Using the dynamical properties of the polarization bistability that depends on the detuning of the injected light,we propose a novel approach to implement reliable all-optical stochastic logic gates in the cascaded ve...Using the dynamical properties of the polarization bistability that depends on the detuning of the injected light,we propose a novel approach to implement reliable all-optical stochastic logic gates in the cascaded vertical cavity surface emitting lasers（VCSELs） with optical-injection.Here,two logic inputs are encoded in the detuning of the injected light from a tunable CW laser.The logic outputs are decoded from the two orthogonal polarization lights emitted from the optically injected VCSELs.For the same logic inputs,under electro-optic modulation,we perform various digital signal processing（NOT,AND,NAND,XOR,XNOR,OR,NOR） in the all-optical domain by controlling the logic operation of the applied electric field.Also we explore their delay storages by using the mechanism of the generalized chaotic synchronization.To quantify the reliabilities of these logic gates,we further demonstrate their success probabilities.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant No.61475120)the Innovative Projects in Guangdong Colleges and Universities,China(Grant Nos.2014KTSCX134 and 2015KTSCX146)
文摘Using the dynamical properties of the polarization bistability that depends on the detuning of the injected light,we propose a novel approach to implement reliable all-optical stochastic logic gates in the cascaded vertical cavity surface emitting lasers（VCSELs） with optical-injection.Here,two logic inputs are encoded in the detuning of the injected light from a tunable CW laser.The logic outputs are decoded from the two orthogonal polarization lights emitted from the optically injected VCSELs.For the same logic inputs,under electro-optic modulation,we perform various digital signal processing（NOT,AND,NAND,XOR,XNOR,OR,NOR） in the all-optical domain by controlling the logic operation of the applied electric field.Also we explore their delay storages by using the mechanism of the generalized chaotic synchronization.To quantify the reliabilities of these logic gates,we further demonstrate their success probabilities.
