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Microstructure Morphologies of Asphalt Binders using Atomic Force Microscopy 被引量:3
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作者 李波 YANG Jinyu +1 位作者 CHEN Zhanquan LI Hailian 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2016年第6期1261-1266,共6页
We investigated microstructure morphologies of three asphalts(SK, Karamay, and Esso) used in China using atomic force microscopy(AFM). The topography and phase contrast images were obtained. Topographic profile an... We investigated microstructure morphologies of three asphalts(SK, Karamay, and Esso) used in China using atomic force microscopy(AFM). The topography and phase contrast images were obtained. Topographic profile and three dimensional images were described. Roughnesses of microstructure were calculated. And the chemical compositions of asphalt were tested to explain the microstructural mechanism of the asphalt. The results show that the topography and phase image in atomic force microscopy are appropriate to evaluate the microstructure of the asphalt binder. There are significant differences in microstructural morphologies including bee-like structure, topographic profile, 3D image, and roughness for three asphalts in this study. There are three different phases in microstructure of asphalt binder. The oil source and chemical composition of asphalt, especially asphaltenes content have a great influence on the microstructure. 展开更多
关键词 pavement materials asphalt binder microstructure morphologies atomic force microscopy chemical compositions
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Theory of higher harmonics imaging in tapping-mode atomic force microscopy 被引量:1
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作者 李渊 钱建强 李英姿 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第5期213-218,共6页
The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full char... The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dynamical behaviour of tip-sample system was developed in this paper. An analytic formula was introduced to describe the relationship between time-varying tip-sample impact force and tip motion. The theoretical analysis and numerical results both show that the timevarying tip-sample impact force can be reconstructed by recording tip motion. This allows for the reconstruction of the characteristics of the tip-sample force, like contact time and maximum contact force. It can also explain the ability of AFM higher harmonics imaging in mapping stiffness and surface energy variations. 展开更多
关键词 tapping mode atomic force microscopy higher harmonics imaging
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Improvement of the high-k/Ge interface thermal stability using an in-situ ozone treatment characterized by conductive atomic force microscopy
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作者 樊继斌 程晓姣 +2 位作者 刘红侠 王树龙 段理 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第8期456-461,共6页
In this work, an in-situ ozone treatment is carried out to improve the interface thermal stability of HfO_2/Al_2O_3 gate stack on germanium(Ge) substrate. The micrometer scale level of HfO_2/Al_2O_3 gate stack on Ge... In this work, an in-situ ozone treatment is carried out to improve the interface thermal stability of HfO_2/Al_2O_3 gate stack on germanium(Ge) substrate. The micrometer scale level of HfO_2/Al_2O_3 gate stack on Ge is studied using conductive atomic force microscopy(AFM) with a conductive tip. The initial results indicate that comparing with a non insitu ozone treated sample, the interface thermal stability of the sample with an in-situ ozone treatment can be substantially improved after annealing. As a result, void-free surface, low conductive spots, low leakage current density, and relative high breakdown voltage high-κ/Ge are obtained. A detailed analysis is performed to confirm the origins of the changes.All results indicate that in-situ ozone treatment is a promising method to improve the interface properties of Ge-based three-dimensional(3D) devices in future technology nodes. 展开更多
关键词 HIGH-K conductive atomic force microscopy in-situ ozone ANNEALING
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AN ATOMIC FORCE MICROSCOPY STUDY ON THE AGGREGATION OF ISOTACTIC POLY(METHYL METHACRYLATE) 被引量:2
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作者 Jing Liu Ji-jun Wang +4 位作者 Ting Li Yong Zhou De-yan Shen Yun Huang Shou-ke Yan 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2007年第2期207-215,共9页
Aggregation process of isotactic poly(methyl methacrylate) (i-PMMA) has been studied extensively for many years, and considerable progress has been made in both experimental and theoretical studies. They are, howe... Aggregation process of isotactic poly(methyl methacrylate) (i-PMMA) has been studied extensively for many years, and considerable progress has been made in both experimental and theoretical studies. They are, however, seldom sustained by real-space observations of the underlying morphology. In this paper, the aggregation process of i-PMMA in concentrated acetone solutions and the fractal structure of the resulting three-dimensional clusters were characterized on the basis of real-space AFM observations of their two-dimensional projection. It was found that spherical multiple-chain particles formed upon collapse and aggregation of the involving chains as a whole during quenching the solution to room temperature. By keeping the solution at room temperature, the initially formed particles stick together upon contact to form larger particles through reassembling very slowly. The succeeding collision of the enlarged spherical particles leads to the formation of small clusters. These newly formed small clusters grow when they meet with other clusters or single Brownian particles. This leads to the formation of large clusters with fractal dimension of 1.95 ± 0.05, which suggest a reaction-limited cluster aggregation of i-PMMA in a concentrated acetone solution. This is in accordance with the conclusion obtained by light scattering measurements. 展开更多
关键词 Isotactic poly(methyl methacrylate) AGGREGATION Fractal dimension atomic force microscopy.
