To measure the void fraction online in oil-gas pipeline, an improved electrical capacitance tomography (ECT) system has been designed. The capacitance sensor with new structure has twelve internal electrodes and overc...To measure the void fraction online in oil-gas pipeline, an improved electrical capacitance tomography (ECT) system has been designed. The capacitance sensor with new structure has twelve internal electrodes and overcomes the influence of the pipe wall. The data collection system is improved by using high performance IC (integrated circuit). Static tests of bubble flow, stratified flow and annular flow regime are carried out. Measurements are taken on bubble flow, stratified flow and slug flow. Results show that the new ECT system performs well on void fraction measurement of bubble flow and stratified flow, but the error of measurement for slug flow is more than 10%.展开更多
Accurate solid concentration measurement plays a key role in the process industry. Measurements analyzed offline can be used to estimate process efficiencies, to identify problems in a flow, and to validate computatio...Accurate solid concentration measurement plays a key role in the process industry. Measurements analyzed offline can be used to estimate process efficiencies, to identify problems in a flow, and to validate computational models. Online measurements can be used for active control. Electrical capacitance tomography (ECT) is a unique measuring technique with great potential in multiphase flow measurement. Experimental studies are carried out on a solid concentration measurement in a cyclone separator dipleg, using ECT. In this experiment eight electrodes are selected for the ECT sensor that is placed on the straight tube of the dipleg. The fluctuating characteristics according to the screw feeder and the effect of the airflow rate from the top of the cyclone are analyzed. The feasibility andreliability of the method are verified by the experimental results.展开更多
This paper presents the characteristics of a double helix capacitance sensor for measurement of the liquid holdup in horizontal oil–water two-phase flow. The finite element method is used to calculate the sensitivity...This paper presents the characteristics of a double helix capacitance sensor for measurement of the liquid holdup in horizontal oil–water two-phase flow. The finite element method is used to calculate the sensitivity field of the sensor in a pipe with 20 mm inner diameter and the effect of sensor geometry on the distribution of sensitivity field is presented. Then, a horizontal oil–water two-phase flow experiment is carried out to measure the response of the double helix capacitance sensor, in which a novel method is proposed to calibrate the liquid holdup based on three pairs of parallel-wire capacitance probes. The performance of the sensor is analyzed in terms of the flow structures detected by mini-conductance array probes.展开更多
For the frequency range of I kHz-lOMHz, the interface state density of Ni contacts on p-GaN is studied using capacitance-voltage (C-V) and conductance-frequency-voltage (G-f-V) measurements at room temperature. To...For the frequency range of I kHz-lOMHz, the interface state density of Ni contacts on p-GaN is studied using capacitance-voltage (C-V) and conductance-frequency-voltage (G-f-V) measurements at room temperature. To obtain the real capacitance and interface state density of the Ni/p-GaN structures, the effects of the series resistance (Rs) on high-frequency (SMHz) capacitance values measured at a reverse and a forward bias are investigated. The mean interface state densities obtained from the CHF-CLF capacitance and the conductance method are 2 ×1012 e V-1 cm-2 and 0.94 × 1012 eV-1 cm-2, respectively. Furthermore, the interface state density derived from the conductance method is higher than that reported from the Ni/n-GaN in the literature, which is ascribed to a poor crystal quality and to a large defect density of the Mg-doped p-GaN.展开更多
Au/n-Si (MS) structures with a high dielectric interlayer (0.03 graphene-doped PVA) are fabricated to investigate the illumination and voltage effects on electrical and dielectric properties by using capacitance-v...Au/n-Si (MS) structures with a high dielectric interlayer (0.03 graphene-doped PVA) are fabricated to investigate the illumination and voltage effects on electrical and dielectric properties by using capacitance-voltage (C-V) and conductance-voltage (G/w-V) measurements at room temperature and at 1 MHz. Some of the main electrical parameters such as concentration of doping atoms (ND), barrier height ( ФB( C - V) ), depletion layer width (WD) and series resistance (Rs) show fairly large illumination dispersion. The voltage-dependent profile of surface states (Nss) and resistance of the structure (Ri ) are also obtained by using the dark-illumination