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Photoelectrochemical behavior,XPS and Auger of n-In_2S_3
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作者 SUN,Gong-Quan TAN,Zheng Changchun Institute of Applied Chemistry,Chinese Academy of Sciences,Changchun 130022 《Chinese Journal of Chemistry》 SCIE CAS CSCD 1992年第2期138-142,共0页
n-In_2S_3 has been prepared by CVT method.The photoelectrochemical behavior of n- In_2S_3 in a polysulfide redox solution was investigated.It was found that photoetching remarkably increased the fill factor.The maximu... n-In_2S_3 has been prepared by CVT method.The photoelectrochemical behavior of n- In_2S_3 in a polysulfide redox solution was investigated.It was found that photoetching remarkably increased the fill factor.The maximum quantum efficiency of carrier collection reached 95% after 12h irradiation at 100 mW/cm^2 at an applied potential of+1.2V.XPS and Auger analysis were carried out for examining surface and bulk concentration.The photoetching effect could be satisfactorily explained. 展开更多
关键词 In Photoelectrochemical behavior XPs and Auger of n-in2s3 XPs
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