This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for tes...This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set;this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test set.展开更多
Software operational profile （SOP） is used in software reliability prediction, software quality assessment, performance analysis of software, test case allocation, determination of ＂when to stop testing,＂ etc. Due...Software operational profile （SOP） is used in software reliability prediction, software quality assessment, performance analysis of software, test case allocation, determination of ＂when to stop testing,＂ etc. Due to the limited data resources and large efforts required to collect and convert the gathered data into point estimates, reluctance is observed by the software professionals to develop the SOP. A framework is proposed to develop SOP using fuzzy logic, which requires usage data in the form of linguistics. The resulting profile is named fuzzy software operational profile （FSOP）. Based on this work, this paper proposes a generalized approach for the allocation of test cases, in which occurrence probability of operations obtained from FSOP are combined with the criticality of the operations using fuzzy inference system （FIS）. Traditional methods for the allocation of test cases do not consider the application in which software operates. This is intuitively incorrect. To solve this problem, allocation of test cases with respect to software application using the FIS model is also proposed in this paper.展开更多
Nowadays, application model systems for decision-making based on non-classical logic such as Paraconsistent Logic are used successfully in the treatment of uncertainties. The method presented in this paper is based on...Nowadays, application model systems for decision-making based on non-classical logic such as Paraconsistent Logic are used successfully in the treatment of uncertainties. The method presented in this paper is based on the fundamental concepts of Paraconsistent Annotated Logic with annotation of 2 values (PAL2v). In this study, two algorithms based on PAL2v are presented gradually, to extract the effects of the contradiction in signals of information from a database of uncertain knowledge. The Paraconsistent Extractors Algorithms of Contradiction Effect-Para Extrctr is applied to filters of networks of analyses (PANets) of signal information, where uncertain and contradictory signals may be found. Software test case scenarios are subordinated to an application model of Paraconsistent decision-making, which provides an analysis using Paraconsistent Logic in the treatment of uncertainties for design software testing strategies. This quality-quantity criterion to evaluate the software product quality is based on the characteristics of software testability analysis. The Para consistent reasoning application model system presented in this case study, reveals itself to be more efficient than the traditional methods because it has the potential to offer an appropriate treatment to different originally contradicting source information.展开更多
Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic t...Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects caused by process variation when IC is shrinking. To reduce the computation effort of ATPG, test generation could be started earlier at higher abstraction level, which is in line with top-down design methodology that has become more popular nowadays. In this research, we employ Chen’s high-level fault model in the high-level ATPG. Besides shorter ATPG time as shown in many previous works, our study showed that high-level ATPG also contributes to test compaction. This is because most of the high-level faults correlate with the gate-level collapsed faults especially at input/output of the modules in a circuit. The high-level ATPG prototype used in our work is mainly composed by constraint-driven test generation engine and fault simulation engine. Experimental result showed that more reduced/compact test set can be generated from the high-level ATPG.展开更多
A variety of faulty radar echoes may cause serious problems with radar data applications,especially radar data assimilation and quantitative precipitation estimates.In this study,＂test pattern＂ caused by test signal...A variety of faulty radar echoes may cause serious problems with radar data applications,especially radar data assimilation and quantitative precipitation estimates.In this study,＂test pattern＂ caused by test signal or radar hardware failures in CINRAD （China New Generation Weather Radar） SA and SB radar operational observations are investigated.In order to distinguish the test pattern from other types of radar echoes,such as precipitation,clear air and other non-meteorological echoes,five feature parameters including the effective reflectivity data percentage （Rz）,velocity RF （range folding） data percentage （RRF）,missing velocity data percentage （RM）,averaged along-azimuth reflectivity fluctuation （RNr,z） and averaged along-beam reflectivity fluctuation （RNa,z） are proposed.Based on the fuzzy logic method,a test pattern identification algorithm is developed,and the statistical results from all the different kinds of radar echoes indicate the performance of the algorithm.Analysis of two typical cases with heavy precipitation echoes located inside the test pattern are performed.The statistical results show that the test pattern identification algorithm performs well,since the test pattern is recognized in most cases.Besides,the algorithm can effectively remove the test pattern signal and retain strong precipitation echoes in heavy rainfall events.展开更多
文摘This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set;this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test set.
