The function of solid electrolytes and the composition of solid electrolyte interphase(SEI)are highly significant for inhibiting the growth of Li dendrites.Herein,we report an in-situ interfacial passivation combined ...The function of solid electrolytes and the composition of solid electrolyte interphase(SEI)are highly significant for inhibiting the growth of Li dendrites.Herein,we report an in-situ interfacial passivation combined with self-adaptability strategy to reinforce Li_(0.33)La_(0.557)TiO_(3)(LLTO)-based solid-state batteries.Specifically,a functional SEI enriched with LiF/Li_(3)PO_(4) is formed by in-situ electrochemical conversion,which is greatly beneficial to improving interface compatibility and enhancing ion transport.While the polarized dielectric BaTiO_(3)-polyamic acid(BTO-PAA,BP)film greatly improves the Li-ion transport kinetics and homogenizes the Li deposition.As expected,the resulting electrolyte offers considerable ionic conductivity at room temperature(4.3 x 10~(-4)S cm^(-1))and appreciable electrochemical decomposition voltage(5.23 V)after electrochemical passivation.For Li-LiFePO_(4) batteries,it shows a high specific capacity of 153 mA h g^(-1)at 0.2C after 100 cycles and a long-term durability of 115 mA h g^(-1)at 1.0 C after 800 cycles.Additionally,a stable Li plating/stripping can be achieved for more than 900 h at 0.5 mA cm^(-2).The stabilization mechanisms are elucidated by ex-situ XRD,ex-situ XPS,and ex-situ FTIR techniques,and the corresponding results reveal that the interfacial passivation combined with polarization effect is an effective strategy for improving the electrochemical performance.The present study provides a deeper insight into the dynamic adjustment of electrode-electrolyte interfacial for solid-state lithium batteries.展开更多
A series of boron- and phosphorus-doped silicon wafers are used to prepare a series of doped silicon nanocrystals (nc-Si) by high-energy ball milling with carboxylic acid-terminated surface. The sizes of the nc-Si s...A series of boron- and phosphorus-doped silicon wafers are used to prepare a series of doped silicon nanocrystals (nc-Si) by high-energy ball milling with carboxylic acid-terminated surface. The sizes of the nc-Si samples are demonstrated to be 〈 S nm. The doping levels of the nc-Si are found to be nonlinearly dependent on the original doping level of the wafers by x-ray photoelectron spectroscopy measurement. It is found that the nonlinear doping process will lead to the nonlinear chemical passivation and photoluminescence (I3L) intensity evolution. The doping, chemical passivation and PL mechanisms of the doped nc-Si samples prepared by mechanochemical synthesis are analyzed in detail.展开更多
Objective The Ordos Basin located in the westem part of the North China Craton bears various energy resources such as oil, gas, coal and uranium. It is one of the richest uranium-bearing basins in China. Since the di...Objective The Ordos Basin located in the westem part of the North China Craton bears various energy resources such as oil, gas, coal and uranium. It is one of the richest uranium-bearing basins in China. Since the discovery of the large-scale Dongsheng, Hangjinqi and Daying uranium deposits in the north of the Ordos Basin, a new breakthrough of uranium exploration has been achieved in the Ningdong area (eastern Ningxia) on the western margin of the Ordos Basin (WMOB) in the past two years (Wang Feifei et al., 2017).展开更多
In this work, the wafer bowing during growth can be in-situ measured by a reflectivity mapping method in the 3×2 Thomas Swan close coupled showerhead metal organic chemical vapor deposition(MOCVD) system. The r...In this work, the wafer bowing during growth can be in-situ measured by a reflectivity mapping method in the 3×2 Thomas Swan close coupled showerhead metal organic chemical vapor deposition(MOCVD) system. The reflectivity mapping method is usually used to measure the film thickness and growth rate. The wafer bowing caused by stresses(tensile and compressive) during the epitaxial growth leads to a temperature variation at different positions on the wafer, and the lower growth temperature leads to a faster growth rate and vice versa. Therefore, the wafer bowing can be measured by analyzing the discrepancy of growth rates at different positions on the wafer. Furthermore, the wafer bowings were confirmed by the ex-situ wafer bowing measurement. High-resistivity and low-resistivity Si substrates were used for epitaxial growth. In comparison with low-resistivity Si substrate, Ga N grown on high-resistivity substrate shows a larger wafer bowing caused by the highly compressive stress introduced by compositionally graded Al Ga N buffer layer. This transition of wafer bowing can be clearly in-situ measured by using the reflectivity mapping method.展开更多