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Quantitative measurement of local elasticity of SiO_x film by atomic force acoustic microscopy 被引量:2
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作者 何存富 张改梅 吴斌 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第8期449-455,共7页
In this paper the elastic properties of SiOx film are investigated quantitatively for local fixed point and qualitatively for overall area by atomic force acoustic microscopy (AFAM) in which the sample is vibrated a... In this paper the elastic properties of SiOx film are investigated quantitatively for local fixed point and qualitatively for overall area by atomic force acoustic microscopy (AFAM) in which the sample is vibrated at the ultrasonic frequency while the sample surface is touched and scanned with the tip contacting the sample respectively for fixed point and continuous measurements. The SiOx films on the silicon wafers are prepared by the plasma enhanced chemical vapour deposition (PECVD), The local contact stiffness of the tip-SiOx film is calculated from the contact resonance spectrum measured with the atomic force acoustic microscopy. Using the reference approach, indentation modulus of SiOx film for fixed point is obtained. The images of cantilever amplitude are also visualized and analysed when the SiOx surface is excited at a fixed frequency. The results show that the acoustic amplitude images can reflect the elastic properties of the sample. 展开更多
关键词 atomic force acoustic microscopy SiOx film contact resonance frequency local elasticity
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Analysis of the injection layer of PTCDA in OLEDs using x-ray photoemission spectroscopy and atomic force microscopy 被引量:2
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作者 欧谷平 宋珍 +2 位作者 吴有余 陈小强 张福甲 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第6期1296-1300,共5页
Through the investigation of the sample surface and interface of 3, 4, 9, 10-perylenetetracarboxylic dianhydride (PTCDA)/indium-tin-oxide (ITO) thin films using atomic force microscopy, it has been found that the ... Through the investigation of the sample surface and interface of 3, 4, 9, 10-perylenetetracarboxylic dianhydride (PTCDA)/indium-tin-oxide (ITO) thin films using atomic force microscopy, it has been found that the surface is complanate, the growth is uniform and the defects cover basically the surface of ITO. Furthermore, the number of pinholes is small. The analysis of the sample surface and interface further verifies this result by using x-ray photoemission spectroscopy. At the same time, PTCDA is found to have the ability of restraining the diffusion of chemical constituents from ITO to the hole transport layer, which is beneficial to the improvement of the performance and the useful lifetime of the organic light emitting diodes (OLEDs). 展开更多
关键词 atomic force microscopy x-ray photoemission spectroscopy PTCDA/ITO
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Effect of Rho-kinase pathway on neurite outgrowth of rat hippocampal neurons under atomic force microscopy 被引量:1
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作者 Jing Chen Hu Hao +2 位作者 Guoqing Guo Sitao Li Xin Xiao 《Neural Regeneration Research》 SCIE CAS CSCD 2012年第7期496-500,共5页
Hippocampal neurons of neonatal rats were cultured in serum-free culture medium for 5 days in vitro, and treated with the Rho-kinase inducer lysophosphatidic acid. Atomic force microscopy revealed that the numbers of ... Hippocampal neurons of neonatal rats were cultured in serum-free culture medium for 5 days in vitro, and treated with the Rho-kinase inducer lysophosphatidic acid. Atomic force microscopy revealed that the numbers of level-1, -2 and -3 neurites protruding from rat hippocampal neurons was significantly reduced. After treatment with the Rho kinase inhibitor Y27632, a significant increase in the numbers of these neurites was observed. Our experimental findings indicate that the Rho-kinase pathway is closely associated with the neurites of hippocampal neurons. 展开更多
关键词 atomic force microscopy RHO-KINASE nerve cells NEURITES HIPPOCAMPUS rats neural regeneration
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Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy 被引量:1
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作者 张勇 王业亮 +1 位作者 阙炎德 高鸿钧 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第7期40-43,共4页
