A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multi...A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.展开更多
Recently,the Darna distribution has been introduced as a new lifetime distribution.The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or a...Recently,the Darna distribution has been introduced as a new lifetime distribution.The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements,such as reliability or the minimum lifetime.In this article,an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the Darna distribution.The plan parameters,including the sample size,the acceptance number,and the past lot result of the proposed sampling plan,are determined with the help of the two-point approach considering the acceptable quality level(AQL)and the limiting quality level(LQL).The plan parameters and the corresponding operating characteristic functions of a new plan are provided in tabular form for various Darna distribution parameters.Also,a few illustrated examples are presented for various distribution parameters.The usefulness of the proposed attribute modified chain sampling plan is investigated using two real failure time datasets.The results indicate that the proposed sampling plan can reduce the sample size when the termination ratio increases for fixed values of the producer’s risk and acceptance number.Hence,the proposed attribute modified chain sampling inspection plan is recommended to practitioners in the field.展开更多
基金This research was supported by The Science,Research and Innovation Promotion Funding(TSRI)(Grant No.FRB650070/0168)This research block grants was managed under Rajamangala University of Technology Thanyaburi(FRB65E0634M.3).
文摘A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.
基金A.R.A.Alanzi would like to thank the Deanship of Scientific Research at Majmaah University for financial support and encouragement.
文摘Recently,the Darna distribution has been introduced as a new lifetime distribution.The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements,such as reliability or the minimum lifetime.In this article,an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the Darna distribution.The plan parameters,including the sample size,the acceptance number,and the past lot result of the proposed sampling plan,are determined with the help of the two-point approach considering the acceptable quality level(AQL)and the limiting quality level(LQL).The plan parameters and the corresponding operating characteristic functions of a new plan are provided in tabular form for various Darna distribution parameters.Also,a few illustrated examples are presented for various distribution parameters.The usefulness of the proposed attribute modified chain sampling plan is investigated using two real failure time datasets.The results indicate that the proposed sampling plan can reduce the sample size when the termination ratio increases for fixed values of the producer’s risk and acceptance number.Hence,the proposed attribute modified chain sampling inspection plan is recommended to practitioners in the field.