capacitance (Cdark- Cm) and Nicollian-Brews methods, respectively, For a clear observation of changes in electrical parameters with illumination, the values of ND, WD, ФB(O- V) and Rs are drawn as a function of illumination intensity. The values of ND and WD change almost linearly with illumination intensity. On the other hand, Rs decreases almost exponentially with increasing illumination intensity whereas ФB(C - V) increases. The experimental results suggest that the use of a high dielectric interlayer (0.03 graphene-doped PVA) considerably passivates or reduces the magnitude of the surface states. The large change or dispersion in main electrical parameters can be attributed to generation of electron-hole pairs in the junction under illumination and to a good light absorption. All of these experimental results confirm that the fabricated Au/0.03 graphene-doped PVA/n-Si structure can be used as a photodiode or a capacitor in optoelectronic applications.展开更多
A novel method of measuring the positive-sequence capacitance of T-connection transmission lines is proposed. The mathematical model of the new method is explained in detail. In order to obtain enough independent equa...A novel method of measuring the positive-sequence capacitance of T-connection transmission lines is proposed. The mathematical model of the new method is explained in detail. In order to obtain enough independent equations, three independent operation modes of T-connection transmission lines during the line measurement are introduced. The digital simulation results and field measurement results are shown. The simulation and measurement results have validated that the new method can meet the needs of measuring the positive-sequence capacitance of T-connection transmission lines. This method has been implemented in the newly developed measurement instrument.展开更多
In order to accurately measure the pressure and the pressure difference between two points in the vacuum chamber, a large number of experimental data were used to research the performance of the three capacitance diap...In order to accurately measure the pressure and the pressure difference between two points in the vacuum chamber, a large number of experimental data were used to research the performance of the three capacitance diaphragm gauge and analysis the main influences of the uncertainly degree of pressure in the process. In this paper, three kind of uncertainty, such as the single uncertainty, the synthesis uncertainty and the expanded uncertainty of the three capacitance diaphragm gauges are introduced in detail in pressure measurement. The results show that the performance difference of capacitance diaphragm gauge can be very influential to the accuracy of the pressure difference measurement and the uncertainty of different pressure can be very influential to pressure measurement. That for accurately measuring pressure and pressure difference has certain reference significance.展开更多
We present dC/dV analysis based on the capacitance-voltage(C–V)measurement of quantum-dot lightemitting diodes(QLEDs),and find that some key device operating parameters(electrical and optical turn-on voltage,peak cap...We present dC/dV analysis based on the capacitance-voltage(C–V)measurement of quantum-dot lightemitting diodes(QLEDs),and find that some key device operating parameters(electrical and optical turn-on voltage,peak capacitance,maximum efficiency)can be directly related to the turning points and maximum/minimum of the dC/dV(versus voltage)curve.By the dC/dV study,the behaviors such as low turn-on voltage,simultaneous electrical and optical turn-on process,and carrier accumulation during the device aging can be well explained.Moreover,we perform the C–V and dC/dV measurement of aged devices,and confirm that our dC/dV analysis is correct for them.Thus,our dC/dV analysis method can be applied universally for QLED devices.It provides an in-depth understanding of carrier dynamics in QLEDs through simple C–V measurement.展开更多
This paper describes the design and development of the timer based on liquid level measurement system in which timer 555 is used in astable mode. The capacitor charging time i. e. the ON time pulse width of the ti...This paper describes the design and development of the timer based on liquid level measurement system in which timer 555 is used in astable mode. The capacitor charging time i. e. the ON time pulse width of the timer output waveform which is measured using a digital storage oscillator (DSO),is linearly proportional to the capacitance of a co-axial cylindrical capacitive transducer, and this capacitance once again linearly varies with the change in liquid level. Hence, we obtain a linear relationship between the liquid level and the capacitor charging time. The main advantages of this developed system are linear input-output relationship, small in size, easily portable, cost effective, and independent on the ambient temperature effect. The system can also be exploited to measure dielectric constant of liquid or solid in various process industries.展开更多
