This article deals with the case of the failure-censored constant-stress partially accelerated life test （CSPALT） for highly reliable materials or products assuming the Pareto distribution of the second kind. The ma...This article deals with the case of the failure-censored constant-stress partially accelerated life test （CSPALT） for highly reliable materials or products assuming the Pareto distribution of the second kind. The maximum likelihood （ML） method is used to estimate the parameters of the CSPALT model. The performance of ML estimators is investigated via their mean square error. Also, the average confidence interval length （IL） and the associated co- verage probability （CP） are obtained. Moreover, optimum CSPALT plans that determine the optimal proportion of the test units al- located to each stress are developed. Such optimum test plans minimize the generalized asymptotic variance （GAV） of the ML estimators of the model parameters. For illustration, Monte Carlo simulation studies are given and a real life example is provided.展开更多
For planning optimum multiple stresses accelerated life test plans, a commonly followed guiding principle is that all parameters of the life-stress relationship should be estimated, and the number of the stress level ...For planning optimum multiple stresses accelerated life test plans, a commonly followed guiding principle is that all parameters of the life-stress relationship should be estimated, and the number of the stress level combinations must be no less than the number of parameters of the life-stress relationship. However, the general objective of an accelerated life test（ALT） is to assess thep-th quantile of the product life distribution under normal stress. For this objective,estimating all model parameters is not necessary, and this will increase the cost of test. Based on the theoretical conclusion that the stress level combinations of the optimum multiple stresses ALT plan locate on a straight line through the origin of coordinate, it is proposed that a design idea of planning the optimum multiple stresses ALT plan through transforming the problem of designing an optimum multiple stresses ALT plan to designing an optimum single stress ALT plan. Moreover, a method of planning the optimum multiple stresses ALT plan which can avoid estimating all model parameters is established. An example shows that, the proposed plan which only has two stress level combinations could achieve an accuracy no less than the traditional plan, and save the test time and cost on one stress level combination at least; when the actual product life is less than the design value, even the deviation of the model initial parameters value is up to 20%, the variance of the estimation of thep-th quantile of the proposed plan is still smaller than the traditional plans approximately 25%. A design method is provided for planning the optimum multiple stresses ALT which uses the statistical optimum degenerate test plan as the optimum multiple stresses accelerated life test plan.展开更多
基金supported by the King Saud University,Deanship of Scientific Research and College of Science Research Center
文摘This article deals with the case of the failure-censored constant-stress partially accelerated life test （CSPALT） for highly reliable materials or products assuming the Pareto distribution of the second kind. The maximum likelihood （ML） method is used to estimate the parameters of the CSPALT model. The performance of ML estimators is investigated via their mean square error. Also, the average confidence interval length （IL） and the associated co- verage probability （CP） are obtained. Moreover, optimum CSPALT plans that determine the optimal proportion of the test units al- located to each stress are developed. Such optimum test plans minimize the generalized asymptotic variance （GAV） of the ML estimators of the model parameters. For illustration, Monte Carlo simulation studies are given and a real life example is provided.
基金Supported by National Natural Science Foundation of China (Grant Nos.50935002,51075370,51105341,51275480,51305402)Zhejiang Provincial Natural Science Foundation of China (Grant No.Y1100777)+1 种基金Zhejiang Provincial Key Science and Technology Innovation Team (Grant No.2010R50005)Key Program of Science and Technology of Sichuan Provincial Education Department,China (Grant No.14ZA0005)
文摘For planning optimum multiple stresses accelerated life test plans, a commonly followed guiding principle is that all parameters of the life-stress relationship should be estimated, and the number of the stress level combinations must be no less than the number of parameters of the life-stress relationship. However, the general objective of an accelerated life test（ALT） is to assess thep-th quantile of the product life distribution under normal stress. For this objective,estimating all model parameters is not necessary, and this will increase the cost of test. Based on the theoretical conclusion that the stress level combinations of the optimum multiple stresses ALT plan locate on a straight line through the origin of coordinate, it is proposed that a design idea of planning the optimum multiple stresses ALT plan through transforming the problem of designing an optimum multiple stresses ALT plan to designing an optimum single stress ALT plan. Moreover, a method of planning the optimum multiple stresses ALT plan which can avoid estimating all model parameters is established. An example shows that, the proposed plan which only has two stress level combinations could achieve an accuracy no less than the traditional plan, and save the test time and cost on one stress level combination at least; when the actual product life is less than the design value, even the deviation of the model initial parameters value is up to 20%, the variance of the estimation of thep-th quantile of the proposed plan is still smaller than the traditional plans approximately 25%. A design method is provided for planning the optimum multiple stresses ALT which uses the statistical optimum degenerate test plan as the optimum multiple stresses accelerated life test plan.
