Optical imaging systems have greatly extended human visual capabilities,enabling the observation and understanding of diverse phenomena.Imaging technologies span a broad spectrum of wavelengths from x-ray to radio fre...Optical imaging systems have greatly extended human visual capabilities,enabling the observation and understanding of diverse phenomena.Imaging technologies span a broad spectrum of wavelengths from x-ray to radio frequencies and impact research activities and our daily lives.Traditional glass lenses are fabricated through a series of complex processes,while polymers offer versatility and ease of production.However,modern applications often require complex lens assemblies,driving the need for miniaturization and advanced designs with micro-and nanoscale features to surpass the capabilities of traditional fabrication methods.Three-dimensional(3D)printing,or additive manufacturing,presents a solution to these challenges with benefits of rapid prototyping,customized geometries,and efficient production,particularly suited for miniaturized optical imaging devices.Various 3D printing methods have demonstrated advantages over traditional counterparts,yet challenges remain in achieving nanoscale resolutions.Two-photon polymerization lithography(TPL),a nanoscale 3D printing technique,enables the fabrication of intricate structures beyond the optical diffraction limit via the nonlinear process of two-photon absorption within liquid resin.It offers unprecedented abilities,e.g.alignment-free fabrication,micro-and nanoscale capabilities,and rapid prototyping of almost arbitrary complex 3D nanostructures.In this review,we emphasize the importance of the criteria for optical performance evaluation of imaging devices,discuss material properties relevant to TPL,fabrication techniques,and highlight the application of TPL in optical imaging.As the first panoramic review on this topic,it will equip researchers with foundational knowledge and recent advancements of TPL for imaging optics,promoting a deeper understanding of the field.By leveraging on its high-resolution capability,extensive material range,and true 3D processing,alongside advances in materials,fabrication,and design,we envisage disruptive solutions to current challenges and a promising incorporation of TPL in future optical imaging applications.展开更多
The article is devoted to the study of bioecological features of Ipomoea nil in the conditions of the Tashkent Botanical Garden. Seeds were sown 8 - 10 cm deep in the first decade of April. Seed germination averaged 8...The article is devoted to the study of bioecological features of Ipomoea nil in the conditions of the Tashkent Botanical Garden. Seeds were sown 8 - 10 cm deep in the first decade of April. Seed germination averaged 85% - 90%. The beginning of vegetation and leaf regrowth in Tashkent is observed in the second decade of April. The flowering phase was observed in the first decade of August and fruiting was noted in the first decade of September. Biometric indicators of the plant during the generative phase were revealed as follows: plant height 2.95 ± 0.22 m, generative shoot length 2.62 ± 0.24 m, number of leaves 46.5 ± 3.59 pcs., leaf length 10.11 ± 0.49 cm, root length 19.85 ± 0.88 cm, number of flowers 42.8 ± 2.37 pcs., flower diameter 4.82 ± 0.28 cm. Potential seed productivity (PSP) of the plant was noted 13.5 ± 0.5 pcs., real seed productivity (RSP) was 10.8 ± 0.44 pcs. And in turn, the seed productivity coefficient (SPC) amounted to 80.0% ± 1.31%. The primary results prove, according to the success of Ipomoea nil introduction, the noted indicators in Tashkent conditions.展开更多
Extreme ultraviolet(EUV)lithography with high numerical aperture(NA)is a future technology to manufacture the integrated circuit in sub-nanometer dimension.Meanwhile,source mask co-optimization(SMO)is an extensively u...Extreme ultraviolet(EUV)lithography with high numerical aperture(NA)is a future technology to manufacture the integrated circuit in sub-nanometer dimension.Meanwhile,source mask co-optimization(SMO)is an extensively used approach for advanced lithography process beyond 28 nm technology node.This work proposes a novel SMO method to improve the image fidelity of high-NA EUV lithography system.A fast high-NA EUV lithography imaging model is established first,which includes the effects of mask three-dimensional structure and anamorphic magnification.Then,this paper develops an efficient SMO method that combines the gradient-based mask optimization algorithm and the compressivesensing-based source optimization algorithm.A mask rule check(MRC)process is further proposed to simplify the optimized mask pattern.Results illustrate that the proposed SMO method can significantly reduce the lithography patterning error,and maintain high computational efficiency.展开更多
