With the development of manufacture technology, the multi-level cell(MLC)technique dramatically increases the storage density of NAND flash memory. As the result,cell-to-cell interference(CCI) becomes more serious and...With the development of manufacture technology, the multi-level cell(MLC)technique dramatically increases the storage density of NAND flash memory. As the result,cell-to-cell interference(CCI) becomes more serious and hence causes an increase in the raw bit error rate of data stored in the cells.Recently, low-density parity-check(LDPC)codes have appeared to be a promising solution to combat the interference of MLC NAND flash memory. However, the decoding complexity of the sum-product algorithm(SPA) is extremely high. In this paper, to improve the accuracy of the log likelihood ratio(LLR) information of each bit in each NAND flash memory cell, we adopt a non-uniform detection(N-UD) which uses the average maximum mutual information to determine the value of the soft-decision reference voltages.Furthermore, with an aim to reduce the decoding complexity and improve the decoding performance, we propose a modified soft reliabilitybased iterative majority-logic decoding(MSRBI-MLGD) algorithm, which uses a non-uniform quantizer based on power function to decode LDPC codes. Simulation results show that our design can offer a desirable trade-off between the performance and complexity for high-column-weight LDPC-coded MLC NAND flash memory.展开更多
为了提高MLC NAND Flash的抗误码性能,该文提出一种基于优化缩短极化码的MLC NAND Flash差错控制方法。优化缩短极化码通过优化删减图样得到,首先通过比特翻转重排序的方式得到基本删减图样,进而选择具有更低信道容量的冻结比特组成优...为了提高MLC NAND Flash的抗误码性能,该文提出一种基于优化缩短极化码的MLC NAND Flash差错控制方法。优化缩短极化码通过优化删减图样得到,首先通过比特翻转重排序的方式得到基本删减图样,进而选择具有更低信道容量的冻结比特组成优化删减图样,使得到的删减比特全为冻结比特,可以显著提高删减算法的纠错性能。同时,根据MLC单元错误的不对称性,采用码率自适应的码字对FLASH中MSB和LSB进行不等错误保护。仿真结果表明:当误帧率为310-时,优化缩短极化码较相同码长的LDPC码和基本缩短极化码分别约有3.72~5.89 d B和1.47~3.49 d B增益;相比基于同一码率的优化缩短极化码方案,不等错误保护的差错控制方案获得约0.25 d B增益。展开更多
为了进一步提升多级存储单元的纠错性能,提出了一种基于多级存储单元阈值电压分布的Polar码优化设计方法。针对多级存储单元的固有特性,该方法迭代计算各存储单元比特的巴氏参数值优化设计Polar码。分析了不同构造方法对多级存储单元闪...为了进一步提升多级存储单元的纠错性能,提出了一种基于多级存储单元阈值电压分布的Polar码优化设计方法。针对多级存储单元的固有特性,该方法迭代计算各存储单元比特的巴氏参数值优化设计Polar码。分析了不同构造方法对多级存储单元闪存性能的影响,并与文中所构造的Polar码和系统Polar码在多级存储单元信道中的性能进行了比较。仿真结果表明:在多级存储单元信道中,当误码率为10^(-5)时,本文所构造的Polar码与高斯信道下经典巴氏参数法构造的Polar码相比可获得约2 d B增益;当信噪比为21 d B时,与蒙特卡罗法构造的Polar码相比,文中设计的系统Polar码的误码率可提升2个数量级。展开更多
Utilizing commercial off-the-shelf(COTS) components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper ...Utilizing commercial off-the-shelf(COTS) components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check(LDPC) coding scheme for improving the reliability of multi-level-cell(MLC) NAND Flash memory in radiation environments. Firstly, based on existing physical experiment works, we introduce a new error model for heavyion irradiations; secondly, we explore the optimization of writing voltage allocation to maximize the capacity of the storage channel; thirdly, we design the degree distribution of LDPC codes that is specially suitable for the proposed model; finally, we propose a joint detection-decoding scheme based on LDPC codes, which estimates the storage channel state and executes an adaptive log-likelihood ratio(LLR) calculation to achieve better performance. Simulation results show that, compared with the conventional LDPC coding scheme, the proposed scheme may almost double the lifetime of the MLC NAND Flash memory in radiation environments.展开更多
