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Quasi-two-dimensional threshold voltage model for junctionless cylindrical surrounding gate metal-oxide-semiconductor field-effect transistor with dual-material gate 被引量:3
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作者 李聪 庄奕琪 +1 位作者 张丽 靳刚 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第1期494-499,共6页
Based on the quasi-two-dimensional (2D) solution of Poisson's equation in two continuous channel regions, an an- alytical threshold voltage model for short-channel junctionless dual-material cylindrical surrounding... Based on the quasi-two-dimensional (2D) solution of Poisson's equation in two continuous channel regions, an an- alytical threshold voltage model for short-channel junctionless dual-material cylindrical surrounding-gate (JLDMCSG) metal-oxide-semiconductor field-effect transistor (MOSFET) is developed. Using the derived model, channel potential dis- tribu6o~, h~riz~atal electrical ~eld distributign, a~d threshold v~ltage roll-off of ~LDMCSG MOSFET are in,instigated. Compared with junctionless single-material CSG (JLSGCSG) MOSFET~ JLDMCSG MOSFET can effectively suppress short-channel effects and simultaneously improve carrier transport efficiency. It is also revealed that threshold voltage roll- off of JLDMCSG can be significantly reduced by adopting both a small oxide thickness and a small silicon channel radius. The model is verified by comparing its calculated results with that obtained from three-dimensional (3D) numerical device simulator ISE. 展开更多
关键词 junctionless device surrounding-gate MOSFET dual-material gate analytical model
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