Coaches experience considerable stress and anxiety in their pursuit of both team and individual success. Although there has been an increase in research aimed at promoting and managing the mental health of student-ath...Coaches experience considerable stress and anxiety in their pursuit of both team and individual success. Although there has been an increase in research aimed at promoting and managing the mental health of student-athletes, the mental well-being of coaches remains underexplored. Research indicates that the mental health profiles of coaches are similar to those of elite athletes [1] and should receive comparable attention. The introduction of Name, Image, and Likeness (NIL) legislation, along with the rise of the Transfer Portal in collegiate athletics, has presented student-athletes with new and unexpected options, which also bring novel challenges to coaches and potentially impact elite-level coaches’ mental health. This manuscript will identify three categories of stressors—performance, organizational, and self-related—that affect elite men’s college basketball coaches, highlighting how NIL and the Transfer Portal exacerbate those stressors and their impact on coaches’ mental health.展开更多
Electron beam lithography(EBL)involves the transfer of a pattern onto the surface of a substrate byfirst scanning a thin layer of organicfilm(called resist)on the surface by a tightly focused and precisely controlled el...Electron beam lithography(EBL)involves the transfer of a pattern onto the surface of a substrate byfirst scanning a thin layer of organicfilm(called resist)on the surface by a tightly focused and precisely controlled electron beam(exposure)and then selectively removing the exposed or nonexposed regions of the resist in a solvent(developing).It is widely used for fabrication of integrated cir-cuits,mask manufacturing,photoelectric device processing,and otherfields.The key to drawing circular patterns by EBL is the graphics production and control.In an EBL system,an embedded processor calculates and generates the trajectory coordinates for movement of the electron beam,and outputs the corresponding voltage signal through a digital-to-analog converter(DAC)to control a deflector that changes the position of the electron beam.Through this procedure,it is possible to guarantee the accuracy and real-time con-trol of electron beam scanning deflection.Existing EBL systems mostly use the method of polygonal approximation to expose circles.A circle is divided into several polygons,and the smaller the segmentation,the higher is the precision of the splicing circle.However,owing to the need to generate and scan each polygon separately,an increase in the number of segments will lead to a decrease in the overall lithography speed.In this paper,based on Bresenham’s circle algorithm and exploiting the capabilities of afield-programmable gate array and DAC,an improved real-time circle-producing algorithm is designed for EBL.The algorithm can directly generate cir-cular graphics coordinates such as those for a single circle,solid circle,solid ring,or concentric ring,and is able to effectively realizes deflection and scanning of the electron beam for circular graphics lithography.Compared with the polygonal approximation method,the improved algorithm exhibits improved precision and speed.At the same time,the point generation strategy is optimized to solve the blank pixel and pseudo-pixel problems that arise with Bresenham’s circle algorithm.A complete electron beam deflection system is established to carry out lithography experiments,the results of which show that the error between the exposure results and the preset pat-terns is at the nanometer level,indicating that the improved algorithm meets the requirements for real-time control and high precision of EBL.展开更多
A ring is called nil G-*-clean ring if each of its elements is a sum of a G-projection and a nilpotent.In this paper,we study the basic properties of this ring and some relations with other rings.We prove that R is ni...A ring is called nil G-*-clean ring if each of its elements is a sum of a G-projection and a nilpotent.In this paper,we study the basic properties of this ring and some relations with other rings.We prove that R is nil G-*-clean if(G(R)+J)/J=G(R/J)=and only if is nil,and is nil G-*-clean.展开更多
Optical proximity correction (OPC) systems require an accurate and fast way to predict how patterns will be transferred to the wafer.Based on Gabor's 'reduction to principal waves',a partially coherent ima...Optical proximity correction (OPC) systems require an accurate and fast way to predict how patterns will be transferred to the wafer.Based on Gabor's 'reduction to principal waves',a partially coherent imaging system can be represented as a superposition of coherent imaging systems,so an accurate and fast sparse aerial image intensity calculation algorithm for lithography simulation is presented based on convolution kernels,which also include simulating the lateral diffusion and some mask processing effects via Gaussian filter.The simplicity of this model leads to substantial computational and analytical benefits.Efficiency of this method is also shown through simulation results.展开更多
A new method for determining proximity parameters α,β ,and η in electron beam lithography is introduced on the assumption that the point exposure spread function is composed of two Gaussians.A single line i...A new method for determining proximity parameters α,β ,and η in electron beam lithography is introduced on the assumption that the point exposure spread function is composed of two Gaussians.A single line is used as test pattern to determine proximity effect parameters and the normalization approach is adopted in experimental data transaction in order to eliminate the need of measuring exposure clearing dose of the resist.Furthermore,the parameters acquired by this method are successfully used for proximity effect correction in electron beam lithography on the same experimental conditions.展开更多
