Acceptance Sampling Plans with Truncated Life Tests for the Length-Biased Weighted Lomax Distribution

In this paper,we considered the Length-biased weighted Lomax distribution and constructed new acceptance sampling plans(ASPs)where the life test is assumed to be truncated at a pre-assigned time.For the new suggested ASPs,the tables of the minimum samples sizes needed to assert a specific mean life of the test units are obtained.In addition,the values of the corresponding operating characteristic function and the associated producer’s risks are calculated.Analyses of two real data sets are presented to investigate the applicability of the proposed acceptance sampling plans;one data set contains the first failure of 20 small electric carts,and the other data set contains the failure times of the air conditioning system of an airplane.Comparisons are made between the proposed acceptance sampling plans and some existing acceptance sampling plans considered in this study based on the minimum sample sizes.It is observed that the samples sizes based on the proposed acceptance sampling plans are less than their competitors considered in this study.The suggested acceptance sampling plans are recommended for practitioners in the field.

Constant Stress Accelerated Life Tests for Vacuum Fluorescent Display Based on Least Square Method

To estimate the life of vacuum fluorescent display （VFD） more accurately and reduce test time and cost, four constant stress accelerated life tests （CSALTs） were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method （LSM） to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month.

A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

The design of a new adaptive version of the multiple dependent state(AMDS)sampling plan is presented based on the time truncated life test under the Weibull distribution.We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans.A warning sign for acceptance number was proposed to increase the probability of current lot acceptance.The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk.A simulation study was presented to support the proposed sampling plan.A comparison between the proposed and existing sampling plans,namely multiple dependent state(MDS)sampling plans and a modified multiple dependent state(MMDS)sampling plan,was considered under the average sampling number and operating characteristic curve values.In addition,the use of two real datasets demonstrated the practicality and usefulness of the proposed sampling plan.The results indicated that the proposed plan is more flexible and efficient in terms of the average sample number compared to the existing MDS and MMDS sampling plans.

Bayesian Analysis in Partially Accelerated Life Tests for Weighted Lomax Distribution

Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress,such as pressure,temperature,vibration,voltage,or load to induce early failures.In this paper,a step stress partially accelerated life test(SSPALT)is regarded under the progressive type-II censored data with random removals.The removals from the test are considered to have the binomial distribution.The life times of the testing items are assumed to follow lengthbiased weighted Lomax distribution.The maximum likelihood method is used for estimating the model parameters of length-biased weighted Lomax.The asymptotic confidence interval estimates of the model parameters are evaluated using the Fisher information matrix.The Bayesian estimators cannot be obtained in the explicit form,so the Markov chain Monte Carlo method is employed to address this problem,which ensures both obtaining the Bayesian estimates as well as constructing the credible interval of the involved parameters.The precision of the Bayesian estimates and the maximum likelihood estimates are compared by simulations.In addition,to compare the performance of the considered confidence intervals for different parameter values and sample sizes.The Bootstrap confidence intervals give more accurate results than the approximate confidence intervals since the lengths of the former are less than the lengths of latter,for different sample sizes,observed failures,and censoring schemes,in most cases.Also,the percentile Bootstrap confidence intervals give more accurate results than Bootstrap-t since the lengths of the former are less than the lengths of latter for different sample sizes,observed failures,and censoring schemes,in most cases.Further performance comparison is conducted by the experiments with real data.

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.

Empirical Approach for Planning and Designing Constant Stress Accelerated Life Tests

Accelerated life testing(ALT)has been widely used to obtain information about the product's life characteristics at normal conditions in a relatively short period of time.Two key issues with ALT are test design and data analysis.The test design of constant stress ALT was studied in this paper.The test design usually combines engineering experiences with optimization models.Such approaches are hard to be implemented by practitioners.A"pure"empirical approach was presented to address this issue.With the proposed approach,some of the decision variables are determined based on the results from the literature,some of the other variables are determined based on engineering analysis and /or judgment,and the remaining variables are determined based on the empirical relations developed in this paper.A real-world example is included to illustrate the appropriateness of the proposed approach.

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

The failure mechanism stimulated by accelerated stress in the degradation may be different from that under normal conditions, which would lead to invalid accelerated life tests. To solve the problem, we study the re- lation between the Arrhenius equation and the lognormal distribution in the degradation process. Two relationships of the lognormal distribution parameters must be satisfied in the conclusion of the unaltered failure mechanism, the first is that the logarithmic standard deviations must be equivalent at different temperature levels, and the second is that the ratio of the differences between logarithmic means must be equal to the ratio of the differences between reciprocals of temperature. The logarithm of distribution lines must simultaneously have the same slope and regular interval lines. We studied the degradation of thick-film resistors in MCM by accelerated stress at four temperature levels （390, 400, 410 and 420 K）, and the result agreed well with our method.