文摘Software operational profile （SOP） is used in software reliability prediction, software quality assessment, performance analysis of software, test case allocation, determination of ＂when to stop testing,＂ etc. Due to the limited data resources and large efforts required to collect and convert the gathered data into point estimates, reluctance is observed by the software professionals to develop the SOP. A framework is proposed to develop SOP using fuzzy logic, which requires usage data in the form of linguistics. The resulting profile is named fuzzy software operational profile （FSOP）. Based on this work, this paper proposes a generalized approach for the allocation of test cases, in which occurrence probability of operations obtained from FSOP are combined with the criticality of the operations using fuzzy inference system （FIS）. Traditional methods for the allocation of test cases do not consider the application in which software operates. This is intuitively incorrect. To solve this problem, allocation of test cases with respect to software application using the FIS model is also proposed in this paper.
文摘Nowadays, application model systems for decision-making based on non-classical logic such as Paraconsistent Logic are used successfully in the treatment of uncertainties. The method presented in this paper is based on the fundamental concepts of Paraconsistent Annotated Logic with annotation of 2 values (PAL2v). In this study, two algorithms based on PAL2v are presented gradually, to extract the effects of the contradiction in signals of information from a database of uncertain knowledge. The Paraconsistent Extractors Algorithms of Contradiction Effect-Para Extrctr is applied to filters of networks of analyses (PANets) of signal information, where uncertain and contradictory signals may be found. Software test case scenarios are subordinated to an application model of Paraconsistent decision-making, which provides an analysis using Paraconsistent Logic in the treatment of uncertainties for design software testing strategies. This quality-quantity criterion to evaluate the software product quality is based on the characteristics of software testability analysis. The Para consistent reasoning application model system presented in this case study, reveals itself to be more efficient than the traditional methods because it has the potential to offer an appropriate treatment to different originally contradicting source information.
文摘Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects caused by process variation when IC is shrinking. To reduce the computation effort of ATPG, test generation could be started earlier at higher abstraction level, which is in line with top-down design methodology that has become more popular nowadays. In this research, we employ Chen’s high-level fault model in the high-level ATPG. Besides shorter ATPG time as shown in many previous works, our study showed that high-level ATPG also contributes to test compaction. This is because most of the high-level faults correlate with the gate-level collapsed faults especially at input/output of the modules in a circuit. The high-level ATPG prototype used in our work is mainly composed by constraint-driven test generation engine and fault simulation engine. Experimental result showed that more reduced/compact test set can be generated from the high-level ATPG.
基金supported by the National Key Program for Developing Basic Sciences under Grant 2012CB417202the National Natural Science Foundation of China under Grant No. 41175038, No. 41305088 and No. 41075023+4 种基金the Meteorological Special Project "Radar network observation technology and QC"the CMA Key project "Radar Operational Software Engineering"the Chinese Academy of Meteorological Sciences Basic ScientificOperational Projects "Observation and retrieval methods of micro-physics and dynamic parameters of cloud and precipitation with multi-wavelength Remote Sensing"Project of the State Key Laboratory of Severe Weather grant 2012LASW-B04
文摘A variety of faulty radar echoes may cause serious problems with radar data applications,especially radar data assimilation and quantitative precipitation estimates.In this study,＂test pattern＂ caused by test signal or radar hardware failures in CINRAD （China New Generation Weather Radar） SA and SB radar operational observations are investigated.In order to distinguish the test pattern from other types of radar echoes,such as precipitation,clear air and other non-meteorological echoes,five feature parameters including the effective reflectivity data percentage （Rz）,velocity RF （range folding） data percentage （RRF）,missing velocity data percentage （RM）,averaged along-azimuth reflectivity fluctuation （RNr,z） and averaged along-beam reflectivity fluctuation （RNa,z） are proposed.Based on the fuzzy logic method,a test pattern identification algorithm is developed,and the statistical results from all the different kinds of radar echoes indicate the performance of the algorithm.Analysis of two typical cases with heavy precipitation echoes located inside the test pattern are performed.The statistical results show that the test pattern identification algorithm performs well,since the test pattern is recognized in most cases.Besides,the algorithm can effectively remove the test pattern signal and retain strong precipitation echoes in heavy rainfall events.
