A spectrophotometric approach for the detection of non-ionic surfactant (Triton X-100) has been proposed in this paper. This method does not involve extraction of the ion-associate with harmful solvents, but employs a...A spectrophotometric approach for the detection of non-ionic surfactant (Triton X-100) has been proposed in this paper. This method does not involve extraction of the ion-associate with harmful solvents, but employs adhesion of the ion-association of potassium/non-ionic surfactants complex and tetraphenylporphyrin tetrasulfonic acid obtained by vigorous shaking. The adhered ion-associate was dissolved with water and its absorbance was measured. The sensitivity for Triton X-100 was determined to be 0.146 (expressed as absorbance of 1 mg/L solution). The adhesion tendency of ion-associate was found to be dependent on the water contact angle, which in turn was influenced by a high adhesion of the ion-associate and by low blank values. In this respect, a tetrafluo-roethylene vessel was found to be the most suitable for the detection of non-ionic surfactants. This spectrophotometrical method is simply and rapidly performed by a procedure based on mechanical shaking and can be employed to detect non-ionic surfactants containing more than 7 polyethylene oxide units.展开更多
Extraction behavior of chlorpromazine hydrochloride (CPZ) and procaine hydro- chloride (PCN) in the system described in the title was studied. Research shows that the extraction efficiency of CPZ can amount to 96% by...Extraction behavior of chlorpromazine hydrochloride (CPZ) and procaine hydro- chloride (PCN) in the system described in the title was studied. Research shows that the extraction efficiency of CPZ can amount to 96% by twice extraction, while that of PCN is 77%. This system produces the distribution coefficients (KD) of 12.3 and 2.6 respectively for CPZ and PCN. Extraction mechanism is deduced according to ultraviolet and molecular fluorescence spectra variation of the drugs in the system studied.展开更多
The ONP neutral deinking performances of fatty alcohol polyoxyethylene ether with different EO value were investigated in this paper. Meanwhile, the synergistic effects of different non-ionic surfactants, the co-opera...The ONP neutral deinking performances of fatty alcohol polyoxyethylene ether with different EO value were investigated in this paper. Meanwhile, the synergistic effects of different non-ionic surfactants, the co-operation of non-ionic surfactants with anionic surfactants,and the effects of different salts added into the above two systems on deinkability were also studied. The results showed the deinking performance of A7 was good. But the synergistic effect of A7 and A4 was better. In addition, the accession of salt W2 could improve the deinking efficiency, and the brightness of the deinked pulp was 1.0%ISO higher than that of A7 and A4.展开更多
The effect of a non-ionic surfactant on particles removal in post-CMP cleaning was investigated. By changing the concentration of the non-ionic surfactant, a series of experiments were performed on the 12 inch Cu patt...The effect of a non-ionic surfactant on particles removal in post-CMP cleaning was investigated. By changing the concentration of the non-ionic surfactant, a series of experiments were performed on the 12 inch Cu pattern wafers in order to determine the best cleaning results. Then the effect of the surfactant on the reduction of defects and the removal of particles was discussed in this paper. What is more, the negative effect of a non-ionic surfactant was also discussed. Based on the experiment results, it is concluded that the non-ionic surfactant could cause good and ill effects at different concentrations in the post-CMP cleaning process. This understanding will serve as a guide to how much surfactant should be added in order to achieve excellent cleaning performance.展开更多
This paper presents a new cleaning process for particle and organic contaminants on polished silicon wafer surfaces.It combines a non-ionic surfactant with boron-doped diamond(BDD) film anode electrochemical oxidati...This paper presents a new cleaning process for particle and organic contaminants on polished silicon wafer surfaces.It combines a non-ionic surfactant with boron-doped diamond(BDD) film anode electrochemical oxidation. The non-ionic surfactant is used to remove particles on the polished wafer's surface,because it can form a protective film on the surface,which makes particles easy to remove.The effects of particle removal comparative experiments were observed by metallographic microscopy,which showed that the 1%v/v non-ionic surfactant achieved the best result. However,the surfactant film itself belongs to organic contamination,and it eventually needs to be removed.BDD film anode electrochemical oxidation(BDD-EO) is used to remove organic contaminants,because it can efficiently degrade organic matter.Three organic contaminant removal comparative experiments were carried out:the first one used the non-ionic surfactant in the first step and then used BDD-EO,the second one used BDD-EO only,and the last one used RCA cleaning technique.The XPS measurement result shows that the wafer's surface cleaned by BDD-EO has much less organic residue than that cleaned by RCA cleaning technique,and the non-ionic surfactant can be efficiently removed by BDD-EO.展开更多
