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Variation regularity of metal magnetic memory signals with inspecting time-interval and location
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作者 严春妍 李午申 +3 位作者 邸新杰 薛振奎 白世武 刘方明 《Journal of Central South University of Technology》 EI 2007年第3期319-323,共5页
Influences of inspecting time-interval and location on varying behavior of metal magnetic memory (MMM) signals of defects were studied. Different areas in two precracked weldments were inspected at different time-inte... Influences of inspecting time-interval and location on varying behavior of metal magnetic memory (MMM) signals of defects were studied. Different areas in two precracked weldments were inspected at different time-intervals by type TSC-1M-4 stress-concentration magnetic inspector to obtain MMM signals. Mechanisms of MMM signals varying behavior with inspecting time and space were analyzed and discussed respectively. It is found that MMM signals don't change with inspecting time-interval, since stress field and magnetic leakage field maintain unchanged at any time after welding. On the other hand, MMM signals differ greatly for different inspecting locations, because stress field and magnetic leakage field are unevenly distributed in defective ferromagnetic materials. 展开更多
关键词 nondestructive testing metal magnetic memory inspecting interval inspecting location
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Optic flaws detection and location based on a plenoptic camera
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作者 栾银森 许冰 +1 位作者 杨平 汤国茂 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第4期34-38,共5页
In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be... In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be inspected efficiently and simultaneously.Moreover,the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them.Besides,the detection and location can be implemented with a single snapshot of the plenoptic camera.Consequently,this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics,which may lead to performance degradation of optical systems. 展开更多
关键词 camera inspection optics detecting pixel opportunity mirrors locating illumination remove
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