An efficient method based on atomic force microscopy(AFM) has been developed to characterize silicon intercalated graphene grown on single crystalline Ir(111) thin films. By combining analyses of the phase image, ... An efficient method based on atomic force microscopy(AFM) has been developed to characterize silicon intercalated graphene grown on single crystalline Ir(111) thin films. By combining analyses of the phase image, force curves,and friction–force mapping, acquired by AFM, the locations and coverages of graphene and silicon oxide can be well distinguished. We can also demonstrate that silicon atoms have been successfully intercalated between graphene and the substrate. Our method gives an efficient and simple way to characterize graphene samples with interacted atoms and is very helpful for future applications of graphene-based devices in the modern microelectronic industry, where AFM is already widely used. 展开更多
关键词 GRAPHENE SILICON INTERCALATION atomic force microscopy
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Effects of caveolin-1 on bone marrow mesenchymal stem cells differentiating into neuron-like cells An atomic force microscopy observation 被引量:1
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作者 Jingjing Lu Lijun Jing Yonglin Jia Jinyi Li Liudong Wang Tao Peng Yanjie Jia 《Neural Regeneration Research》 SCIE CAS CSCD 2011年第16期1227-1231,共5页
Bone marrow mesenchymal stem cells (MSCs) from rats were transfected with Rn-siRNA-caveolin-1 and differentiated into neuron-like cells using fasudil hydrochloride. Membrane ultrastructural changes in MSCs were obse... Bone marrow mesenchymal stem cells (MSCs) from rats were transfected with Rn-siRNA-caveolin-1 and differentiated into neuron-like cells using fasudil hydrochloride. Membrane ultrastructural changes in MSCs were observed under atomic force microscopy. Caveolin-l-transfected rat MSCs exhibited weak nuclear refraction, dense caveolae and long finger-like cellular processes prior to fasudil hydrochloride treatment. MSCs differentiating into neuron-like cells exhibited weak nuclear refraction and large cellular processes without caveolae. We hypothesize that caveolin-1 plays an important role in the regulation of bone marrow MSC differentiating into neuron-like cells. 展开更多
关键词 atomic force microscopy bone marrow mesenchymal stem cells CAVEOLIN-1 neurons differentiation neural regeneration
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Investigation of Adsorption of Xanthan Gum on Enamel by Tapping Mode Atomic Force Microscopy 被引量:1
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作者 LIHao-ying 《Chemical Research in Chinese Universities》 SCIE CAS CSCD 2004年第4期501-503,共3页
By using tapping mode atomic force microscopy(TMAFM), a polymer layer was found on the enamel surface after the exposure to xanthan gum solutions. The layer thickness is closely related to the exposure time and the co... By using tapping mode atomic force microscopy(TMAFM), a polymer layer was found on the enamel surface after the exposure to xanthan gum solutions. The layer thickness is closely related to the exposure time and the concentration of xanthan gum solution. The thickness data were evaluated by a Kruskal-Wallis test and Box-Whisker Plot at a 95% confidence level(p<0.05), and a statistically significant difference among the thickness data groups was demonstrated. After the exposure to 1000, 400, 100 mg/L xanthan gum solutions, the mean of layer thickness at the adsorption equilibrium is in the ranges of 103.5_122.06, 82.4_88.94 and 45.27_55.55 nm, respectively. This phenomenon suggests that the viscosity modifying agents in the beverage might be adsorbed on the enamel surface during consumption, which may form a barrier that can protect the enamel from being attacked by acid and therefore reduce dental erosion. 展开更多
关键词 atomic force microscopy(AFM) Vertical distance Xanthan gum ENAMEL
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A Study of the Probe Effect on the Apparent Image of Biological Atomic Force Microscopy 被引量:1
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作者 Xue Mei WANG Lei QIN +1 位作者 Long BA Zu Hong LU 《Chinese Chemical Letters》 SCIE CAS CSCD 2001年第12期1113-1114,共2页
关键词 atomic force microscopy (AFM) ABSORPTION DNA recognition
