开更多
文摘With the support by the National Natural Science Foundation of China,the research team led by Prof.Luo LinBao(罗林保)at the College of Electronic Sciences and Applied Physics,Hefei University of Technology,developed a simple and highly efficient near infrared light photodetector,which was published in Laser&Photonics Reviews(2016,10:595—602).
基金supported by the Key Scientific Equipment Develop Project of China(No.ZDYZ20132)the National“863”Program of China(Nos.G158603 and G158201)
文摘In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be inspected efficiently and simultaneously.Moreover,the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them.Besides,the detection and location can be implemented with a single snapshot of the plenoptic camera.Consequently,this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics,which may lead to performance degradation of optical systems.
