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Design and Fabrication of Novel Dual-Base Negative-Differential-Resistance Heterojunction Bipolar Transistor
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作者 齐海涛 郭维廉 +2 位作者 张世林 梁惠来 毛陆虹 《Transactions of Tianjin University》 EI CAS 2005年第5期327-331,共5页
Based on planar Si dual-base transistor conception, a novel mesa dual-base heterojunc- tion bipolar transistor ( HBT) is designed and fabricated. Molecule beam extension. selective wet chemical etching, common contact... Based on planar Si dual-base transistor conception, a novel mesa dual-base heterojunc- tion bipolar transistor ( HBT) is designed and fabricated. Molecule beam extension. selective wet chemical etching, common contact photolithography and metal lift-off technique are adopted in the process. The device has particular and distinct voltage-controlled negative differential resistance (NDR) and photo-controlled NDR. The highest peak-to-vally current rate of the voltage-controlled NDR is larger than 148 and the peak current varies with the increase of collector voltage. The device features high speed and high frequency characteristics derived from HBT and intrinsic bistability and self-latching characteristics due to NDR. A single dual-base HBT can be seen as an integration of NDR device, HBT and photoconductive device. Compared with common HBT.the groove is the key factor producing NDR. 展开更多
关键词 heterojunction bipolar transistor: dual-base transistor: voltage-controlled negative-differential-resistance- photo-controlled negative-differential-resistance peak-valley currentrate
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