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Several questions about using national legal metrological unit in seismological periodicals
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作者 冯义钧 李学良 肖承邺 《Earthquake Science》 CSCD 1994年第S1期109-120,共12页
This paper, first, presents the main points of national policies and regulations, and a series of technical standards concerning legal metrological units, and bries the importance and urgency of using legal metrologic... This paper, first, presents the main points of national policies and regulations, and a series of technical standards concerning legal metrological units, and bries the importance and urgency of using legal metrological unit in the seismological system. Secondly, it examined the present situation in using legal metrological unit by checking six selected kinds of Seismological periodicals against national standard and provided in the form of tables typical error-correcting examples in using legal metrological unit for the responsibles (authors) and editorial departments.Finally,based on statistic, it analysed the causes for the existing problems and offered proposals for emphasizing the use of legal metrological units in the seismological system. 展开更多
关键词 legal metrological unit national standard illegal metrological unit
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Characterization of a nano line width reference material based on metrological scanning electron microscope 被引量:1
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作者 王芳 施玉书 +4 位作者 李伟 邓晓 程鑫彬 张树 余茜茜 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第5期203-211,共9页
The line width(often synonymously used for critical dimension,CD)is a crucial parameter in integrated circuits.To accurately control CD values in manufacturing,a reasonable CD reference material is required to calibra... The line width(often synonymously used for critical dimension,CD)is a crucial parameter in integrated circuits.To accurately control CD values in manufacturing,a reasonable CD reference material is required to calibrate the corresponding instruments.We develop a new reference material with nominal CDs of 160 nm,80 nm,and 40 nm.The line features are investigated based on the metrological scanning electron microscope which is developed by the National Institute of Metrology(NIM)in China.Also,we propose a new characterization method for the precise measurement of CD values.After filtering and leveling the intensity profiles,the line features are characterized by the combination model of the Gaussian and Lorentz functions.The left and right edges of CD are automatically extracted with the profile decomposition and k-means algorithm.Then the width of the two edges at the half intensity position is regarded as the standard CD value.Finally,the measurement results are evaluated in terms of the sample,instrument,algorithm,and repeatability.The experiments indicate efficiency of the proposed method which can be easily applied in practice to accurately characterize CDs. 展开更多
关键词 critical dimension line width metrological scanning electron microscopy TRACEABILITY
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On Quality Evaluation and Analysis of Metrological Verification and Detection
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作者 Meng Xiaobo 《Journal of Environmental Science and Engineering(B)》 2022年第1期24-30,共7页
With the rapid development of China’s economy and society,under the existing economic system,measurement work is of great significance to promote market development and improve people’s living standards.The quality ... With the rapid development of China’s economy and society,under the existing economic system,measurement work is of great significance to promote market development and improve people’s living standards.The quality evaluation of testing work is an important means to ensure the accuracy of measurement.Based on the analysis of several factors affecting the quality of measurement work,this paper takes the ionizing radiation monitoring quality as an example,and makes a concrete exposition on the evaluation and analysis of the quality of metrological verification work. 展开更多
关键词 metrological verification test the quality of work measuring instruments ionization chamber
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Metrological Analysis of Sunflower Prototype
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作者 Hermes Jose Loschi Yuzo Iano +2 位作者 Rosivaldo Ferrarezi Neusa Rocha Ferrarezi Fabrizzio Daibert Conte 《Smart Grid and Renewable Energy》 2015年第3期41-47,共7页