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Environmental temperature effect on dimensional measurements of atomic force microscopy 被引量:1
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作者 Chengfu Ma Yuhang Chen Wenhao Huang 《Nanotechnology and Precision Engineering》 CAS CSCD 2021年第2期20-24,共5页
Atomic force microscopy(AFM)is increasingly being used as a fundamental tool for dimensional measurements at the nanoscale in the laboratory and in industry.Since the environmental temperature is not controlled in man... Atomic force microscopy(AFM)is increasingly being used as a fundamental tool for dimensional measurements at the nanoscale in the laboratory and in industry.Since the environmental temperature is not controlled in many measurements,or is even varied on purpose,quantification of its effects on AFM dimensional measurements is needed.In this paper,the influences of the temperature in the entire environment of the AFM(excluding only the controller and computer)and that in the local environment around the tip–sample are investigated.The results show that lateral dimensional measurements are affected mainly by the entire environmental temperature.However,vertical measurements are influenced by the temperature of both the entire environment and the local environment.The effects become significant for temperatures higher than some threshold,here between 35 and 40 XC. 展开更多
关键词 atomic force microscopy Environmental temperature Dimensional measurement PITCH HEIGHT
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Effects of Environments on the Noise of Atomic Force Microscopy Cantilevers 被引量:1
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作者 Hongyu Ju Song Zhang Shuxun Cui 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2020年第4期1-7,共7页
Thermal vibration of the cantilevers is the main source of noise in atomic force microscopy(AFM).When immersed in liquids,the dynamic behavior of the cantilevers will be significantly affected by the environment.In th... Thermal vibration of the cantilevers is the main source of noise in atomic force microscopy(AFM).When immersed in liquids,the dynamic behavior of the cantilevers will be significantly affected by the environment.In this study,the effects of environments on the noise of AFM were investigated.The results show that the V⁃shaped cantilever exhibited very low noise in high vacuum.The noise in atmospheric environment was also satisfactory.In liquid environments,the noise dramatically increased.The systematic noise was low and dependent on the distance between the tip and substrate.As the velocity increased,the noise of V⁃shaped cantilever was increased in a similar trend.It is also found that the variation trend was more pronounced as the liquid viscosity increased.The noise of rectangular cantilever was lower than that of V⁃shaped cantilever in the same environment.The present study indicates that high vacuum is an ideal environment for single molecule force spectroscopy(SMFS)due to the lower noise and higher resolution.For a better signal⁃to⁃noise ratio,both the cantilever velocity and liquid viscosity should be as low as possible.These results will be helpful when a lower noise is desired in weak force detection. 展开更多
关键词 atomic force microscopy CANTILEVER noise high vacuum VISCOSITY
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Elucidation and Identification of Double-Tip Effects in Atomic Force Microscopy Studies of Biological Structures 被引量:1
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作者 Yong Chen 《Journal of Surface Engineered Materials and Advanced Technology》 2012年第3期238-247,共10页
While atomic force microscopy (AFM) has been increasingly applied to life science, artifactual measurements or images can occur during nanoscale analyses of cell components and biomolecules. Tip-sample convolution eff... While atomic force microscopy (AFM) has been increasingly applied to life science, artifactual measurements or images can occur during nanoscale analyses of cell components and biomolecules. Tip-sample convolution effect is the most common mechanism responsible for causing artifacts. Some deconvolution-based methods or algorithms have been developed to reconstruct the specimen surface or the tip geometry. Double-tip or double-probe effect can also induce artifactual images by a different mechanism from that of