Silicon crystal-facet-dependent nanostructures have been successfully fabricated on a (100)-oriented silicon-oninsulator wafer using electron-beam lithography and the silicon anisotropic wet etching technique. This ...Silicon crystal-facet-dependent nanostructures have been successfully fabricated on a (100)-oriented silicon-oninsulator wafer using electron-beam lithography and the silicon anisotropic wet etching technique. This technique takes advantage of the large difference in etching properties for different crystallographic planes in alkaline solution. The minimum size of the trapezoidal top for those Si nanostructures can be reduced to less than 10nm. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) observations indicate that the etched nanostructures have controllable shapes and smooth surfaces.展开更多
The JEOL JBX-5000LS is a vector type machine.The system hardware features an ion-pumped column,a LaB 6 electron emitter,25kV and 50kV accelerating voltage,and a turbo-pumped sample chamber.The resolution,stability,st...The JEOL JBX-5000LS is a vector type machine.The system hardware features an ion-pumped column,a LaB 6 electron emitter,25kV and 50kV accelerating voltage,and a turbo-pumped sample chamber.The resolution,stability,stitching and overlay of this system are evaluated.The system can write complex patterns at dimensions down to 30nm.The demonstrated overlay accuracy of this system is better than 40nm.展开更多
[Objective]The research aimed at investigating mechanisms of the changes of pharbitis.nil flower colors and leaf colors.[Method]The recombinant plasmid pMD18-T/Tpn was constructed by amplifying the target fragments fr...[Objective]The research aimed at investigating mechanisms of the changes of pharbitis.nil flower colors and leaf colors.[Method]The recombinant plasmid pMD18-T/Tpn was constructed by amplifying the target fragments from young leaf tissues of the blue and white mutant of Pharbitis nil with PCR technology and investigating in the fields.[Result]The results of investigations in the fields suggested that the mutant was segregated in F3 generation,and the mutations of leaf colors did not affect the changes of flower colors.The results of PCR amplification showed that there was a band about 330 bp in genomic DNA of Lanbai,Chunlan,Dahua,respectively,however,no bands were found in genomic DNA of Chunguang,Baixue,Ping'anhong and Chuiman.[Conclusion]The sequence of recombinant plasmid of the mutant was indeed a fragment of the transposon of Pharbitis nil.展开更多
基金support from the National Research Foundation (NRF) Singapore, under its Competitive Research Programme Award NRF-CRP20-20170004 and NRF Investigatorship Award NRF-NRFI06-20200005MTC Programmatic Grant M21J9b0085, as well as the Lite-On Project RS-INDUS-00090+5 种基金support from Australian Research Council (DE220101085, DP220102152)grants from German Research Foundation (SCHM2655/15-1, SCHM2655/21-1)Lee-Lucas Chair in Physics and funding by the Australian Research Council DP220102152financial support from the National Natural Science Foundation of China (Grant No. 62275078)Natural Science Foundation of Hunan Province of China (Grant No. 2022JJ20020)Shenzhen Science and Technology Program (Grant No. JCYJ20220530160405013)
文摘Optical imaging systems have greatly extended human visual capabilities,enabling the observation and understanding of diverse phenomena.Imaging technologies span a broad spectrum of wavelengths from x-ray to radio frequencies and impact research activities and our daily lives.Traditional glass lenses are fabricated through a series of complex processes,while polymers offer versatility and ease of production.However,modern applications often require complex lens assemblies,driving the need for miniaturization and advanced designs with micro-and nanoscale features to surpass the capabilities of traditional fabrication methods.Three-dimensional(3D)printing,or additive manufacturing,presents a solution to these challenges with benefits of rapid prototyping,customized geometries,and efficient production,particularly suited for miniaturized optical imaging devices.Various 3D printing methods have demonstrated advantages over traditional counterparts,yet challenges remain in achieving nanoscale resolutions.Two-photon polymerization lithography(TPL),a nanoscale 3D printing technique,enables the fabrication of intricate structures beyond the optical diffraction limit via the nonlinear process of two-photon absorption within liquid resin.It offers unprecedented abilities,e.g.alignment-free fabrication,micro-and nanoscale capabilities,and rapid prototyping of almost arbitrary complex 3D nanostructures.In this review,we emphasize the importance of the criteria for optical performance evaluation of imaging devices,discuss material properties relevant to TPL,fabrication techniques,and highlight the application of TPL in optical imaging.As the first panoramic review on this topic,it will equip researchers with foundational knowledge and recent advancements of TPL for imaging optics,promoting a deeper understanding of the field.By leveraging on its high-resolution capability,extensive material range,and true 3D processing,alongside advances in materials,fabrication,and design,we envisage disruptive solutions to current challenges and a promising incorporation of TPL in future optical imaging applications.