Using the langasite crystal microbalance (LCM), the trends in film thickness produced by means of the chemical vapor deposition using trichlorosilane gas, monomethylsilane gas and their mixed gas were observed at 600?...Using the langasite crystal microbalance (LCM), the trends in film thickness produced by means of the chemical vapor deposition using trichlorosilane gas, monomethylsilane gas and their mixed gas were observed at 600?C and evaluated by comparison with the information from a transmission electron microscope (TEM). The crystalline silicon film thickness from trichlorosilane gas was comparable to that of an amorphous silicon carbide film from monomethylsilane gas. The film obtained from the gas mixture was amorphous and was the thinnest in this study. Because the thickness trend obtained by the LCM agreed with that by the TEM, the LCM is shown to be a convenient evaluation tool for the behavior of various film deposition.展开更多
Electrochemical behavior of chemical mechanical polishing of copper with oxide passive film was studied by electrochemical measurement technologies. Dependences of polarization curves and electrochemical parameters, t...Electrochemical behavior of chemical mechanical polishing of copper with oxide passive film was studied by electrochemical measurement technologies. Dependences of polarization curves and electrochemical parameters, the rate of formation or removal of passive film of copper on film modifier KClO 3 were investigated. The rules of dependences of corrosion potentials and corrosion current densities on polishing pressure and rotation rate were obtained. It is discovered that the rates of formation and removal of passive film of copper are enhanced, while the polishing pressure and rotation rate are reduced. The experiments show that the CMP processes decrease Tafel slope, increase electron transfer coefficient of anode reaction and decrease the activation energy of corrosion reaction of copper, thereby the corrosion processes are accelerated. The results indicate that CMP slurry recipe, which is composed of NaAc NaOH medium, using KClO 3 as passive film modifier and nano sized γ Al 2O 3 as abrasive, is feasible and reasonable. The technological conditions are 100 r/min, 16 kPa.展开更多
This paper presents the effect of mineralization on chalcopyrite chemical leaching in very simple H2SO4 solution systems at pH 1.0, with 5 % chalcopyrite con- centrate at 65 ~C. The copper extractions after 12 days le...This paper presents the effect of mineralization on chalcopyrite chemical leaching in very simple H2SO4 solution systems at pH 1.0, with 5 % chalcopyrite con- centrate at 65 ~C. The copper extractions after 12 days leaching of marine volcanic and porphyry chalcopyrite were 85.7 and 66.6 %, respectively. It was found that sulphur element formed on the surface of two samples as a result of XRD and SEM-EDAX, which was very porous that did not inhibit chemical leaching reaction. Meanwhile, (Cu, Fe)12As4S13 formed on the surface of porphyry type chalcopyrite, which may cause low leaching ratio of por- phyry type chalcopyrite as passivation. (Cu, Fe)12As4S13 may be one kind of the polysulphide compounds.展开更多
The present research deals with the geochemical characteristics of the Holocene sediments from Alamdanga area, Chuadanga district, Bangladesh. Main goals of the study are to delineate source rock characteristics, degr...The present research deals with the geochemical characteristics of the Holocene sediments from Alamdanga area, Chuadanga district, Bangladesh. Main goals of the study are to delineate source rock characteristics, degree of chemical weathering and sorting processes and behavior of redox conditions during deposition of the sediments. Geochemical characteristics of the sediments show comparatively a wide variation in accordance with stratigraphy in their major element contents(e.g. Si O2 69.46–82.13, Al2O3 2.28–8.88 in wt%), reflecting the distinctive provenance and in part an unstable period in terms of tectonic activity. Geochemical classification of the sediments shows mostly sub-arkose with few sub-litharenites. Some major and trace elements display comprehensible correlation with Al2O3 confirming their possible hydraulic fractionation. The chemical index of alteration(CIA*), W* index, index of compositional variability(ICV), plagioclase index of alteration(PIA*) values and the ratio of Si O2/Al2O3, suggest low degrees of chemical weathering in the source areas as well as immature to moderately mature the sediments. The sediments suggest semi-arid climatic trends within oxic deltaic depositional conditions during the Holocene, at 3–12 ka. Whole rock geochemistry and discrimination diagrams demonstrate the continental signature derivatives, which might have been derived from the felsic to intermediate igneous rocks(granitic plutonic rocks) as well as from quartzose sedimentary/metamorphic provenance. These typical sources are present in a vast region of the Himalayan belt and catchment areas of Ganges. The tectonic setting of the sediments demarcates typically passive margin with slightly continental arc system.展开更多