A fully automatic setup for on-wafer contact probing will be presented. This setup consists of six automatable nano positioning axes used as tool holder and a sample holder. With this setup a fully automatic one-port ...A fully automatic setup for on-wafer contact probing will be presented. This setup consists of six automatable nano positioning axes used as tool holder and a sample holder. With this setup a fully automatic one-port SOL calibration for a Vector Network Analyzer is done. Furthermore a fully automated on-wafer contact probing is performed. Afterwards, the effects of a misalignment of the three tips of a GSG-probe are examined. Additionally the error on the calibration is calculated to determine its effect on the measurement. The results show, that a misalignment of the probe has a high impact on the measurement of the VNA. Hence a fully automated on-wafer probing presented in this paper is a good way to detect these misalignments and correct them if necessary.展开更多
On-line measurement for dielectric loss angle can effectively monitor the insulation condition of capacitive equipment in power systems. Synthetic relative measuring methods not only markedly overcome the shortcomings...On-line measurement for dielectric loss angle can effectively monitor the insulation condition of capacitive equipment in power systems. Synthetic relative measuring methods not only markedly overcome the shortcomings of traditional absolute measuring methods but also greatly improve the accuracy of dielectric loss angle measurement. However, synthetic relative measuring methods based on two or three pieces of capacitive equipment do not have the characteristic of generality. In this paper, a principle of synthetic relative measuring method is presented. The example of application for synthetic relative methods based on three and four pieces of capacitive equipment running in the same phase is taken to present the failure judgment matrices for N pieces of equipment. According to these matrices, the fault condition of N pieces of capacitive equipment can be watched, which is more general. Then some problems needing to be concerned along with two diagnostic methods used in diagnostic system are introduced. Finally, two programmable flow charts for the two methods are given and corresponding examples demonstrate their feasibility in practice.展开更多
A system for glass thickness measurement is introduced.The signal acquisition part of the system adopts parallel plate capacitor,and measured signals are transformed into pulse frequency by capacitance-frequency trans...A system for glass thickness measurement is introduced.The signal acquisition part of the system adopts parallel plate capacitor,and measured signals are transformed into pulse frequency by capacitance-frequency transformation circuit,then transmitted it in optical fibers.So this system has high speed,high precision and high resistance to interference.展开更多
基金the National High Technology Research and Development Program of China (863 Program) (No. 2002AA616050).
文摘To measure the void fraction online in oil-gas pipeline, an improved electrical capacitance tomography (ECT) system has been designed. The capacitance sensor with new structure has twelve internal electrodes and overcomes the influence of the pipe wall. The data collection system is improved by using high performance IC (integrated circuit). Static tests of bubble flow, stratified flow and annular flow regime are carried out. Measurements are taken on bubble flow, stratified flow and slug flow. Results show that the new ECT system performs well on void fraction measurement of bubble flow and stratified flow, but the error of measurement for slug flow is more than 10%.
基金Supported by the National Natural Science Foundation of China (60672151, 60532020).
文摘Accurate solid concentration measurement plays a key role in the process industry. Measurements analyzed offline can be used to estimate process efficiencies, to identify problems in a flow, and to validate computational models. Online measurements can be used for active control. Electrical capacitance tomography (ECT) is a unique measuring technique with great potential in multiphase flow measurement. Experimental studies are carried out on a solid concentration measurement in a cyclone separator dipleg, using ECT. In this experiment eight electrodes are selected for the ECT sensor that is placed on the straight tube of the dipleg. The fluctuating characteristics according to the screw feeder and the effect of the airflow rate from the top of the cyclone are analyzed. The feasibility andreliability of the method are verified by the experimental results.