It is well known that the solar tracking systems can increase the efficiency of the photovoltaic (PV) panel by about 30 percent. However, these systems require precise control of their components, mainly of the equipm... It is well known that the solar tracking systems can increase the efficiency of the photovoltaic (PV) panel by about 30 percent. However, these systems require precise control of their components, mainly of the equipment’s used for the measurement of energy. In this paper, a metrology analysis is conducted, through of the results obtained by Sunflower prototype. The Sunflower is a solar tracking system developed by H. J. Loschi. A tracking system through a microcontrolled timing logic, sending commands to a linear actuator that moves the system. The deductions, based on in research trials, confirms that the Sunflower prototype is more efficient in relation to fixed PV panels, it is possible to observe the difference in the efficiency of 31%, with a variation of ±0.8% (that depends the solar irradiation). The main purpose of this paper is to attest to the quality of the measurements carried out during the performance tests of the Sunflower prototype, evaluating the uncertainty of measurements collected through the measurements equipment, and, introducing methods to minimize uncertainties of measurement equipment in the PV systems. 展开更多
关键词 Photovoltaic-PV TRACKING metrological SUNFLOWER PROTOTYPE
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Frontier and Evolution of Marketing Discipline Based on Scientific Metrological Analysis of Top 4 Marketing Periodicals in 2009-2013
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作者 Shenpeng ZHANG 《Asian Agricultural Research》 2015年第12期16-22,共7页
Using scientific metrological method,this paper analyzed all literature published by top 4 marketing periodicals( JCR,JM,JMR,and MS) in 2009- 2013. It is intended to find out hot issues and frontier topics of current ... Using scientific metrological method,this paper analyzed all literature published by top 4 marketing periodicals( JCR,JM,JMR,and MS) in 2009- 2013. It is intended to find out hot issues and frontier topics of current marketing research through cluster analysis of key words,get to know cooperation and exchange of organizations through analysis of organization cooperative network,explore new topics of marketing researches with the aid of analysis of abrupt change words,and explore evolution path and development rules of marketing researches through co-citation network analysis. 展开更多
关键词 TOP 4 MARKETING periodicals Citespace LITERATURE metrology Mapping knowledge domain
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Electromagnetic Technology for Vacuum Metrology in the Typical Development of a Metrological-Grade Spinning Rotor Gauge
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作者 Detian Li Meiru Guo +2 位作者 Zhenhua Xi Huzhong Zhang Bowen Li 《Electromagnetic Science》 2023年第3期88-99,共12页
As the most precise viscous vacuum gauge,the spinning rotor gauge is widely used in the aerospace,nuclear,semiconductor,and other fields because of its excellent accuracy and chemical inertness.Herein,a metrological-g... As the most precise viscous vacuum gauge,the spinning rotor gauge is widely used in the aerospace,nuclear,semiconductor,and other fields because of its excellent accuracy and chemical inertness.Herein,a metrological-grade spinning rotor vacuum gauge is developed,and its performance is evaluated.It can be used for international comparison of vacuum standards and construction of national vacuum measurement traceability and transmission systems.This paper presents the design of a single-degree-of-freedom permanent magnet-biased rotor suspension system,a high-speed rotary stepper drive system,a rotational angular velocity determination system,a lateral damping system,and a transducer in detail.The change in residual drag is less than 0.49%after 50 minutes of start-up.There is good consistency and linearity in the range of 9.1727×10^(−5)Pa to 1.2081 Pa. 展开更多
关键词 Magnetically levitated rotor Vacuum metrology Transfer standard Viscous vacuum gauge
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Physics-informed deep learning for fringe pattern analysis
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作者 Wei Yin Yuxuan Che +6 位作者 Xinsheng Li Mingyu Li Yan Hu Shijie Feng Edmund Y.Lam Qian Chen Chao Zuo 《Opto-Electronic Advances》 SCIE EI CAS CSCD 2024年第1期4-15,共12页
Recently,deep learning has yielded transformative success across optics and photonics,especially in optical metrology.Deep neural networks (DNNs) with a fully convolutional architecture (e.g.,U-Net and its derivatives... Recently,deep learning has yielded transformative success across optics and photonics,especially in optical metrology.Deep neural networks (DNNs) with a fully convolutional architecture (e.g.,U-Net and its derivatives) have been widely implemented in an end-to-end manner to accomplish various optical metrology tasks,such as fringe denoising,phase unwrapping,and fringe analysis.However,the task of training a DNN to accurately identify an image-to-image transform from massive input and output data pairs seems at best naive,as the physical laws governing the image formation or other domain expertise pertaining to the measurement have not yet