基于有限元辅助测试方法(Finite element aided testing,FAT)对新型聚合物PA66开展了直至破坏的全程单轴本构关系的研究。另外,将VIC-3D光测所得的试样表面应变场结果与有限元模拟结果进行对比,表明通过FAT方法获得的聚合物PA66全程单...基于有限元辅助测试方法(Finite element aided testing,FAT)对新型聚合物PA66开展了直至破坏的全程单轴本构关系的研究。另外,将VIC-3D光测所得的试样表面应变场结果与有限元模拟结果进行对比,表明通过FAT方法获得的聚合物PA66全程单轴本构关系结果准确有效。最后给出了聚合物PA66的全程单轴本构关系曲线,给出了对应Chaboche本构关系模型的参数、材料临界破断应力、破断应变、应力三轴度等,并对试样的破断机理进行了分析。展开更多
The Zn1-xMgxO thin films were deposited on sapphire substrates by reactive electron beam evaporation deposition （REBED）. The X-ray diffraction （XRD） measurement demonstrates that these films undergo phase transiti...The Zn1-xMgxO thin films were deposited on sapphire substrates by reactive electron beam evaporation deposition （REBED）. The X-ray diffraction （XRD） measurement demonstrates that these films undergo phase transition from hexagonal to cubic with increasing the Mg concentration. Absorption coefficients at 532 nm of the samples were obtained from the absorption spectra. Using optical Kerr effect, the thirdorder susceptibilities of the ternary films over a wide range of Mg concentrations were determined. The magnitude of X^（3） of the ternary Zn1-xMgxO films is order of 10^-11 esu at λ = 532 nm. The sample with phase mixture of both hexagonal and cubic structures shows the largest third-order susceptibility. The difference observed in the magnitude of X^（3） of Zn1-xMgxO films is attributed to the different microstructures of the ternary films, such as crystalline phase separation and crystal grains that enhance stimulated scattering.展开更多
基金The National Natural Science Foundation of China(90922035)the Knowledge Innovation Program of the Chinese Academy of Sciences(KJCX2-EW-H03)Fujian High Technology Research and Development Program(2012H0046)
文摘基于有限元辅助测试方法(Finite element aided testing,FAT)对新型聚合物PA66开展了直至破坏的全程单轴本构关系的研究。另外,将VIC-3D光测所得的试样表面应变场结果与有限元模拟结果进行对比,表明通过FAT方法获得的聚合物PA66全程单轴本构关系结果准确有效。最后给出了聚合物PA66的全程单轴本构关系曲线,给出了对应Chaboche本构关系模型的参数、材料临界破断应力、破断应变、应力三轴度等,并对试样的破断机理进行了分析。
基金This work was supported by the National Natural Sci-ence Foundation of China under Grant No. 10174064and 50472058.
文摘The Zn1-xMgxO thin films were deposited on sapphire substrates by reactive electron beam evaporation deposition （REBED）. The X-ray diffraction （XRD） measurement demonstrates that these films undergo phase transition from hexagonal to cubic with increasing the Mg concentration. Absorption coefficients at 532 nm of the samples were obtained from the absorption spectra. Using optical Kerr effect, the thirdorder susceptibilities of the ternary films over a wide range of Mg concentrations were determined. The magnitude of X^（3） of the ternary Zn1-xMgxO films is order of 10^-11 esu at λ = 532 nm. The sample with phase mixture of both hexagonal and cubic structures shows the largest third-order susceptibility. The difference observed in the magnitude of X^（3） of Zn1-xMgxO films is attributed to the different microstructures of the ternary films, such as crystalline phase separation and crystal grains that enhance stimulated scattering.