Based on the surface passivation of n-type silicon in a silicon drift detector(SDD), we propose a new passivation structure of SiO2/Al2O3/SiO2 passivation stacks. Since the SiO2 formed by the nitric-acid-oxidation-of-...Based on the surface passivation of n-type silicon in a silicon drift detector(SDD), we propose a new passivation structure of SiO2/Al2O3/SiO2 passivation stacks. Since the SiO2 formed by the nitric-acid-oxidation-of-silicon(NAOS)method has good compactness and simple process, the first layer film is formed by the NAOS method. The Al2O3 film is also introduced into the passivation stacks owing to exceptional advantages such as good interface characteristic and simple process. In addition, for requirements of thickness and deposition temperature, the third layer of the SiO2 film is deposited by plasma enhanced chemical vapor deposition(PECVD). The deposition of the SiO2 film by PECVD is a low-temperature process and has a high deposition rate, which causes little damage to the device and makes the SiO2 film very suitable for serving as the third passivation layer. The passivation approach of stacks can saturate dangling bonds at the interface between stacks and the silicon substrate, and provide positive charge to optimize the field passivation of the n-type substrate.The passivation method ultimately achieves a good combination of chemical and field passivations. Experimental results show that with the passivation structure of SiO2/Al2O3/SiO2, the final minority carrier lifetime reaches 5223 μs at injection of 5×10^(15) cm^(-3). When it is applied to the passivation of SDD, the leakage current is reduced to the order of nA.展开更多
Polar promotors have been proven effective in catalyzing the polysulfide(PS)reduction reaction(PSRR)process in lithium-sulfur(Li-S)batteries.However,the promotor surface tends to be poisoned due to the accumulation of...Polar promotors have been proven effective in catalyzing the polysulfide(PS)reduction reaction(PSRR)process in lithium-sulfur(Li-S)batteries.However,the promotor surface tends to be poisoned due to the accumulation of insoluble discharging products of lithium disulfide(Li_(2)S_(2))and lithium sulfide(Li_(2)S)during Li-S battery operation.Herein,we investigate the detailed PSRR mechanism on the surface of manganese sulfides(MnS)as a representative promoter by performing in-situ Raman mapping measurements.The catalytic ability of MnS enables thorough electrochemical reduction of PSs to Li_(2)S_(2) and Li_(2)S on the MnS surface.The generated Li_(2)S_(2) and Li_(2)S then adsorb the dissolved PSs via chemical reactions among sulfur species during the subsequent PSRR process.This phenomenon mitigates promotor poisoning and continuously improves the reversible capacity.Consequently,the assembled Li-S cell demonstrates excellent electrochemical performance after introducing a conductive interlayer containing a thin piece of carbon nanotube film and MnS promotors.展开更多
The performance of red InP and blue ZnTeSe-based quantum dots(QDs)and corresponding QD light emitting diodes(QLEDs)has already been improved significantly,whose external quantum efficiencies(EQEs)and luminances have e...The performance of red InP and blue ZnTeSe-based quantum dots(QDs)and corresponding QD light emitting diodes(QLEDs)has already been improved significantly,whose external quantum efficiencies(EQEs)and luminances have exceeded 20%and 80000 cd m-2,respectively.However,the inferior performance of the green InP-based device hinders the commercialization of full-color Cd-free QLED technology.The ease of oxidation of the highly reactive InP cores leads to high non-radiative recombination and poor photoluminescence quantum yield(PL QY)of the InP-based core/shell QDs,limiting the performance of the relevant QLEDs.Here,we proposed a fluoride-free synthesis strategy to in-situ passivate the InP cores,in which zinc myristate reacted with phosphine dangling bonds to form Zn–P protective layer and protect InP cores from the water and oxygen in the environment.The resultant InP/ZnSe/ZnS core/shell QDs demonstrated a high PL QY of 91%.The corresponding green-emitting electroluminescence devices exhibited a maximum EQE of 12.74%,along with a luminance of over 175000 cd m^(-2)and a long T50@100 cd m^(-2)lifetime of over 20000 h.展开更多