been fully exploited in current deep learning practice.To this end,we introduce a physics-informed deep learning method for fringe pattern analysis (PI-FPA) to overcome this limit by integrating a lightweight DNN with a learning-enhanced Fourier transform profilometry (Le FTP) module.By parameterizing conventional phase retrieval methods,the Le FTP module embeds the prior knowledge in the network structure and the loss function to directly provide reliable phase results for new types of samples,while circumventing the requirement of collecting a large amount of high-quality data in supervised learning methods.Guided by the initial phase from Le FTP,the phase recovery ability of the lightweight DNN is enhanced to further improve the phase accuracy at a low computational cost compared with existing end-to-end networks.Experimental results demonstrate that PI-FPA enables more accurate and computationally efficient single-shot phase retrieval,exhibiting its excellent generalization to various unseen objects during training.The proposed PI-FPA presents that challenging issues in optical metrology can be potentially overcome through the synergy of physics-priors-based traditional tools and data-driven learning approaches,opening new avenues to achieve fast and accurate single-shot 3D imaging. 展开更多
关键词 optical metrology deep learning physics-informed neural networks fringe analysis phase retrieval
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Holevo bound independent of weight matrices for estimating two parameters of a qubit
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作者 牛畅 郁司夏 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第2期137-143,共7页
Holevo bound plays an important role in quantum metrology as it sets the ultimate limit for multi-parameter estimations,which can be asymptotically achieved.Except for some trivial cases,the Holevo bound is implicitly... Holevo bound plays an important role in quantum metrology as it sets the ultimate limit for multi-parameter estimations,which can be asymptotically achieved.Except for some trivial cases,the Holevo bound is implicitly defined and formulated with the help of weight matrices.Here we report the first instance of an intrinsic Holevo bound,namely,without any reference to weight matrices,in a nontrivial case.Specifically,we prove that the Holevo bound for estimating two parameters of a qubit is equivalent to the joint constraint imposed by two quantum Cramér–Rao bounds corresponding to symmetric and right logarithmic derivatives.This weightless form of Holevo bound enables us to determine the precise range of independent entries of the mean-square error matrix,i.e.,two variances and one covariance that quantify the precisions of the estimation,as illustrated by different estimation models.Our result sheds some new light on the relations between the Holevo bound and quantum Cramer–Rao bounds.Possible generalizations are discussed. 展开更多
关键词 quantum metrology quantum Fisher information Holevo bound quantum multi-parameter estimation
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Enhancing quantum metrology for multiple frequencies of oscillating magnetic fields by quantum control
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作者 雷昕 范静怡 庞盛世 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第6期177-187,共11页
Quantum multi-parameter estimation has recently attracted increased attention due to its wide applications, with a primary goal of designing high-precision measurement schemes for unknown parameters. While existing re... Quantum multi-parameter estimation has recently attracted increased attention due to its wide applications, with a primary goal of designing high-precision measurement schemes for unknown parameters. While existing research has predominantly concentrated on time-independent Hamiltonians, little has been known about quantum multi-parameter estimation for time-dependent Hamiltonians due to the complexity of quantum dynamics. This work bridges the gap by investigating the precision limit of multi-parameter quantum estimation for a qubit in an oscillating magnetic field model with multiple unknown frequencies. As the well-known quantum Cramer–Rao bound is generally unattainable due to the potential incompatibility between the optimal measurements for different parameters, we use the most informative bound instead which is always attainable and equivalent to the Holevo bound in the asymptotic limit. Moreover, we apply additional Hamiltonian to the system to engineer the dynamics of the qubit. By utilizing the quasi-Newton method, we explore the optimal schemes to attain the highest precision for the unknown frequencies of the magnetic field, including the simultaneous optimization of initial state preparation, the control Hamiltonian and the final measurement. The results indicate that the optimization can yield much higher precisions for the field frequencies than those without the optimizations. Finally,we study the robustness of the optimal control scheme with respect to the fluctuation of the interested frequencies, and the optimized scheme exhibits superior robustness to the scenario without any optimization. 展开更多