基金Supported by the National Natural Science Foundation of China(50974095,41174109,61104148)the National Science and Technology Major Projects(2011ZX05020-006)
文摘This paper presents the characteristics of a double helix capacitance sensor for measurement of the liquid holdup in horizontal oil–water two-phase flow. The finite element method is used to calculate the sensitivity field of the sensor in a pipe with 20 mm inner diameter and the effect of sensor geometry on the distribution of sensitivity field is presented. Then, a horizontal oil–water two-phase flow experiment is carried out to measure the response of the double helix capacitance sensor, in which a novel method is proposed to calibrate the liquid holdup based on three pairs of parallel-wire capacitance probes. The performance of the sensor is analyzed in terms of the flow structures detected by mini-conductance array probes.
基金Supported by the Natural Science Foundation of Jiangxi Province under Grant No 20133ACB20005the Key Program of National Natural Science Foundation of China under Grant No 41330318+3 种基金the Key Program of Science and Technology Research of Ministry of Education under Grant No NRE1515the Foundation of Training Academic and Technical Leaders for Main Majors of Jiangxi Province under Grant No 20142BCB22006the Research Foundation of Education Bureau of Jiangxi Province under Grant No GJJ14501the Engineering Research Center of Nuclear Technology Application(East China Institute of Technology)Ministry of Education under Grant NoHJSJYB2016-1
文摘For the frequency range of I kHz-lOMHz, the interface state density of Ni contacts on p-GaN is studied using capacitance-voltage (C-V) and conductance-frequency-voltage (G-f-V) measurements at room temperature. To obtain the real capacitance and interface state density of the Ni/p-GaN structures, the effects of the series resistance (Rs) on high-frequency (SMHz) capacitance values measured at a reverse and a forward bias are investigated. The mean interface state densities obtained from the CHF-CLF capacitance and the conductance method are 2 ×1012 e V-1 cm-2 and 0.94 × 1012 eV-1 cm-2, respectively. Furthermore, the interface state density derived from the conductance method is higher than that reported from the Ni/n-GaN in the literature, which is ascribed to a poor crystal quality and to a large defect density of the Mg-doped p-GaN.
文摘Au/n-Si (MS) structures with a high dielectric interlayer (0.03 graphene-doped PVA) are fabricated to investigate the illumination and voltage effects on electrical and dielectric properties by using capacitance-voltage (C-V) and conductance-voltage (G/w-V) measurements at room temperature and at 1 MHz. Some of the main electrical parameters such as concentration of doping atoms (ND), barrier height ( ФB( C - V) ), depletion layer width (WD) and series resistance (Rs) show fairly large illumination dispersion. The voltage-dependent profile of surface states (Nss) and resistance of the structure (Ri ) are also obtained by using the dark-illumination capacitance (Cdark- Cm) and Nicollian-Brews methods, respectively, For a clear observation of changes in electrical parameters with illumination, the values of ND, WD, ФB(O- V) and Rs are drawn as a function of illumination intensity. The values of ND and WD change almost linearly with illumination intensity. On the other hand, Rs decreases almost exponentially with increasing illumination intensity whereas ФB(C - V) increases. The experimental results suggest that the use of a high dielectric interlayer (0.03 graphene-doped PVA) considerably passivates or reduces the magnitude of the surface states. The large change or dispersion in main electrical parameters can be attributed to generation of electron-hole pairs in the junction under illumination and to a good light absorption. All of these experimental results confirm that the fabricated Au/0.03 graphene-doped PVA/n-Si structure can be used as a photodiode or a capacitor in optoelectronic applications.
文摘A novel method of measuring the positive-sequence capacitance of T-connection transmission lines is proposed. The mathematical model of the new method is explained in detail. In order to obtain enough independent equations, three independent operation modes of T-connection transmission lines during the line measurement are introduced. The digital simulation results and field measurement results are shown. The simulation and measurement results have validated that the new method can meet the needs of measuring the positive-sequence capacitance of T-connection transmission lines. This method has been implemented in the newly developed measurement instrument.
