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Micromagnetic simulation of Au interlayer in L1_0-FePt nanocomposite recording medium
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作者 Sa-Zi Li Su-Fen Zhao +1 位作者 Yong Xie Zi-Yu Chen 《Rare Metals》 SCIE EI CAS CSCD 2017年第2期108-112,共5页
Owing to the epitaxial inducement of Au atom,Au interlayer was introduced to increase the perpendicular anisotropy and the coercivity in L10-FePt nanocomposite film.Micromagnetics can be used to reveal the relationshi... Owing to the epitaxial inducement of Au atom,Au interlayer was introduced to increase the perpendicular anisotropy and the coercivity in L10-FePt nanocomposite film.Micromagnetics can be used to reveal the relationship between microstructure and magnetic properties of materials,and give the information of the perpendicular anisotropy and coercivity.In this work,the effect of the Au interlayer on annealed[Fe(0.5 nm)/Pt(0.5 nm)/Au(d nm)]10 nanocomposite recording medium by a micromagnetic model was studied.The model contains three phases:hard magnetic phase,soft magnetic phase,and nonmagnetic phase.The calculated result shows that perpendicular orientation degree of the texture and proportion of a hard magnetic phase to the total phase in the annealed film are both enhanced by increasing Au interlayer thickness.This result can be conducive to the improvement of the perpendicular anisotropy and the coercivity of the FePt nanocomposite film in the experiments. 展开更多
关键词 FePt multilayer magnetic recording materials Perpendicular anisotropy Micromagnetic simulation
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Ll_0 FePt thin films with 001crystalline growth fabricated by ZnO addition and rapid thermal annealing
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作者 刘曦 Ishio Shunji 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第8期627-631,共5页
FePt films with a high degree of order S of the L10 structure (S 〉 0.90) and well defined [001] crystalline growth perpendicular to the film plane are fabricated on thermally oxidized Si substrates by the addition ... FePt films with a high degree of order S of the L10 structure (S 〉 0.90) and well defined [001] crystalline growth perpendicular to the film plane are fabricated on thermally oxidized Si substrates by the addition of ZnO and a successive rapid thermal annealing (RTA) process. The optimum condition to prepare high-ordering L10 FePtZnO films is 20 vol% ZnO addition and 450 ℃ annealing. The effect of the ZnO additive on the ordering process of the L10 FePtZnO films is discussed. In the annealing process, Zn atoms move to the film surface and evaporate. The motion of the Zn atoms accelerates the intergrain exchange and decreases the ordering temperature. 展开更多
关键词 FePt thin film magnetic recording material rapid-thermal-annealing oxide addition
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