关键词 quantum metrology multi-parameter estimation quantum control
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Correction of Interferometric High-Order Nonlinearity Error in Metrological Atomic Force Microscopy
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作者 Gaoliang Dai Xiukun Hu 《Nanomanufacturing and Metrology》 EI 2022年第4期412-422,共11页
Metrological atomic force microscopes(Met.AFMs)with built-in interferometers are one of the main workhorses for versatile dimensional nanometrology.The interferometric nonlinearity error,particularly the high-order(i.... Metrological atomic force microscopes(Met.AFMs)with built-in interferometers are one of the main workhorses for versatile dimensional nanometrology.The interferometric nonlinearity error,particularly the high-order(i.e.,3rd-and 4th-order)nonlinearity errors,is a dominant error source for further improving their metrology performance,which cannot be corrected using the conventional Heydemann correction method.To solve this problem,two new methods were developed.One uses a capacitive sensor embedded in the Met.AFM,and the other applies an external physical artifact with a flat surface.Both methods can be applied very conveniently and can effectively reduce the nonlinearity error.In this paper,the propagation of the(residual)nonlinearity error in step height calibrations is examined.Finally,the performance of the improved tool is verified in the calibration of a highly demanding industrial sample.For the measurements performed at 25 different positions and repeated six times,the standard deviation of the total 150 measured values is 0.08 nm,which includes the contributions from the reproducibility of the metrology tool and sample inhomogeneity.This research has significantly improved our dimensional nanometrology service.For instance,the extended measurement uncertainty(k=2)is reduced from 1.0 to 0.3 nm for the step height or etching depth calibrations. 展开更多
关键词 Dimensional nanometrology Traceable calibration metrological atomic force microscopy INTERFEROMETRY Nonlinearity error Step height
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Metrological framework for selecting morphological characters to identify species and estimate developmental maturity of forensically significant insect specimens
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作者 John Mark Midgley Martin Herrer Villet 《Forensic Sciences Research》 CSCD 2021年第1期75-83,共9页
Accurate age estimates of immature necrophagous insects associated with a human or animal body can provide evidence of how long the body has been dead.These estimates are based on species-specific details of the inse... Accurate age estimates of immature necrophagous insects associated with a human or animal body can provide evidence of how long the body has been dead.These estimates are based on species-specific details of the insects’aging processes,and therefore require accurate species identification and developmental stage estimation.Many professionals who produce or use identified organisms as forensic evidence have little training in taxonomy or metrology,and appreciate the availability of formalized principles and standards for biological identification.Taxonomic identifications are usually most readily and economically made using categorical and qualitative morphological characters,but it may be necessary to use less convenient and potentially more ambiguous characters that are continuous and quantitative if two candidate species are closely related,or if identifying developmental stages within a species.Characters should be selected by criteria such as taxonomic specificity and metrological repeatability and relative error.We propose such a hierarchical framework,critique various measurements of immature insects,and suggest some standard approaches to determine the reliability of organismal identifications and measurements in estimating postmortem intervals.Relevant criteria for good characters include high repeatability(including low scope for ambiguity or parallax effects),pronounced discreteness,and small relative error in measurements.These same principles apply to individuation of unique objects in general. 展开更多
关键词 orensic sciences forensic entomology identification INDIVIDUATION data types metrology measurement error REPEATABILITY
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Geographical distribution of Batrachospermaceae genera in Asia and its environmental factors
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作者 Mingyu QIU Fei WANG +5 位作者 Fangru NAN Jia FENG Junping LÜ Qi LIU Xudong LIU Shulian XIE 《Journal of Oceanology and Limnology》 SCIE CAS CSCD 2023年第3期972-990,共19页