Organic-inorganic metal halide perovskite solar cells have achieved high efficiency of 25.5%.Finding an effective means to suppress the formation of traps and correlate stability losses are thought to be a promising r...Organic-inorganic metal halide perovskite solar cells have achieved high efficiency of 25.5%.Finding an effective means to suppress the formation of traps and correlate stability losses are thought to be a promising route for further increasing the photovoltaic performance and commercialization potential of perovskite photovoltaic devices.Herein,we report a facile passivation model,which uses a multi-functional organic molecule to simultaneously realize the chemical passivation and field-effect passivation for the perovskite film by an upgraded anti-solvent coating method,which reduces the trap states density of the perovskite,improves interface charge transfer,and thus promotes device performance.In addition,the hydrophobic groups of the molecules can form a moisture-repelling barrier on the perovskite grains,which apparently promotes the humidity stability of the solar cells.Therefore,the optimal power conversion efficiency(PCE)of perovskite solar cells after synergistic passivation reaches 21.52%,and it can still retain 95%of the original PCE when stored in-40%humidity for 30 days.Our findings extend the scope for traps passivation to further promote both the photovoltaic performance and the stability of the perovskite solar cells.展开更多
Using PTFE as a chemical modifier, a method for the determination of trace impurities in high purity Nd_2O_3 by in-situ separation and electrothermal vaporization-inductively coupled plasma-atomic emission spectrometr...Using PTFE as a chemical modifier, a method for the determination of trace impurities in high purity Nd_2O_3 by in-situ separation and electrothermal vaporization-inductively coupled plasma-atomic emission spectrometry (ETV-ICP-AES) was developed. The analyte-matrix separation and the temperature program of graphite furnace were investigated and optimized. The solid samples were directly introduced into graphite furnace in the form of slurry, where selective volatilization between the matrix and the analytes took place. The Nd matrix was retained in the graphite furnace during the evaporation step, while the trace analyte impurities were vaporized and removed. As a result, the matrix interference that is serious without the modifier is suppressed effectively. The achievable detection limits are (μg·g^(-1)): Ti 0.15, Mn 0.15, Ni 0.20, Co 0.54, respectively. The proposed method was applied to direct determination of trace impurities in high purity Nd_2O_3 with satisfactory results.展开更多
Ultrasonic-assisted chemical mechanical polishing(UA-CMP)can greatly improve the sapphire material removal and surface quality,but its polishing mechanism is still unclear.This paper proposed a novel model of material...Ultrasonic-assisted chemical mechanical polishing(UA-CMP)can greatly improve the sapphire material removal and surface quality,but its polishing mechanism is still unclear.This paper proposed a novel model of material removal rate(MRR)to explore the mechanism of sapphire UA-CMP.It contains two modes,namely two-body wear and abrasive-impact.Furthermore,the atomic force microscopy(AFM)in-situ study,computational fluid dynamics(CFD)simulation,and polishing experiments were conducted to verify the model and reveal the polishing mechanism.In the AFM in-situ studies,the tip scratched the reaction layer on the sapphire surface.The pit with a 0.22 nm depth is the evidence of two-body wear.The CFD simulation showed that abrasives could be driven by the ultrasonic vibration to impact the sapphire surface at high frequencies.The maximum total velocity and the air volume fraction(AVF)in the central area increased from 0.26 to 0.55 m/s and 20%to 49%,respectively,with the rising amplitudes of 1–3μm.However,the maximum total velocity rose slightly from 0.33 to 0.42 m/s,and the AVF was nearly unchanged under 40–80 r/min.It indicated that the ultrasonic energy has great effects on the abrasive-impact mode.The UA-CMP experimental results exhibited that there was 63.7%improvement in MRR when the polishing velocities rose from 40 to 80 r/min.The roughness of the polished sapphire surface was R_(a)=0.07 nm.It identified that the higher speed achieved greater MRR mainly through the two-body wear mode.This study is beneficial to further understanding the UA-CMP mechanism and promoting the development of UA-CMP technology.展开更多
基金financially supported by the National Natural Science Foundation of China (51971080)the Shenzhen Bureau of Science,Technology and Innovation Commission (GXWD20201230155427003-20200730151200003 and JSGG20200914113601003)。