Modern medicine is expanding the possibilities of receiving "personalized" diagnosis and therapies,providing minimal invasiveness,technological solutions based on non-ionizing radiation,early detection of pa...Modern medicine is expanding the possibilities of receiving "personalized" diagnosis and therapies,providing minimal invasiveness,technological solutions based on non-ionizing radiation,early detection of pathologies with the main objectives of being operator independent and with low cost to society.Our research activities aim to strongly contribute to these trends by improving the capabilities of current diagnostic imaging systems,which are of key importance in possibly providing both optimal diagnosis and therapies to patients.In medical diagnostics,cellular imaging aims to develop new methods and technologies for the detection of specific metabolic processes in living organisms,in order to accurately identify and discriminate normal from pathological tissues.In fact,most diseases have a "molecular basis" that detected through these new diagnostic methodologies can provide enormous benefits to medicine.Nowadays,this possibility is mainly related to the use of Positron Emission Tomography,with an exposure to ionizing radiation for patients and operators and with extremely high medical diagnosticscosts.The future possible development of non-ionizing cellular imaging based on techniques such as Nuclear Magnetic Resonance or Ultrasound,would represent an important step towards modern and personalized therapies.During the last decade,the field of nanotechnology has made important progress and a wide range of organic and inorganic nanomaterials are now available with an incredible number of further combinations with other compounds for cellular targeting.The availability of these new advanced nanosystems allows new scenarios in diagnostic methodologies which are potentially capable of providing morphological and functional information together with metabolic and cellular indications.展开更多
The quantification of ionizing energy deposition and non-ionizing energy deposition plays a critical role in precision neutron dosimetry and in the separation of the displacement damage effects and ionizing effects in...The quantification of ionizing energy deposition and non-ionizing energy deposition plays a critical role in precision neutron dosimetry and in the separation of the displacement damage effects and ionizing effects induced by neutron radiation on semiconductor devices. In this report, neutrons generated by the newly built China Spallation Neutron Source (CSNS) are simulated by Geant4 in semiconductor material silicon to calculate the ionizing and non-ionizing kerma factors. Furthermore, the integral method is applied to calculate neutron-induced ionizing at the CSNS and non-ionizing kerma factors according to the standard neutron nuclear database and the incident neutron spectrum. In addition, thermoluminescence dosimeters are utilized to measure the ionizing energy deposition and six series of bipolar junction transistors are used to measure the non-ionizing energy deposition based on their neutron damage constants. The calibrated kerma factors that were experimentally measured agreed well with the simulation and integral calculation results. This report describes a complete set of methods and fundamental data for the analysis of neutron-induced radiation effects at the CSNS on silicon-based semiconductor devices.展开更多
Modern technology has witnessed milestone achievements in the telecommunication industry.However,the widespread application of telecommunication technology is believed to heighten electromagnetic field(EMF)‘pollution...Modern technology has witnessed milestone achievements in the telecommunication industry.However,the widespread application of telecommunication technology is believed to heighten electromagnetic field(EMF)‘pollution’in our environment[1]and subject living organisms to various sources of electromagnetic emissions.These emissions include;microwaves.展开更多