基金supported in part by the NSF of China (61471131, 61771149, 61501126)NSF of Guangdong Province 2016A030310337+1 种基金the open research fund of National Mobile Communications Research Laboratory, Southeast University (No. 2018D02)the Guangdong Province Universities and Colleges Pearl River Scholar Funded Scheme (2017-ZJ022)
文摘With the development of manufacture technology, the multi-level cell(MLC)technique dramatically increases the storage density of NAND flash memory. As the result,cell-to-cell interference(CCI) becomes more serious and hence causes an increase in the raw bit error rate of data stored in the cells.Recently, low-density parity-check(LDPC)codes have appeared to be a promising solution to combat the interference of MLC NAND flash memory. However, the decoding complexity of the sum-product algorithm(SPA) is extremely high. In this paper, to improve the accuracy of the log likelihood ratio(LLR) information of each bit in each NAND flash memory cell, we adopt a non-uniform detection(N-UD) which uses the average maximum mutual information to determine the value of the soft-decision reference voltages.Furthermore, with an aim to reduce the decoding complexity and improve the decoding performance, we propose a modified soft reliabilitybased iterative majority-logic decoding(MSRBI-MLGD) algorithm, which uses a non-uniform quantizer based on power function to decode LDPC codes. Simulation results show that our design can offer a desirable trade-off between the performance and complexity for high-column-weight LDPC-coded MLC NAND flash memory.
文摘为了提高MLC NAND Flash的抗误码性能,该文提出一种基于优化缩短极化码的MLC NAND Flash差错控制方法。优化缩短极化码通过优化删减图样得到,首先通过比特翻转重排序的方式得到基本删减图样,进而选择具有更低信道容量的冻结比特组成优化删减图样,使得到的删减比特全为冻结比特,可以显著提高删减算法的纠错性能。同时,根据MLC单元错误的不对称性,采用码率自适应的码字对FLASH中MSB和LSB进行不等错误保护。仿真结果表明:当误帧率为310-时,优化缩短极化码较相同码长的LDPC码和基本缩短极化码分别约有3.72~5.89 d B和1.47~3.49 d B增益;相比基于同一码率的优化缩短极化码方案,不等错误保护的差错控制方案获得约0.25 d B增益。
文摘为了进一步提升多级存储单元的纠错性能,提出了一种基于多级存储单元阈值电压分布的Polar码优化设计方法。针对多级存储单元的固有特性,该方法迭代计算各存储单元比特的巴氏参数值优化设计Polar码。分析了不同构造方法对多级存储单元闪存性能的影响,并与文中所构造的Polar码和系统Polar码在多级存储单元信道中的性能进行了比较。仿真结果表明:在多级存储单元信道中,当误码率为10^(-5)时,本文所构造的Polar码与高斯信道下经典巴氏参数法构造的Polar码相比可获得约2 d B增益;当信噪比为21 d B时,与蒙特卡罗法构造的Polar码相比,文中设计的系统Polar码的误码率可提升2个数量级。
基金supported by the National Basic Research Project of China(973)(2013CB329006)National Natural Science Foundation of China(NSFC,91538203)the new strategic industries development projects of Shenzhen City(JCYJ20150403155812833)
文摘Utilizing commercial off-the-shelf(COTS) components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check(LDPC) coding scheme for improving the reliability of multi-level-cell(MLC) NAND Flash memory in radiation environments. Firstly, based on existing physical experiment works, we introduce a new error model for heavyion irradiations; secondly, we explore the optimization of writing voltage allocation to maximize the capacity of the storage channel; thirdly, we design the degree distribution of LDPC codes that is specially suitable for the proposed model; finally, we propose a joint detection-decoding scheme based on LDPC codes, which estimates the storage channel state and executes an adaptive log-likelihood ratio(LLR) calculation to achieve better performance. Simulation results show that, compared with the conventional LDPC coding scheme, the proposed scheme may almost double the lifetime of the MLC NAND Flash memory in radiation environments.