文摘The function of solid electrolytes and the composition of solid electrolyte interphase(SEI)are highly significant for inhibiting the growth of Li dendrites.Herein,we report an in-situ interfacial passivation combined with self-adaptability strategy to reinforce Li_(0.33)La_(0.557)TiO_(3)(LLTO)-based solid-state batteries.Specifically,a functional SEI enriched with LiF/Li_(3)PO_(4) is formed by in-situ electrochemical conversion,which is greatly beneficial to improving interface compatibility and enhancing ion transport.While the polarized dielectric BaTiO_(3)-polyamic acid(BTO-PAA,BP)film greatly improves the Li-ion transport kinetics and homogenizes the Li deposition.As expected,the resulting electrolyte offers considerable ionic conductivity at room temperature(4.3 x 10~(-4)S cm^(-1))and appreciable electrochemical decomposition voltage(5.23 V)after electrochemical passivation.For Li-LiFePO_(4) batteries,it shows a high specific capacity of 153 mA h g^(-1)at 0.2C after 100 cycles and a long-term durability of 115 mA h g^(-1)at 1.0 C after 800 cycles.Additionally,a stable Li plating/stripping can be achieved for more than 900 h at 0.5 mA cm^(-2).The stabilization mechanisms are elucidated by ex-situ XRD,ex-situ XPS,and ex-situ FTIR techniques,and the corresponding results reveal that the interfacial passivation combined with polarization effect is an effective strategy for improving the electrochemical performance.The present study provides a deeper insight into the dynamic adjustment of electrode-electrolyte interfacial for solid-state lithium batteries.
基金Supported by the National Natural Science Foundation of China under Grant No 61575216
文摘A series of boron- and phosphorus-doped silicon wafers are used to prepare a series of doped silicon nanocrystals (nc-Si) by high-energy ball milling with carboxylic acid-terminated surface. The sizes of the nc-Si samples are demonstrated to be 〈 S nm. The doping levels of the nc-Si are found to be nonlinearly dependent on the original doping level of the wafers by x-ray photoelectron spectroscopy measurement. It is found that the nonlinear doping process will lead to the nonlinear chemical passivation and photoluminescence (I3L) intensity evolution. The doping, chemical passivation and PL mechanisms of the doped nc-Si samples prepared by mechanochemical synthesis are analyzed in detail.
基金This work was supported by the National Natural Science Foundation of China(grant No.41330315)China geological survey(grant No.12120114009201)
文摘Objective The Ordos Basin located in the westem part of the North China Craton bears various energy resources such as oil, gas, coal and uranium. It is one of the richest uranium-bearing basins in China. Since the discovery of the large-scale Dongsheng, Hangjinqi and Daying uranium deposits in the north of the Ordos Basin, a new breakthrough of uranium exploration has been achieved in the Ningdong area (eastern Ningxia) on the western margin of the Ordos Basin (WMOB) in the past two years (Wang Feifei et al., 2017).
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61274039 and 51177175)the National Basic Research Program of China(Grant No.2011CB301903)+5 种基金the Ph.D.Programs Foundation of Ministry of Education of China(Grant No.20110171110021)the International Science and Technology Collaboration Program of China(Grant No.2012DFG52260)the International Science and Technology Collaboration Program of Guangdong Province,China(Grant No.2013B051000041)the Science and Technology Plan of Guangdong Province,China(Grant No.2013B010401013)the National High Technology Research and Development Program of China(Grant No.2014AA032606)the Opened Fund of the State Key Laboratory on Integrated Optoelectronics,China(Grant No.IOSKL2014KF17)
文摘In this work, the wafer bowing during growth can be in-situ measured by a reflectivity mapping method in the 3×2 Thomas Swan close coupled showerhead metal organic chemical vapor deposition(MOCVD) system. The reflectivity mapping method is usually used to measure the film thickness and growth rate. The wafer bowing caused by stresses(tensile and compressive) during the epitaxial growth leads to a temperature variation at different positions on the wafer, and the lower growth temperature leads to a faster growth rate and vice versa. Therefore, the wafer bowing can be measured by analyzing the discrepancy of growth rates at different positions on the wafer. Furthermore, the wafer bowings were confirmed by the ex-situ wafer bowing measurement. High-resistivity and low-resistivity Si substrates were used for epitaxial growth. In comparison with low-resistivity Si substrate, Ga N grown on high-resistivity substrate shows a larger wafer bowing caused by the highly compressive stress introduced by compositionally graded Al Ga N buffer layer. This transition of wafer bowing can be clearly in-situ measured by using the reflectivity mapping method.