The lowest energies which make Cu,In,Ga,and Se atoms composing Cu(In,Ga)Se_2(CIGS) material displaced from their lattice sites are evaluated,respectively.The non-ionizing energy loss(NIEL) for electron in CIGS m...The lowest energies which make Cu,In,Ga,and Se atoms composing Cu(In,Ga)Se_2(CIGS) material displaced from their lattice sites are evaluated,respectively.The non-ionizing energy loss(NIEL) for electron in CIGS material is calculated analytically using the Mott differential cross section.The relation of the introduction rate(k) of the recombination centers to NIEL is modified,then the values of k at different electron energies are calculated.Degradation modeling of CIGS thin-film solar cells irradiated with various-energy electrons is performed according to the characterization of solar cells and the recombination centers.The validity of the modeling approach is verified by comparison with the experimental data.展开更多
文摘A spectrophotometric approach for the detection of non-ionic surfactant (Triton X-100) has been proposed in this paper. This method does not involve extraction of the ion-associate with harmful solvents, but employs adhesion of the ion-association of potassium/non-ionic surfactants complex and tetraphenylporphyrin tetrasulfonic acid obtained by vigorous shaking. The adhered ion-associate was dissolved with water and its absorbance was measured. The sensitivity for Triton X-100 was determined to be 0.146 (expressed as absorbance of 1 mg/L solution). The adhesion tendency of ion-associate was found to be dependent on the water contact angle, which in turn was influenced by a high adhesion of the ion-associate and by low blank values. In this respect, a tetrafluo-roethylene vessel was found to be the most suitable for the detection of non-ionic surfactants. This spectrophotometrical method is simply and rapidly performed by a procedure based on mechanical shaking and can be employed to detect non-ionic surfactants containing more than 7 polyethylene oxide units.
文摘Extraction behavior of chlorpromazine hydrochloride (CPZ) and procaine hydro- chloride (PCN) in the system described in the title was studied. Research shows that the extraction efficiency of CPZ can amount to 96% by twice extraction, while that of PCN is 77%. This system produces the distribution coefficients (KD) of 12.3 and 2.6 respectively for CPZ and PCN. Extraction mechanism is deduced according to ultraviolet and molecular fluorescence spectra variation of the drugs in the system studied.
文摘The ONP neutral deinking performances of fatty alcohol polyoxyethylene ether with different EO value were investigated in this paper. Meanwhile, the synergistic effects of different non-ionic surfactants, the co-operation of non-ionic surfactants with anionic surfactants,and the effects of different salts added into the above two systems on deinkability were also studied. The results showed the deinking performance of A7 was good. But the synergistic effect of A7 and A4 was better. In addition, the accession of salt W2 could improve the deinking efficiency, and the brightness of the deinked pulp was 1.0%ISO higher than that of A7 and A4.
基金Project supported by the Specific Project Items No.2 in National Long-Term Technology Development Plan(No.2009zx02308-003)
文摘The effect of a non-ionic surfactant on particles removal in post-CMP cleaning was investigated. By changing the concentration of the non-ionic surfactant, a series of experiments were performed on the 12 inch Cu pattern wafers in order to determine the best cleaning results. Then the effect of the surfactant on the reduction of defects and the removal of particles was discussed in this paper. What is more, the negative effect of a non-ionic surfactant was also discussed. Based on the experiment results, it is concluded that the non-ionic surfactant could cause good and ill effects at different concentrations in the post-CMP cleaning process. This understanding will serve as a guide to how much surfactant should be added in order to achieve excellent cleaning performance.
文摘This paper presents a new cleaning process for particle and organic contaminants on polished silicon wafer surfaces.It combines a non-ionic surfactant with boron-doped diamond(BDD) film anode electrochemical oxidation. The non-ionic surfactant is used to remove particles on the polished wafer's surface,because it can form a protective film on the surface,which makes particles easy to remove.The effects of particle removal comparative experiments were observed by metallographic microscopy,which showed that the 1%v/v non-ionic surfactant achieved the best result. However,the surfactant film itself belongs to organic contamination,and it eventually needs to be removed.BDD film anode electrochemical oxidation(BDD-EO) is used to remove organic contaminants,because it can efficiently degrade organic matter.Three organic contaminant removal comparative experiments were carried out:the first one used the non-ionic surfactant in the first step and then used BDD-EO,the second one used BDD-EO only,and the last one used RCA cleaning technique.The XPS measurement result shows that the wafer's surface cleaned by BDD-EO has much less organic residue than that cleaned by RCA cleaning technique,and the non-ionic surfactant can be efficiently removed by BDD-EO.