Batrachospermaceae is an important group of freshwater red algae.Available data of the latitude,longitude,and environmental factors on Batrachospermaceae distribution in Asia were analyzed to understand the geographic... Batrachospermaceae is an important group of freshwater red algae.Available data of the latitude,longitude,and environmental factors on Batrachospermaceae distribution in Asia were analyzed to understand the geographical distribution of Batrachospermaceae genera in Asia.Statistical analyses,including one-way ANOVA,correlation analysis,stepwise regression analysis,principal component analysis,and linear discriminant analysis were conducted to characterize variation in geographical distribution and growth environment.Results reveal high variation in geographical distribution and growth environment among different Batrachospermaceae genera in Asia.Specifically,correlations between latitude and all environmental factors exclusive of altitude are significant,and longitude is significantly correlated with all environmental factors except for average relative humidity.The geographical distribution and growth environment of different Batrachospermaceae genera significantly differed.Altitude,maximum temperature,average temperature,minimum temperature,average relative humidity,average wind speed,maximum wind speed,and atmospheric pressure all contributed to explaining differences in the geographical distribution of Batrachospermaceae genera.Combining the results of correlation analysis,stepwise regression analysis,and principal component analysis,all environmental factors contributed to the different geographical distribution of Batrachospermum,Paludicola,Sheathia,Sirodotia,and Remainder(the rest),all environmental factors but atmospheric pressure contributed to the different geographical distribution of Kumanoa,and all environmental factors but average wind speed and maximum wind speed contributed to the different geographical distribution of Virescentia.However,the correlation between these significantly related environmental factors and taxa is not necessarily causative,and many other environmental factors,such as temperature,pH,conductivity,shading,current velocity,dissolved oxygen,hardness,substrata types,and nutrients etc.,are likely to have an important impact on the geographical distribution of taxa,which is an important topic for future research. 展开更多
关键词 Batrachospermaceae BIOSTATISTICS environmental factor geographical distribution METROLOGY
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Contrasting Transport Performance of Electron-and Hole-Doped Epitaxial Graphene for Quantum Resistance Metrology
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作者 万歆祎 范晓东 +5 位作者 翟昌伟 杨镇宇 郝立龙 李林 鲁云峰 曾长淦 《Chinese Physics Letters》 SCIE EI CAS CSCD 2023年第10期89-94,共6页
Epitaxial graphene grown on silicon carbide(Si C/graphene)is a promising solution for achieving a highprecision quantum Hall resistance standard.Previous research mainly focused on the quantum resistance metrology of ... Epitaxial graphene grown on silicon carbide(Si C/graphene)is a promising solution for achieving a highprecision quantum Hall resistance standard.Previous research mainly focused on the quantum resistance metrology of n-type Si C/graphene,while a comprehensive understanding of the quantum resistance metrology behavior of graphene with different doping types is lacking.Here,we fabricated both n-and p-type Si C/graphene devices via polymer-assisted molecular adsorption and conducted systematic magneto-transport measurements in a wide parameter space of carrier density and temperature.It is demonstrated that n-type devices show greater potential for development of quantum resistance metrology compared with p-type devices,as evidenced by their higher carrier mobility,lower critical magnetic field for entering quantized Hall plateaus,and higher robustness of the quantum Hall effect against thermal degeneration.These discrepancies can be reasonably attributed to the weaker scattering from molecular dopants for n-type devices,which is further supported by the analyses on the quantum interference effect in multiple devices.These results enrich our understanding of the charged impurity on electronic transport performance of graphene and,more importantly,provide a useful reference for future development of graphene-based quantum resistance metrology. 展开更多
关键词 SCATTERING DOPANT METROLOGY
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Evaluation of IoT Measurement Solutions from a Metrology Perspective
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作者 Donatien Koulla Moulla Ernest Mnkandla Alain Abran 《Computer Systems Science & Engineering》 SCIE EI 2023年第11期2455-2479,共25页