文摘Using the langasite crystal microbalance (LCM), the trends in film thickness produced by means of the chemical vapor deposition using trichlorosilane gas, monomethylsilane gas and their mixed gas were observed at 600?C and evaluated by comparison with the information from a transmission electron microscope (TEM). The crystalline silicon film thickness from trichlorosilane gas was comparable to that of an amorphous silicon carbide film from monomethylsilane gas. The film obtained from the gas mixture was amorphous and was the thinnest in this study. Because the thickness trend obtained by the LCM agreed with that by the TEM, the LCM is shown to be a convenient evaluation tool for the behavior of various film deposition.
文摘Electrochemical behavior of chemical mechanical polishing of copper with oxide passive film was studied by electrochemical measurement technologies. Dependences of polarization curves and electrochemical parameters, the rate of formation or removal of passive film of copper on film modifier KClO 3 were investigated. The rules of dependences of corrosion potentials and corrosion current densities on polishing pressure and rotation rate were obtained. It is discovered that the rates of formation and removal of passive film of copper are enhanced, while the polishing pressure and rotation rate are reduced. The experiments show that the CMP processes decrease Tafel slope, increase electron transfer coefficient of anode reaction and decrease the activation energy of corrosion reaction of copper, thereby the corrosion processes are accelerated. The results indicate that CMP slurry recipe, which is composed of NaAc NaOH medium, using KClO 3 as passive film modifier and nano sized γ Al 2O 3 as abrasive, is feasible and reasonable. The technological conditions are 100 r/min, 16 kPa.
基金financially supported by the National Natural Science Foundation of China(No.50934002)the National Basic Research Program of China(No.2010CB630905)the National High Technology Research and Development Program of China(No.2012AA061502)
文摘This paper presents the effect of mineralization on chalcopyrite chemical leaching in very simple H2SO4 solution systems at pH 1.0, with 5 % chalcopyrite con- centrate at 65 ~C. The copper extractions after 12 days leaching of marine volcanic and porphyry chalcopyrite were 85.7 and 66.6 %, respectively. It was found that sulphur element formed on the surface of two samples as a result of XRD and SEM-EDAX, which was very porous that did not inhibit chemical leaching reaction. Meanwhile, (Cu, Fe)12As4S13 formed on the surface of porphyry type chalcopyrite, which may cause low leaching ratio of por- phyry type chalcopyrite as passivation. (Cu, Fe)12As4S13 may be one kind of the polysulphide compounds.
文摘The present research deals with the geochemical characteristics of the Holocene sediments from Alamdanga area, Chuadanga district, Bangladesh. Main goals of the study are to delineate source rock characteristics, degree of chemical weathering and sorting processes and behavior of redox conditions during deposition of the sediments. Geochemical characteristics of the sediments show comparatively a wide variation in accordance with stratigraphy in their major element contents(e.g. Si O2 69.46–82.13, Al2O3 2.28–8.88 in wt%), reflecting the distinctive provenance and in part an unstable period in terms of tectonic activity. Geochemical classification of the sediments shows mostly sub-arkose with few sub-litharenites. Some major and trace elements display comprehensible correlation with Al2O3 confirming their possible hydraulic fractionation. The chemical index of alteration(CIA*), W* index, index of compositional variability(ICV), plagioclase index of alteration(PIA*) values and the ratio of Si O2/Al2O3, suggest low degrees of chemical weathering in the source areas as well as immature to moderately mature the sediments. The sediments suggest semi-arid climatic trends within oxic deltaic depositional conditions during the Holocene, at 3–12 ka. Whole rock geochemistry and discrimination diagrams demonstrate the continental signature derivatives, which might have been derived from the felsic to intermediate igneous rocks(granitic plutonic rocks) as well as from quartzose sedimentary/metamorphic provenance. These typical sources are present in a vast region of the Himalayan belt and catchment areas of Ganges. The tectonic setting of the sediments demarcates typically passive margin with slightly continental arc system.