基金Supported by Italian Ministry of Research,Apulia Region,European Commission and National Council of Research
文摘Modern medicine is expanding the possibilities of receiving "personalized" diagnosis and therapies,providing minimal invasiveness,technological solutions based on non-ionizing radiation,early detection of pathologies with the main objectives of being operator independent and with low cost to society.Our research activities aim to strongly contribute to these trends by improving the capabilities of current diagnostic imaging systems,which are of key importance in possibly providing both optimal diagnosis and therapies to patients.In medical diagnostics,cellular imaging aims to develop new methods and technologies for the detection of specific metabolic processes in living organisms,in order to accurately identify and discriminate normal from pathological tissues.In fact,most diseases have a "molecular basis" that detected through these new diagnostic methodologies can provide enormous benefits to medicine.Nowadays,this possibility is mainly related to the use of Positron Emission Tomography,with an exposure to ionizing radiation for patients and operators and with extremely high medical diagnosticscosts.The future possible development of non-ionizing cellular imaging based on techniques such as Nuclear Magnetic Resonance or Ultrasound,would represent an important step towards modern and personalized therapies.During the last decade,the field of nanotechnology has made important progress and a wide range of organic and inorganic nanomaterials are now available with an incredible number of further combinations with other compounds for cellular targeting.The availability of these new advanced nanosystems allows new scenarios in diagnostic methodologies which are potentially capable of providing morphological and functional information together with metabolic and cellular indications.
基金supported by the National Natural Science Foundation of China(Nos.11690040 and 11690043)the Foundation of State Key Laboratory of China(Nos.SKLIPR1801Z and 6142802180304)
文摘The quantification of ionizing energy deposition and non-ionizing energy deposition plays a critical role in precision neutron dosimetry and in the separation of the displacement damage effects and ionizing effects induced by neutron radiation on semiconductor devices. In this report, neutrons generated by the newly built China Spallation Neutron Source (CSNS) are simulated by Geant4 in semiconductor material silicon to calculate the ionizing and non-ionizing kerma factors. Furthermore, the integral method is applied to calculate neutron-induced ionizing at the CSNS and non-ionizing kerma factors according to the standard neutron nuclear database and the incident neutron spectrum. In addition, thermoluminescence dosimeters are utilized to measure the ionizing energy deposition and six series of bipolar junction transistors are used to measure the non-ionizing energy deposition based on their neutron damage constants. The calibrated kerma factors that were experimentally measured agreed well with the simulation and integral calculation results. This report describes a complete set of methods and fundamental data for the analysis of neutron-induced radiation effects at the CSNS on silicon-based semiconductor devices.
文摘Modern technology has witnessed milestone achievements in the telecommunication industry.However,the widespread application of telecommunication technology is believed to heighten electromagnetic field(EMF)‘pollution’in our environment[1]and subject living organisms to various sources of electromagnetic emissions.These emissions include;microwaves.
基金Project supported by the National Natural Science Foundation of China(Grant No.11547151)
文摘The lowest energies which make Cu,In,Ga,and Se atoms composing Cu(In,Ga)Se_2(CIGS) material displaced from their lattice sites are evaluated,respectively.The non-ionizing energy loss(NIEL) for electron in CIGS material is calculated analytically using the Mott differential cross section.The relation of the introduction rate(k) of the recombination centers to NIEL is modified,then the values of k at different electron energies are calculated.Degradation modeling of CIGS thin-film solar cells irradiated with various-energy electrons is performed according to the characterization of solar cells and the recombination centers.The validity of the modeling approach is verified by comparison with the experimental data.