Analysis and Optimum Plan for 3-Step Step-Stress Accelerated Life Tests with Lomax Model Under Progressive Type-I Censoring

Inthispaper,theoptimumtestplanandparameterestimationfor3-stepstep-stress accelerated life tests in the presence of modified progressive Type-I censoring are discussed.It is assumed that the lifetime of test units follows a Lomax distribution with log of characteristic life being quadratic function of stress level.The maximum likelihood and Bayesian method are used to obtain the point and interval estimators of the model parameters.The Bayes estimates are obtained using Markov chain Monte Carlo simulation based on Gibbs sampling.The optimum plan for 3-step step-stress test under modified progressive Type-I censoring is developed which minimizes the asymptotic variance of the maximum likelihood estimators of log of scale parameter at design stress.Finally,the numerical study with sensitivity analysis is presented to illustrate the proposed study.

Comparison Analysis of Efficiency Between Double-Synchronous Step-Down-Stress and Step-Up-Stress Accelerated Life Tests

Double-crossed-step-stress(DCSS) accelerated life test(ALT) method is widely used for estimating the lifetime of products with high reliability and long lifetime. In order to further reduce the test time and test cost, a double-synchronous-step-stress(DSSS) ALT method which combines a double-synchronous-step-downstress(DSSDS) ALT method and a double-synchronous-step-up-stress(DSSUS) ALT method is proposed. The accelerated stresses decrease and increase in a synchronous way with one step in the DSSDS-ALT and DSSUSALT methods, respectively. Monte Carlo method is adopted to simulate the two methods, and the validity and efficiency of them are demonstrated by the simulation results. In addition, a comparison analysis of efficiency between DSSDS-ALT method and DSSUS-ALT method is carried out. The result shows that the DSSDS-ALT method compared with the DSSUS-ALT method can significantly improve the test efficiency under the same test condition.

Modified DS np Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

This study presents the design of a modified attributed control chart based on a double sampling(DS)np chart applied in combination with generalized multiple dependent state(GMDS)sampling to monitor the mean life of the product based on the time truncated life test employing theWeibull distribution.The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing.Three control limit levels are used:the warning control limit,inner control limit,and outer control limit.Together,they enhance the capability for variation detection.A genetic algorithm can be used for optimization during the in-control process,whereby the optimal parameters can be established for the proposed control chart.The control chart performance is assessed using the average run length,while the influence of the model parameters upon the control chart solution is assessed via sensitivity analysis based on an orthogonal experimental design withmultiple linear regression.A comparative study was conducted based on the out-of-control average run length,in which the developed control chart offered greater sensitivity in the detection of process shifts while making use of smaller samples on average than is the case for existing control charts.Finally,to exhibit the utility of the developed control chart,this paper presents its application using simulated data with parameters drawn from the real set of data.

Life prediction for vacuum fluorescent display using maximum likelihood estimation

In order to obtain the life information of the vacuum fluorescent display （VFD） in a short time, a model of constant stress accelerated life tests （CSALT） is established with its filament temperature increased, and four constant stress tests are conducted. The Weibull function is applied to describe the life distribution of the VFD, and the maximum likelihood estimation （MLE） and its iterative flow chart are used to calculate the shape parameters and the scale parameters. Furthermore, the accelerated life equation is determined by the least square method, the Kolmogorov-Smirnov test is performed to verify whether the VFD life meets the Weibull distribution or not, and selfdeveloped software is employed to predict the average life and the reliable life. Statistical data analysis results demonstrate that the test plans are feasible and versatile, that the VFD life follows the Weibull distribution, and that the VFD accelerated model satisfies the linear Arrhenius equation. The proposed method and the estimated life information of the VFD can provide some significant guideline to its manufacturers and customers.

Optimum Constant-stress Plan for Accelerated Life Test with Censoring Ⅱ

In this paper, we obtain the optimum plan by discussing a constant-stress accelerated life test (ALT) satisfying the condition (3.3) at k stresses under an exponential distribution.

Analysis of Incomplete Data of Accelerated Life Testing with Competing Failure Modes

Data obtained from accelerated life testing （ALT） when there are two or more failure modes, which is commonly referred to as competing failure modes, are often incomplete. The incompleteness is mainly due to censoring, as well as masking which might be the case that the failure time is observed, but its corresponding failure mode is not identified. Because the identification of the failure mode may be expensive, or very difficult to investigate due to lack of appropriate diagnostics. A method is proposed for analyzing incomplete data of constant stress ALT with competing failure modes. It is assumed that failure modes have s-independent latent lifetimes and the log lifetime of each failure mode can be written as a linear function of stress. The parameters of the model are estimated by using the expectation maximum （EM） algorithm with incomplete data. Simulation studies are performed to check＇model validity and investigate the properties of estimates. For further validation, the method is also illustrated by an example, which shows the process of analyze incomplete data from ALT of some insulation system. Because of considering the incompleteness of data in modeling and making use of the EM algorithm in estimating, the method becomes more flexible in ALT analysis.