基金Project supported by the National Natural Science Foundation of China(Grant Nos.51602340,51702355,and 61674167)the Natural Science Foundation of Beijing Municipality of China(Grant No.4192064)+1 种基金the National Key Research Program of China(Grant Nos.2018YFB1500500 and 2018YFB1500200)the JKW Project of China(Grant No.31512060106)。
文摘Based on the surface passivation of n-type silicon in a silicon drift detector(SDD), we propose a new passivation structure of SiO2/Al2O3/SiO2 passivation stacks. Since the SiO2 formed by the nitric-acid-oxidation-of-silicon(NAOS)method has good compactness and simple process, the first layer film is formed by the NAOS method. The Al2O3 film is also introduced into the passivation stacks owing to exceptional advantages such as good interface characteristic and simple process. In addition, for requirements of thickness and deposition temperature, the third layer of the SiO2 film is deposited by plasma enhanced chemical vapor deposition(PECVD). The deposition of the SiO2 film by PECVD is a low-temperature process and has a high deposition rate, which causes little damage to the device and makes the SiO2 film very suitable for serving as the third passivation layer. The passivation approach of stacks can saturate dangling bonds at the interface between stacks and the silicon substrate, and provide positive charge to optimize the field passivation of the n-type substrate.The passivation method ultimately achieves a good combination of chemical and field passivations. Experimental results show that with the passivation structure of SiO2/Al2O3/SiO2, the final minority carrier lifetime reaches 5223 μs at injection of 5×10^(15) cm^(-3). When it is applied to the passivation of SDD, the leakage current is reduced to the order of nA.
基金supported by the National Basic Research Program of China(2019YFA0705702)the National Natural Science Foundation of China(51872158).H.T.Liu acknowledges funding from the National Natural Science Foundation of China(No.11734013,11874089).
文摘Polar promotors have been proven effective in catalyzing the polysulfide(PS)reduction reaction(PSRR)process in lithium-sulfur(Li-S)batteries.However,the promotor surface tends to be poisoned due to the accumulation of insoluble discharging products of lithium disulfide(Li_(2)S_(2))and lithium sulfide(Li_(2)S)during Li-S battery operation.Herein,we investigate the detailed PSRR mechanism on the surface of manganese sulfides(MnS)as a representative promoter by performing in-situ Raman mapping measurements.The catalytic ability of MnS enables thorough electrochemical reduction of PSs to Li_(2)S_(2) and Li_(2)S on the MnS surface.The generated Li_(2)S_(2) and Li_(2)S then adsorb the dissolved PSs via chemical reactions among sulfur species during the subsequent PSRR process.This phenomenon mitigates promotor poisoning and continuously improves the reversible capacity.Consequently,the assembled Li-S cell demonstrates excellent electrochemical performance after introducing a conductive interlayer containing a thin piece of carbon nanotube film and MnS promotors.
基金the National Natural Science Foundation of China(Grant Nos.62204078 and U22A2072)the Natural Science Foundation of Henan Province for Excellent Youth Scholar(Grant No.232300421092).
文摘The performance of red InP and blue ZnTeSe-based quantum dots(QDs)and corresponding QD light emitting diodes(QLEDs)has already been improved significantly,whose external quantum efficiencies(EQEs)and luminances have exceeded 20%and 80000 cd m-2,respectively.However,the inferior performance of the green InP-based device hinders the commercialization of full-color Cd-free QLED technology.The ease of oxidation of the highly reactive InP cores leads to high non-radiative recombination and poor photoluminescence quantum yield(PL QY)of the InP-based core/shell QDs,limiting the performance of the relevant QLEDs.Here,we proposed a fluoride-free synthesis strategy to in-situ passivate the InP cores,in which zinc myristate reacted with phosphine dangling bonds to form Zn–P protective layer and protect InP cores from the water and oxygen in the environment.The resultant InP/ZnSe/ZnS core/shell QDs demonstrated a high PL QY of 91%.The corresponding green-emitting electroluminescence devices exhibited a maximum EQE of 12.74%,along with a luminance of over 175000 cd m^(-2)and a long T50@100 cd m^(-2)lifetime of over 20000 h.