To professionally plan and manage the development and evolution of the Internet of Things(IoT),researchers have proposed several IoT performance measurement solutions.IoT performance measurement solutions can be very ... To professionally plan and manage the development and evolution of the Internet of Things(IoT),researchers have proposed several IoT performance measurement solutions.IoT performance measurement solutions can be very valuable for managing the development and evolution of IoT systems,as they provide insights into performance issues,resource optimization,predictive maintenance,security,reliability,and user experience.However,there are several issues that can impact the accuracy and reliability of IoT performance measurements,including lack of standardization,complexity of IoT systems,scalability,data privacy,and security.While previous studies proposed several IoT measurement solutions in the literature,they did not evaluate any individual one to figure out their respective measurement strengths and weaknesses.This study provides a novel scheme for the evaluation of proposed IoT measurement solutions using a metrology-coverage evaluation based on evaluation theory,metrology principles,and software measurement best practices.This evaluation approach was employed for 12 IoT measure categories and 158 IoT measurement solutions identified in a Systematic Literature Review(SLR)from 2010 to 2021.The metrology coverage of these IoT measurement solutions was analyzed from four perspectives:across IoT categories,within each study,improvement over time,and implications for IoT practitioners and researchers.The criteria in this metrology-coverage evaluation allowed for the identification of strengths and weaknesses in the theoretical and empirical definitions of the proposed IoT measurement solutions.We found that the metrological coverage varies significantly across IoT measurement solution categories and did not show improvement over the 2010–2021 timeframe.Detailed findings can help practitioners understand the limitations of the proposed measurement solutions and choose those with stronger designs.These evaluation results can also be used by researchers to improve current IoT measurement solution designs and suggest new solutions with a stronger metrology base. 展开更多
关键词 Internet of Things IoT measurement solutions software engineering measurement METROLOGY metrics
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Multimodal Climate Economy Discourse: A Case Study of the Publicity Film of “the National Low Carbon Day” in 2021 被引量:1
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作者 Xin Liu Li Fan 《Journal of Sociology Study》 2022年第4期147-159,共13页
In the era of the new media,the construction of multimodal climate economy discourse has become an effective tool to address climate change,a crucial issue of human society,which is vital to the present and future of ... In the era of the new media,the construction of multimodal climate economy discourse has become an effective tool to address climate change,a crucial issue of human society,which is vital to the present and future of human society and thus has been gaining widespread global attention.This study uses visual grammar as the theoretical framework to examine the multimodal discourse of the 2021 National Low Carbon Day publicity film.By using the analysis tools ELAN and Nvivo12,it claims that this promotional film constructs interpersonal,ideational,and textual meaning by utilizing various visual symbolic resources,such as color,perspective,and character manifestation.This study also discovers that the criteria for using cool and warm colors in this promotional film diverge from the earlier conclusions of the new visual grammar.As a result,it is suggested that color analysis should be conducted in conjunction with the actual corpus in the theoretical framework of the new visual grammar. 展开更多
关键词 new visual grammar multimodal discourse climate economy discourse metrological
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Portable and Flexible Communication Protocol Stacks for Smart Metering Projects
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作者 Axel Sikora 《Journal of Electronic Science and Technology》 CAS 2013年第1期58-65,共8页
Wireless M-Bus according to EN-13757-4 is a major contender for local metrological network (LMN) in smart metering and smart grid applications, as it holds the promise of flexible and optimized solutions. It enjoys ... Wireless M-Bus according to EN-13757-4 is a major contender for local metrological network (LMN) in smart metering and smart grid applications, as it holds the promise of flexible and optimized solutions. It enjoys wide popularity in continental Europe, but increasingly in many other regions of the world. However, Wireless M-Bus is characterized by a wide variety of different operation modes (C-, F-, N-, P-, Q-, R-, S-, and T-modes), which work in different frequency bands (i.e., 868 MHz, 433 MHz, and 169 MHz). Its application layer can be enhanced by extensions, being defined from vendor alliances, like the Open Metering System (OMS) Group, or from national bodies. 展开更多
关键词 Local metrological network software engineering Wireless M-Bus.
