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Novel mixed-voltage I/O buffer with thin-oxide CMOS transistors
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作者 俞波 王源 +1 位作者 贾嵩 张钢刚 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第7期83-85,共3页
This paper presents a novel mixed-voltage I/O buffer without an extra dual-oxide CMOS process.This mixed-voltage I/O buffer with a simplified circuit scheme can overcome the problems of leakage current and gateoxide r... This paper presents a novel mixed-voltage I/O buffer without an extra dual-oxide CMOS process.This mixed-voltage I/O buffer with a simplified circuit scheme can overcome the problems of leakage current and gateoxide reliability that the conventional CMOS I/O buffer has.The design is realized in a 0.13-μm CMOS process and the simulation results show a good performance increased by ~34% with respect to the product of power consumption and speed. 展开更多
关键词 mixed-voltage I/O buffer multi-power domain thin-oxide CMOS
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