基金support from the National Natural Science Foundation of China(Nos.61775081,11904127,22075101,61904066,61705020)Program for the Development of Science and Technology of Jilin Province(Nos.20200801032GH and 20190103002JH)+2 种基金the Thirteenth Five-Year Program for Science and Technology of Education Department of Jilin Province(Nos.JJKH20200417KJ)Special Project of Industrial Technology Research and Development in Jilin Province(No.2019C042-2)Construction Program for Innovation Research Team of Jilin Normal University(No.201703).
文摘Organic-inorganic metal halide perovskite solar cells have achieved high efficiency of 25.5%.Finding an effective means to suppress the formation of traps and correlate stability losses are thought to be a promising route for further increasing the photovoltaic performance and commercialization potential of perovskite photovoltaic devices.Herein,we report a facile passivation model,which uses a multi-functional organic molecule to simultaneously realize the chemical passivation and field-effect passivation for the perovskite film by an upgraded anti-solvent coating method,which reduces the trap states density of the perovskite,improves interface charge transfer,and thus promotes device performance.In addition,the hydrophobic groups of the molecules can form a moisture-repelling barrier on the perovskite grains,which apparently promotes the humidity stability of the solar cells.Therefore,the optimal power conversion efficiency(PCE)of perovskite solar cells after synergistic passivation reaches 21.52%,and it can still retain 95%of the original PCE when stored in-40%humidity for 30 days.Our findings extend the scope for traps passivation to further promote both the photovoltaic performance and the stability of the perovskite solar cells.
文摘Using PTFE as a chemical modifier, a method for the determination of trace impurities in high purity Nd_2O_3 by in-situ separation and electrothermal vaporization-inductively coupled plasma-atomic emission spectrometry (ETV-ICP-AES) was developed. The analyte-matrix separation and the temperature program of graphite furnace were investigated and optimized. The solid samples were directly introduced into graphite furnace in the form of slurry, where selective volatilization between the matrix and the analytes took place. The Nd matrix was retained in the graphite furnace during the evaporation step, while the trace analyte impurities were vaporized and removed. As a result, the matrix interference that is serious without the modifier is suppressed effectively. The achievable detection limits are (μg·g^(-1)): Ti 0.15, Mn 0.15, Ni 0.20, Co 0.54, respectively. The proposed method was applied to direct determination of trace impurities in high purity Nd_2O_3 with satisfactory results.
基金This work was supported by the National Natural Science Foundation of China(Nos.51865030 and 52165025).
文摘Ultrasonic-assisted chemical mechanical polishing(UA-CMP)can greatly improve the sapphire material removal and surface quality,but its polishing mechanism is still unclear.This paper proposed a novel model of material removal rate(MRR)to explore the mechanism of sapphire UA-CMP.It contains two modes,namely two-body wear and abrasive-impact.Furthermore,the atomic force microscopy(AFM)in-situ study,computational fluid dynamics(CFD)simulation,and polishing experiments were conducted to verify the model and reveal the polishing mechanism.In the AFM in-situ studies,the tip scratched the reaction layer on the sapphire surface.The pit with a 0.22 nm depth is the evidence of two-body wear.The CFD simulation showed that abrasives could be driven by the ultrasonic vibration to impact the sapphire surface at high frequencies.The maximum total velocity and the air volume fraction(AVF)in the central area increased from 0.26 to 0.55 m/s and 20%to 49%,respectively,with the rising amplitudes of 1–3μm.However,the maximum total velocity rose slightly from 0.33 to 0.42 m/s,and the AVF was nearly unchanged under 40–80 r/min.It indicated that the ultrasonic energy has great effects on the abrasive-impact mode.The UA-CMP experimental results exhibited that there was 63.7%improvement in MRR when the polishing velocities rose from 40 to 80 r/min.The roughness of the polished sapphire surface was R_(a)=0.07 nm.It identified that the higher speed achieved greater MRR mainly through the two-body wear mode.This study is beneficial to further understanding the UA-CMP mechanism and promoting the development of UA-CMP technology.