Revealing grains and very fine dendrites in a solidified weld metal of aluminum–magnesium–silicon alloys is difficult and thus,there is no evidence to validate the micro-and meso-scale physical models for hot cracks...Revealing grains and very fine dendrites in a solidified weld metal of aluminum–magnesium–silicon alloys is difficult and thus,there is no evidence to validate the micro-and meso-scale physical models for hot cracks. In this research, the effect of preheating on the microstructure and hot crack creation in the pulsed laser welding of AA 6061 was investigated by an optical microscope and field emission electron microscopy. Etching was carried out in the gas phase using fresh Keller’s reagent for 600 s. The results showed that the grain size of the weld metal was proportional to the grain size of the base metal and was independent of the preheating temperature. Hot cracks passed the grain boundaries of the weld and the base metal. Lower solidification rates in the preheated samples led to coarser arm spacing;therefore, a lower cooling rate. Despite the results predicted by the micro and meso-scale models, lower cooling rates resulted in increased hot cracks. The cracks could grow in the weld metal after solidification;therefore, hot cracks were larger than predicted by the hot crack prediction models.展开更多
The polarization effect introduced by electric field deformation is the most important bottleneck of CdZnTe detector in x-ray imaging. Currently, most of studies focus on electric field deformation caused by trapped c...The polarization effect introduced by electric field deformation is the most important bottleneck of CdZnTe detector in x-ray imaging. Currently, most of studies focus on electric field deformation caused by trapped carriers;the perturbation of electric field due to drifting carriers has been rarely reported. In this study, the effect of transient space-charge perturbation on carrier transport in a CdZnTe semiconductor is evaluated by using the laser-beam-induced current(LBIC) technique.Cusps appear in the current curves of CdZnTe detectors with different carrier transport performances under intense excitation, indicating the deformation of electric field. The current signals under different excitations are compared. The results suggest that with the increase of excitation, the amplitude of cusp increases and the electron transient time gradually decreases. The distortion in electric field is independent of carrier transport performance of detector. Transient space-charge perturbation is responsible for the pulse shape and affects the carrier transport process.展开更多
基金The authors would like to thank the metallography laboratory personnel of University of Tehran for their cooperation.
文摘Revealing grains and very fine dendrites in a solidified weld metal of aluminum–magnesium–silicon alloys is difficult and thus,there is no evidence to validate the micro-and meso-scale physical models for hot cracks. In this research, the effect of preheating on the microstructure and hot crack creation in the pulsed laser welding of AA 6061 was investigated by an optical microscope and field emission electron microscopy. Etching was carried out in the gas phase using fresh Keller’s reagent for 600 s. The results showed that the grain size of the weld metal was proportional to the grain size of the base metal and was independent of the preheating temperature. Hot cracks passed the grain boundaries of the weld and the base metal. Lower solidification rates in the preheated samples led to coarser arm spacing;therefore, a lower cooling rate. Despite the results predicted by the micro and meso-scale models, lower cooling rates resulted in increased hot cracks. The cracks could grow in the weld metal after solidification;therefore, hot cracks were larger than predicted by the hot crack prediction models.
基金Project supported by the National Natural Science Foundation of China(Grant No.61874089)the Fund of MIIT(Grant No.MJ-2017-F-05)+2 种基金the 111 Project of China(Grant No.B08040)the NPU Foundation for Fundamental Research,Chinathe Research Found of the State Key Laboratory of Solidification Processing(NWPU),China
文摘The polarization effect introduced by electric field deformation is the most important bottleneck of CdZnTe detector in x-ray imaging. Currently, most of studies focus on electric field deformation caused by trapped carriers;the perturbation of electric field due to drifting carriers has been rarely reported. In this study, the effect of transient space-charge perturbation on carrier transport in a CdZnTe semiconductor is evaluated by using the laser-beam-induced current(LBIC) technique.Cusps appear in the current curves of CdZnTe detectors with different carrier transport performances under intense excitation, indicating the deformation of electric field. The current signals under different excitations are compared. The results suggest that with the increase of excitation, the amplitude of cusp increases and the electron transient time gradually decreases. The distortion in electric field is independent of carrier transport performance of detector. Transient space-charge perturbation is responsible for the pulse shape and affects the carrier transport process.