convolution effect. However, an objective method for identifying the double-tip/probe-induced artifactual images is still absent. To fill this important gap, we made use of our expertise of AFM to analyze artifactual double-tip images of cell structures and biomolecules, such as linear DNA, during AFM scanning and imaging. Mathematical models were then generated to elucidate the artifactual double-tip effects and images develop during AFM imaging of cell structures and biomolecules. Based on these models, computational formulas were created to measure and identify potential double-tip AFM images. Such formulas proved to be useful for identification of double-tip images of cell structures and DNA molecules. The present studies provide a useful methodology to evaluate double-tip effects and images. Our results can serve as a foundation to design computer-based automatic detection of double-tip AFM images during nanoscale measuring and imaging of biomolecules and even non-biological materials or structures, and then personal experience is not needed any longer to evaluate artifactual images induced by the double-tip/probe effect. 展开更多
关键词 NANOBIOTECHNOLOGY atomic force microscopy (AFM) Double-Tip ARTIFACT Biological SPECIMENS Linear DNA
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IMPROVED FABRICATION METHOD FOR CARBON NANOTUBE PROBE OF ATOMIC FORCE MICROSCOPY(AFM) 被引量:1
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作者 XU Zongwei DONG Shen +1 位作者 GUO Liqiu ZHAO Qingliang 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第3期373-375,共3页
An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig... An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication's difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe. 展开更多
关键词 Carbon nanotube (CNT) atomic force microscope (AFM) Probe Fabrication
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Monitoring film coalescence from aqueous polymeric dispersions using atomic force microscopy: Surface topographic and nano-adhesion studies
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作者 Ziyi Yang Duncan QMCraig 《Asian Journal of Pharmaceutical Sciences》 SCIE CAS 2020年第1期104-111,共8页
The aim of the investigation was to develop the use of topographic and nano-adhesion atomic force microscopy(AFM) studies as a means of monitoring the coalescence of latex particles within films produced from a pharma... The aim of the investigation was to develop the use of topographic and nano-adhesion atomic force microscopy(AFM) studies as a means of monitoring the coalescence of latex particles within films produced from a pharmaceutically relevant aqueous dispersion(Eudragit~?NE30 D). Films were prepared via spin coating and analysed using AFM, initially via tapping mode for topographic assessment followed by force-distance measurements which allowed assessment of site-specific adhesion. The results showed that colloidal particles were clearly observed topographically in freshly prepared samples, with coalescence detected on curing via the disappearance of discernible surface features and a decrease in roughness indices. The effects of temperature and humidity on film curing were also studied, with the former having the most pronounced effect. AFM force measurements showed that the variation in adhesive force reduced with increasing curing time, suggesting a novel method of quantifying the rate of film formation upon curing. It was concluded that the AFM methods outlined in this study may be used as a means of qualitatively and quantitatively monitoring the curing of pharmaceutical films as a function of time and other variables, thereby facilitating rational design of curing protocols. 展开更多
关键词 FILM curing atomic force microscopy Spin coating AQUEOUS dispersion AFM pull-off force measurement
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Morphological changes of doxorubicin-loaded liposomes observed by atomic force microscopy
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作者 Naoki Takahashi Keisuke Ueda +1 位作者 Kenjirou Higashi Keiji Yamamoto 《Asian Journal of Pharmaceutical Sciences》 SCIE CAS 2016年第1期60-61,共2页