文摘The article is devoted to the study of bioecological features of Ipomoea nil in the conditions of the Tashkent Botanical Garden. Seeds were sown 8 - 10 cm deep in the first decade of April. Seed germination averaged 85% - 90%. The beginning of vegetation and leaf regrowth in Tashkent is observed in the second decade of April. The flowering phase was observed in the first decade of August and fruiting was noted in the first decade of September. Biometric indicators of the plant during the generative phase were revealed as follows: plant height 2.95 ± 0.22 m, generative shoot length 2.62 ± 0.24 m, number of leaves 46.5 ± 3.59 pcs., leaf length 10.11 ± 0.49 cm, root length 19.85 ± 0.88 cm, number of flowers 42.8 ± 2.37 pcs., flower diameter 4.82 ± 0.28 cm. Potential seed productivity (PSP) of the plant was noted 13.5 ± 0.5 pcs., real seed productivity (RSP) was 10.8 ± 0.44 pcs. And in turn, the seed productivity coefficient (SPC) amounted to 80.0% ± 1.31%. The primary results prove, according to the success of Ipomoea nil introduction, the noted indicators in Tashkent conditions.
基金financially supported by National Natural Science Foundation of China (No. 62274181,62204257 and 62374016)Chinese Ministry of Science and Technology (No. 2019YFB2205005)+4 种基金Guangdong Province Research and Development Program in Key Fields (No. 2021B0101280002)the support from Youth Innovation Promotion Association Chinese Academy of Sciences (No. 2021115)Beijing Institute of ElectronicsBeijing Association for Science and Technology as well,the support from University of Chinese Academy of Sciences (No. 118900M032)China Fundamental Research Funds for the Central Universities (No. E2ET3801)
文摘Extreme ultraviolet(EUV)lithography with high numerical aperture(NA)is a future technology to manufacture the integrated circuit in sub-nanometer dimension.Meanwhile,source mask co-optimization(SMO)is an extensively used approach for advanced lithography process beyond 28 nm technology node.This work proposes a novel SMO method to improve the image fidelity of high-NA EUV lithography system.A fast high-NA EUV lithography imaging model is established first,which includes the effects of mask three-dimensional structure and anamorphic magnification.Then,this paper develops an efficient SMO method that combines the gradient-based mask optimization algorithm and the compressivesensing-based source optimization algorithm.A mask rule check(MRC)process is further proposed to simplify the optimized mask pattern.Results illustrate that the proposed SMO method can significantly reduce the lithography patterning error,and maintain high computational efficiency.
文摘Coaches experience considerable stress and anxiety in their pursuit of both team and individual success. Although there has been an increase in research aimed at promoting and managing the mental health of student-athletes, the mental well-being of coaches remains underexplored. Research indicates that the mental health profiles of coaches are similar to those of elite athletes [1] and should receive comparable attention. The introduction of Name, Image, and Likeness (NIL) legislation, along with the rise of the Transfer Portal in collegiate athletics, has presented student-athletes with new and unexpected options, which also bring novel challenges to coaches and potentially impact elite-level coaches’ mental health. This manuscript will identify three categories of stressors—performance, organizational, and self-related—that affect elite men’s college basketball coaches, highlighting how NIL and the Transfer Portal exacerbate those stressors and their impact on coaches’ mental health.
基金supported by the Focused Ion Beam/Electron Beam Double Beam Microscopy(Grant No.2021YFF0704702).
