Nano-moiré method presented in this paper is an experimental technique which allows direct measurement of nanoscopic mechanical parameters, such as displacement, strain and dislocation distribution. The basic ide...Nano-moiré method presented in this paper is an experimental technique which allows direct measurement of nanoscopic mechanical parameters, such as displacement, strain and dislocation distribution. The basic idea is the formation of moiré fringes when a HREM (high resolution electron microscopy) image of crystal material is superimposed with a unidirectional grating. Fourier filtering technique is used to increase the contrast of fringes and to multiple the fringes. This method has atom-size sensitivity and spatial resolution, and relatively large range. It provides a new experimental technique with very high sensitivity and spatial resolution for nanomechanics.展开更多
Using the nano-moiré method, we measure the near tip nanoscopic deformation on the [111] plane of single crystal silicon with a loaded quasi-cleavage crack running in the [110] direction. The measured strain dist...Using the nano-moiré method, we measure the near tip nanoscopic deformation on the [111] plane of single crystal silicon with a loaded quasi-cleavage crack running in the [110] direction. The measured strain distribution ahead of the crack tip agrees with the linear elastic fracture mechanics prediction up to 10 nm from the crack tip. Dislocations of Peierls type are detected and they extend from the crack tip over a length of hundreds of Burgers vectors.展开更多
基金The project supported by the National Natural Science Foundation of China
文摘Nano-moiré method presented in this paper is an experimental technique which allows direct measurement of nanoscopic mechanical parameters, such as displacement, strain and dislocation distribution. The basic idea is the formation of moiré fringes when a HREM (high resolution electron microscopy) image of crystal material is superimposed with a unidirectional grating. Fourier filtering technique is used to increase the contrast of fringes and to multiple the fringes. This method has atom-size sensitivity and spatial resolution, and relatively large range. It provides a new experimental technique with very high sensitivity and spatial resolution for nanomechanics.
文摘Using the nano-moiré method, we measure the near tip nanoscopic deformation on the [111] plane of single crystal silicon with a loaded quasi-cleavage crack running in the [110] direction. The measured strain distribution ahead of the crack tip agrees with the linear elastic fracture mechanics prediction up to 10 nm from the crack tip. Dislocations of Peierls type are detected and they extend from the crack tip over a length of hundreds of Burgers vectors.