Liposomes, closed vesicles composed of lipid bilayers, have been widely used as pharmaceutical carriers. Liposomal formulations containing doxorubicin (DOX) of an anticancer drug are developed to reduce toxic side eff... Liposomes, closed vesicles composed of lipid bilayers, have been widely used as pharmaceutical carriers. Liposomal formulations containing doxorubicin (DOX) of an anticancer drug are developed to reduce toxic side effects and to improve drug accumulation at tumor tissues. An encapsulation of DOX into the inner water phase of liposomes results in the formations of fibrous DOX bundles and the elongation of the liposomes [1].In this study, atomic force microscopy (AFM). 展开更多
关键词 LIPOSOME DOXORUBICIN atomic force microscopy
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Adaptive semi-empirical model for non-contact atomic force microscopy
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作者 陈曦 童君开 胡智鑫 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第8期682-687,共6页
Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution.Here we propose a new approach to estimate the interaction between its tips and samples,which combine... Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution.Here we propose a new approach to estimate the interaction between its tips and samples,which combines a semi-empirical model with density functional theory(DFT)calculations.The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO,Cu,CuCl,and CuO_(x)tips.This approach achieves accuracy close to DFT calculation with much lower computational cost. 展开更多
关键词 semi-empirical model atomic force microscopy density functional theory functionalized tips
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Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy
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作者 Dmitry Filatov Dmitry Antonov +2 位作者 Ivan Antonov Alexander Kasatkin Oleg Gorshkov 《Journal of Materials Science and Chemical Engineering》 2017年第1期8-14,共7页
We have applied Conductive Atomic Force Microscopy (CAFM) to study the microscopic mechanism of resistive switching in the ultrathin (3 - 5 nm) yttria stabilized zirconia (YSZ) films. Using CAFM, we were able to trace... We have applied Conductive Atomic Force Microscopy (CAFM) to study the microscopic mechanism of resistive switching in the ultrathin (3 - 5 nm) yttria stabilized zirconia (YSZ) films. Using CAFM, we were able to trace the growth of the individual conductive filaments, which are considered now to be responsible for the resistive switching effect in the transition metal oxides. The growth of the filaments has been proven to be initiated by the defects in the film material including the ones, which are the concentrators of the electric field, in particular, by the roughness (hillocks) of the film/substrate interface. The electron transport via individual filaments has been studied. Besides the butterfly-type hysteresis in the current-voltage (I-V) curves of the probe- to-sample contact typical for the bipolar resistive switching, we have observed the I-V curves with resonant peaks attributed to the resonant electron tunneling via the localized electron states in the filaments. 展开更多
关键词 Resistive Switching YTTRIA STABILIZED ZIRCONIA CONDUCTIVE atomic force microscopy
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Nanoparticle Charge in Fluid from Atomic Force Microscopy Forces within the Nonlinear Poisson-Boltzmann Equation
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作者 Fredy R. Zypman 《Journal of Applied Mathematics and Physics》 2018年第6期1315-1323,共9页
We consider the problem of measuring the electric charge of nanoparticles immersed in a fluid electrolyte. We develop a mathematical framework based on the solution of the nonlinear Poisson-Boltzmann equation to obtai... We consider the problem of measuring the electric charge of nanoparticles immersed in a fluid electrolyte. We develop a mathematical framework based on the solution of the nonlinear Poisson-Boltzmann equation to obtain interaction forces between nanoparticles immersed in a fluid electrolyte and an Atomic Force Microscopy micro spherical probe. This force-separation information is shown explicitly to depend on the charge of the nanoparticle.? This method overcomes the statistical nature of extant methods and renders a charge value for an individual single nanoparticle. 展开更多
关键词 NONLINEAR Differential Equations POISSON-BOLTZMANN equation atomic force microscopy COLLOIDAL Interaction DEBYE Length
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