文摘Electron beam lithography(EBL)involves the transfer of a pattern onto the surface of a substrate byfirst scanning a thin layer of organicfilm(called resist)on the surface by a tightly focused and precisely controlled electron beam(exposure)and then selectively removing the exposed or nonexposed regions of the resist in a solvent(developing).It is widely used for fabrication of integrated cir-cuits,mask manufacturing,photoelectric device processing,and otherfields.The key to drawing circular patterns by EBL is the graphics production and control.In an EBL system,an embedded processor calculates and generates the trajectory coordinates for movement of the electron beam,and outputs the corresponding voltage signal through a digital-to-analog converter(DAC)to control a deflector that changes the position of the electron beam.Through this procedure,it is possible to guarantee the accuracy and real-time con-trol of electron beam scanning deflection.Existing EBL systems mostly use the method of polygonal approximation to expose circles.A circle is divided into several polygons,and the smaller the segmentation,the higher is the precision of the splicing circle.However,owing to the need to generate and scan each polygon separately,an increase in the number of segments will lead to a decrease in the overall lithography speed.In this paper,based on Bresenham’s circle algorithm and exploiting the capabilities of afield-programmable gate array and DAC,an improved real-time circle-producing algorithm is designed for EBL.The algorithm can directly generate cir-cular graphics coordinates such as those for a single circle,solid circle,solid ring,or concentric ring,and is able to effectively realizes deflection and scanning of the electron beam for circular graphics lithography.Compared with the polygonal approximation method,the improved algorithm exhibits improved precision and speed.At the same time,the point generation strategy is optimized to solve the blank pixel and pseudo-pixel problems that arise with Bresenham’s circle algorithm.A complete electron beam deflection system is established to carry out lithography experiments,the results of which show that the error between the exposure results and the preset pat-terns is at the nanometer level,indicating that the improved algorithm meets the requirements for real-time control and high precision of EBL.
基金Supported by Anhui Provincial Natural Science Foundation(2008085MA06)。
文摘A ring is called nil G-*-clean ring if each of its elements is a sum of a G-projection and a nilpotent.In this paper,we study the basic properties of this ring and some relations with other rings.We prove that R is nil G-*-clean if(G(R)+J)/J=G(R/J)=and only if is nil,and is nil G-*-clean.
文摘Optical proximity correction (OPC) systems require an accurate and fast way to predict how patterns will be transferred to the wafer.Based on Gabor's 'reduction to principal waves',a partially coherent imaging system can be represented as a superposition of coherent imaging systems,so an accurate and fast sparse aerial image intensity calculation algorithm for lithography simulation is presented based on convolution kernels,which also include simulating the lateral diffusion and some mask processing effects via Gaussian filter.The simplicity of this model leads to substantial computational and analytical benefits.Efficiency of this method is also shown through simulation results.
文摘A new method for determining proximity parameters α,β ,and η in electron beam lithography is introduced on the assumption that the point exposure spread function is composed of two Gaussians.A single line is used as test pattern to determine proximity effect parameters and the normalization approach is adopted in experimental data transaction in order to eliminate the need of measuring exposure clearing dose of the resist.Furthermore,the parameters acquired by this method are successfully used for proximity effect correction in electron beam lithography on the same experimental conditions.
文摘Silicon crystal-facet-dependent nanostructures have been successfully fabricated on a (100)-oriented silicon-oninsulator wafer using electron-beam lithography and the silicon anisotropic wet etching technique. This technique takes advantage of the large difference in etching properties for different crystallographic planes in alkaline solution. The minimum size of the trapezoidal top for those Si nanostructures can be reduced to less than 10nm. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) observations indicate that the etched nanostructures have controllable shapes and smooth surfaces.
文摘The JEOL JBX-5000LS is a vector type machine.The system hardware features an ion-pumped column,a LaB 6 electron emitter,25kV and 50kV accelerating voltage,and a turbo-pumped sample chamber.The resolution,stability,stitching and overlay of this system are evaluated.The system can write complex patterns at dimensions down to 30nm.The demonstrated overlay accuracy of this system is better than 40nm.
文摘[Objective]The research aimed at investigating mechanisms of the changes of pharbitis.nil flower colors and leaf colors.[Method]The recombinant plasmid pMD18-T/Tpn was constructed by amplifying the target fragments from young leaf tissues of the blue and white mutant of Pharbitis nil with PCR technology and investigating in the fields.[Result]The results of investigations in the fields suggested that the mutant was segregated in F3 generation,and the mutations of leaf colors did not affect the changes of flower colors.The results of PCR amplification showed that there was a band about 330 bp in genomic DNA of Lanbai,Chunlan,Dahua,respectively,however,no bands were found in genomic DNA of Chunguang,Baixue,Ping'anhong and Chuiman.[Conclusion]The sequence of recombinant plasmid of the mutant was indeed a fragment of the transposon of Pharbitis nil.