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Low-intensive Microwave Signals in Biology and Medicine
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作者 Oleksiy Yanenko 《Journal of Human Physiology》 2019年第1期23-35,共13页
Millimeter range signals have been widely used in biology and medicine over the 20-30 years of the last century.At this time in Ukraine have been developed and implemented treatment technologies,the main ones are mill... Millimeter range signals have been widely used in biology and medicine over the 20-30 years of the last century.At this time in Ukraine have been developed and implemented treatment technologies,the main ones are millimeter therapy(MMT),microwave resonance therapy(MRT),information-wave therapy(IWT).The features of this technologies are the use of signals in the frequency band 40-78 GHz with extremely low signal levels-10-9-10-11 W/cm2,the parameters are immanent to own communication signals of the human body.The author of the article attempts to conduct a combined analysis of hardware and software of these treatment technologies with mm-band signals.Thus the specialized equipment used for the treatment,technologies and the statistical results of its use for various diseases are considered.The problems of metrological support and measuring the weak signals of the mm range are proposed to solve by creating highly sensitive radiometric systems.The results of measurements of microwave signals of natural objects that can be used for physiotherapy and physical bodies that are in contact with or in human environment are submitted.Promising areas of the using the highly sensitive radiometric measurement equipment for research in biology and medicine are presented. 展开更多
关键词 Low-intensive MICROWAVE signal mm-band therapy metrological support Radiometric equipment
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Metrologic的美丽嬗变——访Metrologic公司全球市场部及产品研发副总裁Mark Schmidt
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作者 张玉波 《中国自动识别技术》 2007年第6期97-98,共2页
从去年原CEO宣布将要在2006年7月离职,Metrologic一直在寻找新的CEO人选,历时近一年,直到今年3月Darius Adainczyk的上任,终于让Metrologic的这次重要的人员调整初成框架。之后又经历了半年时间,如今Metrologic又招集了一大批业内... 从去年原CEO宣布将要在2006年7月离职,Metrologic一直在寻找新的CEO人选,历时近一年,直到今年3月Darius Adainczyk的上任,终于让Metrologic的这次重要的人员调整初成框架。之后又经历了半年时间,如今Metrologic又招集了一大批业内资深人士于麾下,以精兵强将的强大阵营示人。 展开更多
关键词 Metrologic公司 产品研发 全球市场 总裁 嬗变 CEO
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Performance Analysis and Evaluation of Geometric Parameters in Stereo Deflectometry 被引量:3
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作者 Yongjia Xu Feng Gao Xiangqian Jiang 《Engineering》 SCIE EI 2018年第6期806-815,共10页
This paper presents a novel geometric parameters analysis to improve the measurement accuracy of stereo deflectometry.Stereo deflectometry can be used to obtain form information for freeform specular surfaces.A measur... This paper presents a novel geometric parameters analysis to improve the measurement accuracy of stereo deflectometry.Stereo deflectometry can be used to obtain form information for freeform specular surfaces.A measurement system based on stereo deflectometry typically consists of a fringe-displaying screen,a main camera,and a reference camera.The arrangement of the components of a stereo deflectometry system is important for achieving high-accuracy measurements.In this paper,four geometric parameters of a stereo deflectometry system are analyzed and evaluated:the distance between the main camera and the measured object surface,the angle between the main camera ray and the surface normal,the distance between the fringe-displaying screen and the object,and the angle between the main camera and the reference camera.The influence of the geometric parameters on the measurement accuracy is evaluated.Experiments are performed using simulated and experimental data.The experimental results confirm the impact of these parameters on the measurement accuracy.A measurement system based on the proposed analysis has been set up to measure a stock concave mirror.Through a comparison of the given surface parameters of the concave mirror,a global measurement accuracy of 154.2 nm was achieved. 展开更多
关键词 Optical METROLOGY ERROR analysis STEREO DEFLECTOMETRY THREE-DIMENSIONAL SHAPE measurement Performance evaluation Simulation
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Fabrication and measurement of traceable pitch standard with a big area at trans-scale 被引量:4
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作者 邓晓 李同保 +4 位作者 雷李华 马艳 马蕊 翁浚婧 李源 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第9期143-147,共5页
Atom lithography with chromium can be utilized to fabricate a pitch standard, which is chrectly traceable to me wavelength of the laser standing waves. The result of a calibrated commercial AFM measurement demonstrate... Atom lithography with chromium can be utilized to fabricate a pitch standard, which is chrectly traceable to me wavelength of the laser standing waves. The result of a calibrated commercial AFM measurement demonstrates that the pitch standard is (212.8±0.1) nm with a peak-to-valley-height (PTVH) better than 20 nm. The measurement results show the high period accuracy of traceability with the standing laser wavelength (λ/2 = 212.78 nm). The Cr nano-grating covers a 1000μm×500 μm area, with a PTVH better than 10 nm. The feature width broadening of the Cr nanostructure has been experimentally observed along the direction of the standing waves. The PTVH along the Gaussian laser direction is similar to a Gaussian distribution. Highly uniform periodic nanostructures with a big area at the millimeter scale, and the surface growth uniformity of the Cr nano-grating, show its great potential in the application of a traceable pitch standard at trans-scales. 展开更多
关键词 atom lithography nano-scale metrology standard TRACEABILITY
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