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Radio Frequency Low Noise Amplifier with Linearizing Bias Circuit 被引量:1
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作者 Wen-Tao Han Qi Yu +1 位作者 Song Ye Mo-Hua Yang 《Journal of Electronic Science and Technology of China》 2009年第2期160-164,共5页
A 1.34 GHz-1=60 MHz low noise amplifier (LNA) designed in a 0.35 pm SiGe process is presented. The designed LNA exhibits a power gain of 21.46 dB and a noise figure (NF) of 1.27 dB at 1.34 GHz. The linearity is im... A 1.34 GHz-1=60 MHz low noise amplifier (LNA) designed in a 0.35 pm SiGe process is presented. The designed LNA exhibits a power gain of 21.46 dB and a noise figure (NF) of 1.27 dB at 1.34 GHz. The linearity is improved with an active biasing technique. The post-layout simulation shows an input referred 1-dB compression point (IPldn) of-11.52 dBm. Compared with the recent reported high gain LNAs, the proposed LNA has a much better linearity without degrading other performance. The LNA draws 10 mA current from a 3.3 V power supply. 展开更多
关键词 Index Terms-Impedance matching linear circuits low noise amplifier.
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Influence of Tilted Angle on Effective Linear Energy Transfer in Single Event Effect Tests for Integrated Circuits at 130 nm Technology Node 被引量:2
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作者 张乐情 卢健 +5 位作者 胥佳灵 刘小年 戴丽华 徐依然 毕大炜 张正选 《Chinese Physics Letters》 SCIE CAS CSCD 2017年第11期119-122,共4页
A heavy-ion irradiation experiment is studied in digital storage cells with different design approaches in 130?nm CMOS bulk Si and silicon-on-insulator (SOI) technologies. The effectiveness of linear energy transf... A heavy-ion irradiation experiment is studied in digital storage cells with different design approaches in 130?nm CMOS bulk Si and silicon-on-insulator (SOI) technologies. The effectiveness of linear energy transfer (LET) with a tilted ion beam at the 130?nm technology node is obtained. Tests of tilted angles θ=0 ° , 30 ° and 60 ° with respect to the normal direction are performed under heavy-ion Kr with certain power whose LET is about 40?MeVcm 2 /mg at normal incidence. Error numbers in D flip-flop chains are used to determine their upset sensitivity at different incidence angles. It is indicated that the effective LETs for SOI and bulk Si are not exactly in inverse proportion to cosθ , furthermore the effective LET for SOI is more closely in inverse proportion to cosθ compared to bulk Si, which are also the well known behavior. It is interesting that, if we design the sample in the dual interlocked storage cell approach, the effective LET in bulk Si will look like inversely proportional to cosθ very well, which is also specifically explained. 展开更多
关键词 SOI Influence of Tilted Angle on Effective Linear Energy Transfer in Single Event Effect Tests for Integrated circuits at 130 nm Tec
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