文摘In order to accurately measure the pressure and the pressure difference between two points in the vacuum chamber, a large number of experimental data were used to research the performance of the three capacitance diaphragm gauge and analysis the main influences of the uncertainly degree of pressure in the process. In this paper, three kind of uncertainty, such as the single uncertainty, the synthesis uncertainty and the expanded uncertainty of the three capacitance diaphragm gauges are introduced in detail in pressure measurement. The results show that the performance difference of capacitance diaphragm gauge can be very influential to the accuracy of the pressure difference measurement and the uncertainty of different pressure can be very influential to pressure measurement. That for accurately measuring pressure and pressure difference has certain reference significance.
基金supported by the Key-Area Research and Development Program of Guangdong Province(Grant Nos.2019B010925001 and 2019B010924001)the Shenzhen Peacock Team Project(Grant Nos.KQTD20160301 and 11203005)Shenzhen Key Laboratory for Advanced Quantum Dot Displays and Lighting(Grant Nos.ZDSYS201707 and 281632549)。
文摘We present dC/dV analysis based on the capacitance-voltage(C–V)measurement of quantum-dot lightemitting diodes(QLEDs),and find that some key device operating parameters(electrical and optical turn-on voltage,peak capacitance,maximum efficiency)can be directly related to the turning points and maximum/minimum of the dC/dV(versus voltage)curve.By the dC/dV study,the behaviors such as low turn-on voltage,simultaneous electrical and optical turn-on process,and carrier accumulation during the device aging can be well explained.Moreover,we perform the C–V and dC/dV measurement of aged devices,and confirm that our dC/dV analysis is correct for them.Thus,our dC/dV analysis method can be applied universally for QLED devices.It provides an in-depth understanding of carrier dynamics in QLEDs through simple C–V measurement.
文摘This paper describes the design and development of the timer based on liquid level measurement system in which timer 555 is used in astable mode. The capacitor charging time i. e. the ON time pulse width of the timer output waveform which is measured using a digital storage oscillator (DSO),is linearly proportional to the capacitance of a co-axial cylindrical capacitive transducer, and this capacitance once again linearly varies with the change in liquid level. Hence, we obtain a linear relationship between the liquid level and the capacitor charging time. The main advantages of this developed system are linear input-output relationship, small in size, easily portable, cost effective, and independent on the ambient temperature effect. The system can also be exploited to measure dielectric constant of liquid or solid in various process industries.
文摘A fully automatic setup for on-wafer contact probing will be presented. This setup consists of six automatable nano positioning axes used as tool holder and a sample holder. With this setup a fully automatic one-port SOL calibration for a Vector Network Analyzer is done. Furthermore a fully automated on-wafer contact probing is performed. Afterwards, the effects of a misalignment of the three tips of a GSG-probe are examined. Additionally the error on the calibration is calculated to determine its effect on the measurement. The results show, that a misalignment of the probe has a high impact on the measurement of the VNA. Hence a fully automated on-wafer probing presented in this paper is a good way to detect these misalignments and correct them if necessary.
文摘On-line measurement for dielectric loss angle can effectively monitor the insulation condition of capacitive equipment in power systems. Synthetic relative measuring methods not only markedly overcome the shortcomings of traditional absolute measuring methods but also greatly improve the accuracy of dielectric loss angle measurement. However, synthetic relative measuring methods based on two or three pieces of capacitive equipment do not have the characteristic of generality. In this paper, a principle of synthetic relative measuring method is presented. The example of application for synthetic relative methods based on three and four pieces of capacitive equipment running in the same phase is taken to present the failure judgment matrices for N pieces of equipment. According to these matrices, the fault condition of N pieces of capacitive equipment can be watched, which is more general. Then some problems needing to be concerned along with two diagnostic methods used in diagnostic system are introduced. Finally, two programmable flow charts for the two methods are given and corresponding examples demonstrate their feasibility in practice.
文摘A system for glass thickness measurement is introduced.The signal acquisition part of the system adopts parallel plate capacitor,and measured signals are transformed into pulse frequency by capacitance-frequency transformation circuit,then transmitted it in optical fibers.So this system has high speed,high precision and high resistance to interference.