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Numerical and Experimental Study of Localized Lifetime Control LIGBT by High Dose He Ion Implantation 被引量:3
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作者 方健 唐新伟 +1 位作者 李肇基 张波 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第9期1048-1054,共7页
A high speed LIGBT with localized lifetime control by using high dose and low en ergy helium implantation(LC-LIGBT) is proposed.Compared with conventional LIGB Ts,particle irradiation results show that trade-off relat... A high speed LIGBT with localized lifetime control by using high dose and low en ergy helium implantation(LC-LIGBT) is proposed.Compared with conventional LIGB Ts,particle irradiation results show that trade-off relationship between turn- off time and forward voltage drop is improved.At the same time,the forward volta ge drop and turn-off time of such device are researched,when localized lifetime control region place near the p+-n junction,even in p+ anode.The results s how for the first time,helium ions,which stop in the p+ anode,also contribute to the forward voltage drop increasing and turn-off time reducing. 展开更多
关键词 LIGBT localized lifetime control helium ion implantation
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