Optimal Design of Multiple Stress Constant Accelerated Life Test Plan on Non-rectangle Test Region

For optimal design of constant stress accelerated life test（CSALT） with two-stress, if the stresses could not reach the highest levels simultaneously, the test region becomes non-rectangular. For optimal CSALT design on non-rectangle test region, the present method is only focused on non-rectangle test region with simple boundary, and the optimization algorithm is based on experience which can not ensure to obtain the optimal plan. In this paper, considering the linear-extreme value model and the optimization goal to minimize the variance of lifetime estimate under normal stress, the optimal design method of two-stress type-I censored CSALT plan on general non-rectangular test region is proposed. First, two properties of optimal test plans are proved and the relationship of all the optimal test plans is determined analytically. Then, on the basis of the two properties, the optimal problem is simplified and the optimal design method of two-stress CSALT plan on general non-rectangular test region is proposed. Finally, a numerical example is used to illustrate the feasibility and effectiveness of the method, The result shows that the proposed method could obtain the optimal test plan on non-rectangular test regions with arbitrary boundaries. This research provides the theory and method for two-stress optimal CSALT planning on non-rectangular test regions.

Constant-step stress accelerated life test of VFD under Weibull distribution case

Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM)for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.

Estimation for constant-stress accelerated life test from generalized half-normal distribution

In the constant-stress accelerated life test, estimation issues are discussed for a generalized half-normal distribution under a log-linear life-stress model. The maximum likelihood estimates with the corresponding fixed point type iterative algorithm for unknown parameters are presented, and the least square estimates of the parameters are also proposed. Meanwhile, confidence intervals of model parameters are constructed by using the asymptotic theory and bootstrap technique. Numerical illustration is given to investigate the performance of our methods.

Optimum design of equivalent accelerated life testing plans based on proportional hazards-proportional odds model

The optimum design of equivalent accelerated life testing plan based on proportional hazards-proportional odds model using D-optimality is presented. The defined equivalent test plan is the test plan that has the same value of the determinant of Fisher information matrix. The equivalent test plan of step stress accelerated life testing （SSALT） to a baseline optimum constant stress accelerated life testing （CSALT） plan is obtained by adjusting the censoring time of SSALT and solving the optimization problem for each case to achieve the same value of the determinant of Fisher information matrix as in the baseline optimum CSALT plan. Numer- ical examples are given finally which demonstrate the equivalent SSALT plan to the baseline optimum CSALT plan reduces almost half of the test time while achieving approximately the same estimation errors of model parameters.

Design of Accelerated Life Test Plans——Overview and Prospect

Accelerated life test(ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With the promotion of the national strategy of civil-military integration, ALT will be widely used in the research and development(R&D) of various types of products, and the ALT plan design theory will face further challenges. To aid engineers in selecting appropriate theories and to stimulate researchers to develop the theories required in engineering, with focus on the demands for theory research that arise from the implementation of ALT, this paper reviews and summarizes the development of ALT plan design theory. The development of the theory and method for planning optimal ALT for location-scale distribution, which is the most applied and mature theory of designing the optimal ALT plan, are described in detail. Taking this as the center of radiation, some problems that ALT now faces, such as the verification of the statistical model, limitation of sample size, solutions of resource limits, optimization of the test arrangement, and management of product complexity, are discussed, and the general ideas and methods of solving these problems are analyzed. Suggestions for selecting appropriate ALT plan design theories are proposed, and the urgent solved theory problems and opinions of their solutions are proposed. Based on the principle of convenience for engineers to select appropriate methods according to the problems found in practice, this paper reviews the development of optimal ALT plan design theory by taking the engineering problems arising from the ALT implementation as the main thread, provides guidelines on selecting appropriate theories for engineers, and proposes opinions about the urgent solved theory problems for researchers.

Novel Accelerating Life Test Method and Its Application by Combining Constan Stress and Progressive Stress

Constant stress accelerated life tests(ALTs) can be applied to obtain a high estimation accuracy of reliability measure?ments, but these are time?consuming tests. Progressive stress ALTs can yield failures more quickly but cannot guaran tee the estimation accuracy of reliability measurements. In this paper, a progressive?constant combination stress ALT is proposed to combine the merits of both tests. The optimal plan, in which the design variables are the initial pro?gressive stress level, the progressive stress ramp rate, the sample allocation proportion of the progressive stress and the constant stress level, is determined using the principle of minimizing the asymptotic variance of the maximum likelihood estimator of the natural log reliable life for the connectors. A comparison between the optimal PCCSALT plan and the CSALT plan with the same sample size and estimation accuracy shows that the test time is reduced by 13.59% by applying the PCCSALT.

Life test research of a high specific impulse Hall thruster HEP-140MF

In this study,a high specific impulse Hall thruster,HEP-140 MF,having a high discharge voltage,was used to accelerate ions.We aimed to obtain a high specific impulse and an acceleration zone moving downstream toward the channel exit to reduce wall sputtering erosion of the walls of the discharge channel,hence ensuring an enhanced lifetime.To study the lifetime characteristics of the high specific impulse Hall thruster,a life test was performed on the HEP-140 MF thruster for the first time,and performance parameters,such as thrust,specific impulse,and efficiency,were measured.Changes in the performance parameters and evolutions in the surface profiles of the discharge channel wall were summarized.The reasons contributing to these changes during the life test were analyzed.Moreover,the accelerated life test method was validated on the HEP-140 MF.