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Clustering study in Eu(DBM)_3Phen-doped polymer optical fibers by optical properties and near-field scanning microscopy
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作者 郑志强 明海 +1 位作者 孙晓红 谢建平 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第10期605-607,共3页
The clusters of Eu^3+ ion in Eu(DBM)3Phen-doped polymethyl methacrylate (PMMA) have been studied by three means. The relative fluorescence intensity ratio of the ^5D0 → ^7F2 to ^5D0 → ^7F1 transitions with diff... The clusters of Eu^3+ ion in Eu(DBM)3Phen-doped polymethyl methacrylate (PMMA) have been studied by three means. The relative fluorescence intensity ratio of the ^5D0 → ^7F2 to ^5D0 → ^7F1 transitions with different concentrations of Eu^3+ in Eu(DBM)3Phen-doped PMMA and metastable-state (^5D0) lifetime dependence on Eu^3+ concentration axe analyzed. The analysis indicates that there axe no clustering effects in Eu^3+ ions of Eu(DBM)3Phen-doped PMMA when the Eu^3+ doping concentration is up to 1.0 wt.-%. At the same time, the clustering effect has not been observed by the scanning neax-field optical microscopy (SNOM) in Eu(DBM)3Phen-doped PMMA with 1.0 wt.-% of Eu^3+ ions. The analysis reveals that a high concentration of Eu^3+ can be incorporated into polymer optical fiber (POF) without clustering effect. 展开更多
关键词 Concentration (process) Doping (additives) Fluorescence near field scanning optical microscopy optical properties POLYMERS Polymethyl methacrylates
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Laser synthesis and functionalization of nanostructures
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作者 Costas P Grigoropoulos 《International Journal of Extreme Manufacturing》 2019年第1期38-50,共13页
This article summarizes work at the Laser Thermal Laboratory and discusses related studies on the laser synthesis and functionalization of semiconductor nanostructures and two-dimensional(2D)semiconductor materials.Re... This article summarizes work at the Laser Thermal Laboratory and discusses related studies on the laser synthesis and functionalization of semiconductor nanostructures and two-dimensional(2D)semiconductor materials.Research has been carried out on the laser-induced crystallization of thin films and nanostructures.The in situ transmission electron microscopy(TEM)monitoring of the crystallization of amorphous precursors in nanodomains is discussed herein.The directed assembly of silicon nanoparticles and the modulation of their optical properties by phase switching is presented.The vapor-liquid-solid mechanism has been adopted as a bottom-up approach in the synthesis of semiconducting nanowires(NWs).In contrast to furnace heating methods,laser irradiation offers high spatial selectivity and precise control of the heating mechanism in the time domain.These attributes enabled the investigation of NW nucleation and the early stage of nanostructure growth.Site-and shape-selective,on-demand direct integration of oriented NWs was accomplished.Growth of discrete silicon NWs with nanoscale location selectivity by employing near-field laser illumination is also reported herein.Tuning the properties of 2D transition metal dichalcogenides(TMDCs)by modulating the free carrier type,density,and composition can offer an exciting new pathway to various practical nanoscale electronics.In situ Raman probing of laser-induced processing of TMDC flakes was conducted in a TEM instrument. 展开更多
关键词 laser nanofabrication laser crystallization nanowire growth near field scanning optical microscopy transition metal dichalcogenides
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Distance dependence of atomic-resolution near-field imaging on α-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip
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作者 Junsuke Yamanishi Takashi Tokuyama +2 位作者 Yoshitaka Naitoh Yan Jun Li Yasuhiro Sugawara 《Nano Research》 SCIE EI CAS CSCD 2016年第2期530-536,共7页
Recently, we achieved atomic-resolution optical imaging with near-field scanning optical microscopy using photon-induced force detection. In this technique, the surface photovoltage of the silicon-tip apex induced by ... Recently, we achieved atomic-resolution optical imaging with near-field scanning optical microscopy using photon-induced force detection. In this technique, the surface photovoltage of the silicon-tip apex induced by the optical near field on the surface is measured as the electrostatic force. We demonstrated atomicresolution imaging of the near field on the α-Al2O3 (0001) surface of a prism. We investigated the spatial distribution of the near field by scanning at different tip-sample distances and found that the atomic corrugation of the near-field signal was observed at greater distances than that of the atomic force microscopy signal. As the tip-sample distance increased, the normalized signal-to-noise ratio of the near field is in a gradual decline almost twice that of the frequency shift (Δf). 展开更多
关键词 near-field scanning optical microscopy near field surface photovoltage ci-Al2O3 (0001) force detection
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